Publications

Publications of the Institute

Publications

  1. 2023

    1. Exploring gate-diversity enabled by reconfigurable memristive technology. Sebastian Brandhofer; Ziang Chen; Li-Wei Chen; Nan Du and Ilia Polian. In To appear in Proceedings of IEEE Int’l Conf. on Electronics, Circuits and Systems (ICECS), Istanbul, Turkey, 2023.
    2. Approximation-Aware and Quantization-Aware Training for  Graph Neural Networks. Rodion Novkin; Florian Klemme and Hussam Amrouch. IEEE Transactions on Computers (November 2023).
    3. Side-channel Attacks on Memristive Circuits Under External Disturbances. Li-Wei Chen; Xianyue Zhao; Ziang Chen; Nan Du and Ilia Polian. In 2023 IEEE 32nd Asian Test Symposium (ATS), Beijing, China, 2023, pp. 1–6. DOI: https://doi.org/10.1109/ATS59501.2023.10317969
    4. Optimizing the Streaming of Sensor Data with Approximate Communication. Somayeh Sadeghi-Kohan; Jan Dennis Reimer; Sybille Hellebrand and Hans-Joachim Wunderlich. In Proceedings of the IEEE Asian Test Symposium (ATS’23), Beijing, China, 2023.
    5. Robust Pattern Generation for Small Delay Faults under  Process Variations. Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’23), Disneyland, Anaheim, USA, 2023.
    6. Optimal qubit reuse for near-term quantum computers. Sebastian Brandhofer; Ilia Polian and Kevin Krsulich. In To appear in Proceedings Quantum Computing and Engineering Conf.~(QCE), Seattle, Washington, USA, 2023.
    7. A modular open-source cryptographic co-processor for Internet of Things. Dina Hesse; Maël Gay; Ilia Polian and Elif Bilge Kavun. In To appear in Proceedings of Euromicro Conf. Digital System Design (DSD), Durres, Albania, 2023.
    8. Optimizing quantum algorithms on bipotent architectures. Yanjun Ji; Kathrin F. Koenig and Ilia Polian. Phys. Rev. A 108, 2 (August 2023), pp. 022610. DOI: https://doi.org/10.1103/PhysRevA.108.022610
    9. Exploiting the Error Resilience of the Preconditioned  Conjugate Gradient Method for Energy and Delay Optimization. Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra . Kourfali and Hans-Joachim Wunderlich. In IEEE 29st International On-Line Testing Symposium (IOLTS`23), Chania (Crete), Greece, 2023, pp. 1–6.
    10. Stochastic Computing as a Defence Against Adversarial Attacks. Florian Neugebauer; Vivek Vekariya; Ilia Polian and John P. Hayes. In 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), Porto, Portugal, 2023, pp. 191–194. DOI: https://doi.org/10.1109/DSN-W58399.2023.00053
    11. Overview of Memristive Cryptography. Ilia Polian; Nan Du and Werner Schindler. In 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS), Edinburgh, United Kingdom, 2023, pp. 1–5. DOI: https://doi.org/10.1109/NEWCAS57931.2023.10198201
    12. Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm. Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra Kourfali and Hans-Joachim Wunderlich. In International Conference on Dependable Systems and Networks(DSN’23), Porto, Portugal, 2023.
    13. Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication. Somayeh Sadeghi-Kohan; Sybille Hellebrand and Hans-Joachim Wunderlich. In International Conference on Dependable Systems and Networks(DSN’23), Porto, Portugal, 2023.
    14. Secrets Leaking Through Quicksand: Covert Channels in Approximate Computing. Lorenzo Masciullo; Roberto Passerone; Francesco Regazzoni and Ilia Polian. In 2023 IEEE European Test Symposium (ETS), Venice, Italy, 2023, pp. 1–6. DOI: https://doi.org/10.1109/ETS56758.2023.10174181
    15. Automating Greybox System-Level Test Generation. Denis Schwachhofer; Maik Betka; Steffen Becker; Stefan Wagner; Matthias Sauer and Ilia Polian. In 2023 IEEE European Test Symposium (ETS), Venice, Italy, 2023, pp. 1–4. DOI: https://doi.org/10.1109/ETS56758.2023.10173985
    16. A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. Jens Anders; Pablo Andreu; Bernd Becker; Steffen Becker; Riccardo Cantoro; Nikolaos I. Deligiannis; Nourhan Elhamawy; Tobias Faller; Carles Hernandez; Nele Mentens; Mahnaz Namazi Rizi; Ilia Polian; Abolfazl Sajadi; Mathias Sauer; Denis Schwachhofer; Matteo Sonza Reorda; Todor Stefanov; Ilya Tuzov; Stefan Wagner and Nuša Zidarič. In 2023 IEEE European Test Symposium (ETS), Venice, Italy, 2023, pp. 1–10. DOI: https://doi.org/10.1109/ETS56758.2023.10174099
    17. LEDA: Locking enabled differential analysis of cryptographic circuits. Devanshi Upadhyaya; Mael Gay and Ilia Polian. In To appear in Proceedings of IEEE International Symposium on Hardware Oriented Security and Trust (HOST), San Jose, CA, USA, 2023.
    18. Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. Payam Habiby; Natalia Lylina; Chih-Hao Wang; Hans-Joachim Wunderlich; Sebastian Huhn and Rolf Drechsler. In Proceedings of the 28th IEEE European Test Symposium 2023  (ETS’ 23), Venice, Italy, 2023, pp. 6.
    19. SAT-Based Quantum Circuit Adaptation. Sebastian Brandhofer; Jinwoong Kim; Siyuan Niu and Nicholas T. Bronn. In Proceedings of the ACM/IEEE Conference on Design, Automation Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    20. Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. Behnaz Ranjbar; Florian Klemme; Paul R. Genssler; Hussam Amrouch; Jinhyo Jung; Shail Dave; Hwisoo So; Kyongwoo Lee; Aviral Shrivastava; Ji-Yung Lin; Pieter Weckx; Subrat Mishra; Francky Catthoor; Dwaipayan Biswas and Akash Kumar. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    21. Review on Resistive Switching Devices Based on Multiferroic              BiFeO(3). Xianyue Zhao; Stephan Menzel; Ilia Polian; Heidemarie Schmidt and Nan Du. Nanomaterials (Basel) 13, 8 (April 2023). DOI: https://doi.org/10.3390/nano13081325
    22. Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch and Hans-Joachim Wunderlich. In Proceedings of the IEEE Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    23. Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. Florian Klemme; Sami Salamin and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    24. HDGIM: Hyperdimensional Genome Sequence Matching on Unreliable Highly-Scaled FeFET. Hamza Errahmouni Barkam; Sanggeon Yun; Paul R. Genssler; Zhuowen Zou; Che-Kai Liu; Hussam Amrouch and Mohsen Imani. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    25. Test Aspects of System Health State Monitoring. Hans-Joachim Wunderlich; Hanieh Jafarzadeh; Alexandra Kourfali; Natalia Lylina and Zahra Paria Najafi-Haghi. In IEEE 24nd Latin American Test Symposium (LATS`23), Veracruz, Mexico, 2023, pp. 1–2.
    26. Design Rationale for Symbiotically Secure Key Management Systems in IoT and Beyond. W. Bartsch; P. Gope; E. Kavun; O. Millwood; A. Mohammadi Pasikhani; A. Panchenko and I. Polian. In To appear In 9th International Conference on Information System Security and Privacy (ICISSP 2023), Lisbon, Portugal, 2023.
    27. ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors all the Way up Processors. Hussam Amrouch and Florian Klemme. In 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    28. Beyond von Neumann Era: Brain-inspired Hyperdimensional Computing to the Rescue. Hussam Amrouch; Paul R. Genssler; Mohsen Imani; Mariam Issa; Xun Jiao; Wegdan Ali Mohammadin; Gloria Sepanta and Ruixuan Wang. In 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    29. A Complete Design-for-Test Scheme for Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) (January 2023), pp. 1--19. DOI: https://doi.org/10.1007/s10836-022-06038-3
    30. Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs. Liu Liu; Shubham Kumar; Simon Thomann; Hussam Amrouch and X. Sharon Hu. In Proceedings of the 60th Annual Design Automation Conference (DAC’23), San Francisco, USA, 2023.
    31. FDSOI-based Analog Computing for Ultra-efficient Hamming Distance Similarity Calculation. Albi Mema; Simon Thomann; Paul R. Genssler and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2023). DOI: https://doi.org/10.1109/TCSI.2023.3267837
    32. Modeling and Predicting Transistor Aging under Workload Dependency using Machine Learning. Paul R. Genssler; Hamza E. Barkam; Karthik Pandaram; Mohsen Imani and Hussam Amrouch. (2023). DOI: https://doi.org/10.1109/TCSI.2023.3289325
    33. Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. van Santen Victor; Jose M. Gata-Romero; Juan Nunez; Roca Eli and Hussam Amrouch. In Proceedings of the IEEE 61st International Reliability Physics Symposium  (IRPS’23), Monterey, California, U.S., 2023.
    34. Golden-Free Robust Age Estimation to Triage Recycled ICs. V. Surabhi; P. Krishnamurthy; H. Amrouch; J. Henkel; R. Karri and F. Khorrami. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’23) (2023).
    35. Cryogenic Embedded System to Support Quantum Computing: From 5nm FinFET to Full Processor. Paul R. Genssler; Florian Klemme; Shivendra Singh Parihar; Sebastian Brandhofer; Girish Pahwa; Ilia Polian; Yogesh Singh Chauhan and Hussam Amrouch. IEEE Transactions on Quantum Engineering (2023). DOI: https://doi.org/10.1109/TQE.2023.3300833
    36. Stress-resiliency of AI implementations on FPGAs. Jonas Krautter; Paul R. Genssler; Gloria Sepanta; Hussam Amrouch and Mehdi Tahoori. In International Conference on Field Programmable Logic and Applications (FPL), 2023.
    37. Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. Victor van Santen; Florian Klemme; Paul R. Genssler and Hussam Amrouch. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023.
    38. Design Automation for Cryogenic CMOS Circuits. Victor van Santen; Marcel Walter; Florian Klemme; Shivendra Parihar; Girish Pahwa; Yogesh Chauhan; Robert Wille and Hussam Amrouch. In Proceedings of the 60th Annual Design Automation Conference (DAC’23), San Francisco, USA, 2023.
    39. Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity. Simon Thomann; Albi Mema; Kai Ni and Hussam Amrouch. In Proceedings of the IEEE 61st International Reliability Physics Symposium  (IRPS’23), Monterey, California, U.S., 2023.
    40. Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. Om Prakash; Rodion Novkin; Virinchi Surabhi Roy; Prashanth Krishnamur; Ramesh Karri; Farshad Khorrami and Hussam Amrouch. In Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS’23), Monterey, California, USA, 2023.
    41. Optimal Partitioning of Quantum Circuits Using Gate Cuts and Wire Cuts. Sebastian Brandhofer; Ilia Polian and Kevin Krsulich. IEEE Transactions on Quantum Engineering (2023), pp. 1–10. DOI: https://doi.org/10.1109/TQE.2023.3347106
    42. SyncTREE: Fast Timing Analysis for Integrated Circuit  Design through a Physics-informed Tree-based Graph Neural Network. Yuting Hu; Jiajie Li; Florian Klemme; Gi-Joon Nam; Tengfei Ma; Hussam Amrouch and Jinjun Xiong. In Thirty-seventh Conference on Neural Information Processing  Systems, 2023.
    43. Reliable Hyperdimensional Reasoning on Unreliable Emerging Technologies. Hamza Errahmouni Barkam; Sanggeon Yun; Paul R. Genssler; Hanning Chen; Albi Mema; Andrew Ding; Hussam Amrouch and Mohsen Imani. In 2023 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2023.
    44. Identifying Resistive Open Defects in Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) (2023), pp. 1–27. DOI: https://doi.org/10.1007/s10836-023-06044-z
    45. Compact CMOS-Compatible Majority Gate using Body Biasing in FDSOI Technology. Brunno Alves Abreu; Albi Mema; Simon Thomann; Guilherme Paim; Paulo Flores; Sergio Bampi and Hussam Amrouch. IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) (2023).
    46. Machine Learning Support for Logic Diagnosis and Defect Classification. Hans-Joachim Wunderlich. In Machine Learning Support for Fault Diagnosis of System-on-Chip, Patrick Girard; Shawn Blanton and Li-C. Wang (eds.). Springer International Publishing, Cham, 2023, pp. 99--133. DOI: https://doi.org/10.1007/978-3-031-19639-3_4
    47. On the limitations of logic locking the approximate circuits. Karthik Nayak; Devanshi Upadhyaya; Francesco Regazzoni and Ilia Polian. In To appear in Proceedings of IEEE Asian Hardware Oriented Security and Trust Symposium (AsianHOST), Singapore, SG, 2023.
    48. On Side-Channel Analysis of Memristive Cryptographic Circuits. Li-Wei Chen; Ziang Chen; Werner Schindler; Xianyue Zhao; Heidemarie Schmidt; Nan Du and Ilia Polian. IEEE Transactions on Information Forensics and Security 18, (2023), pp. 463–476. DOI: https://doi.org/10.1109/TIFS.2022.3223232
    49. HW/SW Co-design for Approximation-Aware Binary Neural Networks. Abhilasha Dave; Fabio Frustaci; Fanny Spagnolo; Mikail Yayla; Jian-Jia Chen and Hussam Amrouch. IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS), under major revision (2023).
    50. Workload-Aware Periodic Interconnect BIST. Somayeh Sadeghi-Kohan; Sybille Hellebrand and Hans-Joachim Wunderlich. IEEE Design & Test (2023), pp. 1–1. DOI: https://doi.org/10.1109/MDAT.2023.3298849
    51. HW/SW Co-design for Reliable In-Memory Brain-Inspired Hyperdimensional Computing. Simon Thomann; Paul R. Genssler and Hussam Amrouch. IEEE Transactions on Computers (TC) (2023).
    52. Tutorial: The Synergy of Hyperdimensional and In-memory Computing. Paul R. Genssler; Simon Thomann and Hussam Amrouch. In International Conference on Hardware/Software Codesign and System Synthesis (CODES/ISSS ’23 Companion), 2023.
    53. Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. Om Prakahs; Kai Ni and Hussam Amrouch. In Proceedings of the IEEE 61st International Reliability Physics Symposium  (IRPS’23), Monterey, California, U.S., 2023.
  2. 2022

    1. Benchmarking the performance of portfolio optimization with QAOA. Daniel Brandhofer, Sebastianand Braun; Vanessa Dehn; Gerhard Hellstern; Matthias Hüls; Yanjun Ji; Ilia Polian; Amandeep Singh Bhatia and Thomas Wellens. Quantum Information Processing 22, 1 (December 2022), pp. 25. DOI: https://doi.org/10.1007/s11128-022-03766-5
    2. Compact Ferroelectric Programmable Majority Gate for Compute-in-Memory Applications. Shan Deng; Mahdi Benkhelifa; Simon Thomann; Zubair Faris; Zijian Zhao; Tzu-Jung Huang; Yixin Xu; Vijaykrishnan Narayanan; Kai Ni and Hussam Amrouch. In 68th Annual IEEE International Electron Devices Meeting (IEDM’22), 2022.
    3. Physics inspired compact modelling of BiFe₃ based memristors. Sahitya Yarragolla; Nan Du; Torben Hemke; Xianyue Zhao; Ziang Chen; Ilia Polian and Thomas Mussenbrock. Scientific Reports 12, 1 (November 2022), pp. 20490. DOI: https://doi.org/10.1038/s41598-022-24439-4
    4. Online Periodic Test of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE Asian Test Symposium, Taichung, Taiwan, 2022, pp. 1--6. DOI: https://doi.org/10.1109/ATS56056.2022.00026
    5. AppGNN: Approximation-Aware Functional Reverse Engineering using Graph Neural Networks. Tim Buecher; Lilas Alrahis; Sergio Bampi; Guilherme Paim; Ozgur Sinanoglu and Hussam Amrouch. In IEEE/ACM 41st International Conference on Computer-Aided Design (ICCAD’22), 2022.
    6. Cross-layer FeFET Reliability Modeling towards Robust Hyperdimensional Computing. Shubham Kumar; Swetaki Chatterjee; Simon Thomann; Paul R Gemssler; Yogesh S. Chauhan and Hussam Amrouch. In IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC’22), 2022.
    7. Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications. Juan Núñez; Simon Thomann; Hussam Amrouch and María J. Avedillo. In IEEE International Conference on Electronics, Circuits and Systems (ICECS’22), 2022.
    8. Brain-Inspired Hyperdimensional Computing for Ultra-Efficient Edge AI. Hussam Amrouch; Mohsen Imani; Xun Jiao; Yiannis Aloimonos; Cornelia Fermuller; Dehao Yuan; Dongning Ma; Hamza Errahmouni; Paul R. Genssler and Peter Sutor. In Proceedings of the 2022 International Conference on Hardware/Software Codesign and System Synthesis, 2022.
    9. Efficient and Robust Resistive Open Defect Detection based on Unsupervised Deep Learning. Yiwen Liao; Zahra Paria Najafi-Haghi; Hans-Joachim Wunderlich and Bin Yang. In In Proceedings of the IEEE International Test Conference (ITC’22), Anaheim, CA, USA, 2022. DOI: https://doi.org/10.1109/ITC50671.2022.00026
    10. Joint Modeling of Multi-Domain Ferroelectric and Distributed Channel towards Unveiling the Asymmetric Abrupt DC Current Jump in Ferroelectric FET. Simon Thomann; Kai Ni and Hussam Amrouch. In 48th  IEEE European Solid-state Circuits and Devices Conference (ESSDERC’22), 2022.
    11. Advanced Thermal Management using Approximate Computing and On-Chip Thermoelectric Cooling. Hammam Kattan and Hussam Amrouch. In IEEE Symposium on Integrated Circuits and Systems Design (SBCCI’22), 2022.
    12. A Novel Approach to Mitigate Power Side Channel Attacks for Emerging Negative Capacitance Transistor Technology. Shubham Kumar; Swetaki Chatterjee; Chetan Dabhi; Hussam Amrouch and Yogesh S Chauhan. In 20th IEEE International NEWCAS Conference, 2022.
    13. On Extracting Reliability Information from Speed Binning. Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch and Hans-Joachim Wunderlich. In Proceedings of the 27th IEEE European Test Symposium (ETS’22), Barcelona, Spain, 2022. DOI: https://doi.org/10.1109/ETS54262.2022.9810443
    14. Mitigating the Complexity of Chip Designs with ML-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. In Workshop on Intelligent Methods for Test and Reliability (IMTR’22), 2022.
    15. Hinter den Kulissen. Martin Rettinger; Jajnabalkya Guhathakurta; Peter Gänz; Sven Simon and Mike Schlaich. Beton- und Stahlbetonbau 117, (April 2022). DOI: https://doi.org/10.1002/best.202200008
    16. Robust Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the Conference on Design, Automation and Test in Europe (DATE’22), Antwerp, Belgium, 2022, pp. 1--4. DOI: https://doi.org/10.23919/DATE54114.2022.9774770
    17. Intelligent Methods for Test and Reliability. Hussam Amrouch; Jens Anders; Steffen Becker; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; André van Hoorn; Hanieh Jafarzadeh; Ingmar Kallfass; Florian Klemme; Steffen Koch; Ralf Küsters; Andrés Lalama; Raphael Latty; Yiwen Liao; Natalia Lylina; Zahra Paria Najafi-Haghi; Dirk Pflüger; Ilia Polian; Jochen Rivoir; Matthias Sauer; Denis Schwachhofer; Steffen Templin; Christian Volmer; Stefan Wagner; Daniel Weiskopf; Hans-Joachim Wunderlich; Bin Yang and Martin Zimmermann. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, 2022, pp. 1–6.
    18. Machine Learning for Reliability-Aware, yet Confidential Standard Cell Characterization. Florian Klemme and Hussam Amrouch. In The 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ’22), 2022.
    19. Stress-Aware Periodic Test of Interconnects. Sadeghi-Kohan Somayeh; Sybille Hellebrand and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) (January 2022). DOI: https://doi.org/10.1007/s10836-021-05979-5
    20. Design Close to the Edge in Advanced Technology using Machine  Learning and Brain-Inspired Algorithms. Hussam Amrouch; Florian Klemme and Paul R. Genssler. In 27th Asia and South Pacific Design Automation Conference  (ASP-DAC’22), 2022.
    21. Trojan Detection in Embedded Systems with FinFET Technology. V. Surabhi; P. Krishnamurthy; H. Amrouch; R. Henkel, J. Karri and F. Khorrami. Transactions on Computers (TC’22) (2022).
    22. Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. Navjeet Bagga; Kai Ni; Nitanshu Chauhan; Sharon Hu and Hussam Amrouch. In Proceedings of the IEEE 60th International Reliability Physics Symposium  (IRPS’22), Dallas, U.S., 2022.
    23. Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications. Kai Ni; Simon Thomann; Zijian Zhao; Shan Deng and Hussam Amrouch. In Proceedings of the IEEE 60th International Reliability Physics Symposium  (IRPS’22), Dallas, U.S., 2022.
    24. Trojan Detection in Embedded Systems with FinFET Technology. V. Surabhi; P. Krishnamurthy; H. Amrouch; J. Henkel; R. Karri and F. Khorrami. Transactions on Computers (TC’22) (2022).
    25. A Novel Attack Mode on Advanced Technology Nodes Exploiting Transistor Self-Heating. Nikhil Rangarajan; Nimisha Knechtel, Limaye; Johann; Ozgur Sinanoglu and Hussam Amrouch. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’22), ESWEEK Special Issue (2022).
    26. CARAT: A Framework for Analysis of BTI-HCD Aging in Digitial and AMS Circuits. Narendra Gangwar; Chaitanya Pasupuleti; M van Santen Victor; Uma Sharma; Hussam Amrouch and Souvik Mahapatra. Solid-State Electronics (SSE’22) (2022).
    27. Reliable Binarized Neural Networks on Unreliable Beyond von-Neumann Architecture. Mikail Yayla; Sebastian Buschjäger; Katharina Morik; Jian-Jia Chen and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers  (TCAS-I) (2022).
    28. Calibration-Aware Transpilation for Variational Quantum Optimization. Yanjun Ji; Sebastian Brandhofer and Ilia Polian. In 2022 IEEE International Conference on Quantum Computing and Engineering (QCE), 2022, pp. 204–214. DOI: https://doi.org/10.1109/QCE53715.2022.00040
    29. Human vs. Automatic Detection of Deepfake Videos Over Noisy Channels. Swaroop Shankar Prasad; Ofer Hadar; Thang Vu and Ilia Polian. In 2022 IEEE International Conference on Multimedia and Expo (ICME), 2022, pp. 1–6. DOI: https://doi.org/10.1109/ICME52920.2022.9859954
    30. Benchmarking the performance of portfolio optimization with QAOA. Sebastian Brandhofer; Daniel Braun; Vanessa Dehn; Gerhard Hellstern; Matthias Hüls; Yanjun Ji; Ilia Polian; Amandeep Singh Bhatia and Thomas Wellens. 2022.2022. DOI: https://doi.org/10.48550/ARXIV.2207.10555
    31. Scatter Correction for High-Resolution Flat-Panel CT Based on a Fast Monte Carlo Photon Transport Model. A. Alsaffar; S. Kieß; K. Sun and S. Simon. 2022.
    32. Leveraging Ferroelectric Stochasticity and In-Memory Computing for DNN IP Obfuscation. Likhitha Mankali; Nikhil Rangarajan; Swetaki Chatterjee; Shubham Kumar; Yogesh S. Chauhan; Ozgur Sinanoglu and Hussam Amrouch. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC) (2022).
    33. Thermal-Aware DNN Accelerator Design. Georgios Zervakis; Iraklis Anagnostopoulos; Sami Salamin; Ourania Spantidi; Isai Roman Ballesteros; Joerg Henkel and Hussam Amrouch. Transactions on Computers (TC’22) (2022).
    34. Brain-Inspired Computing for Circuit Reliability Characterization. Paul R. Genssler and Hussam Amrouch. Transactions on Computers (TC) (2022). DOI: https://doi.org/10.1109/TC.2022.3151857
    35. Asymmetric Double Gate Ferroelectric FET to Break the Tradeoff Between Thickness Scaling and Memory Window. Zhouhang Jiang; Yi Xiao; Swetaki Chatterjee; Halid Mulaosmanovic; Stefan Duenkel; Steven Soss; Sven Beyer; Rajiv Joshi; Yogesh S. Chauhan; Hussam Amrouch; Vijaykrishnan Narayanan and Kai Ni. In Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI’22), Hawaii, U.S., 2022.
    36. Brain-Inspired Hyperdimensional Computing: How Thermal-Friendly for Edge Computing? Paul Genssler; Austin Vas and Hussam Amrouch. IEEE Embedded Systems Letters (ESL’22) (2022).
    37. Targeting DNN Inference via Efficient Utilization of Heterogeneous Precision DNN Accelerators. Ourania Spantidi; Georgios Zervakis; Sami Salamin; Isai Roman Ballesteros; Joerg Henkel; Hussam Amrouch and Iraklis Anagnostopoulos. IEEE Transactions on Emerging Topics in Computing (TETC) (2022).
    38. Wafer Map Defect Identification Based on the Fusion of Pattern and Pixel Information. Yiwen Liao; Raphael Latty; Paul R. Genssler; Hussam Amrouch and Bin Yang. In IEEE International Test Conference (ITC’22), 2022.
    39. Ferroelectric FDSOI FET Modeling for Memory and Logic Applications. Swetaki Chatterjee; Shubham Kumar; Chetankumar Dabhi; Yogesh S. Chauhan and Hussam Amrouch. Solid-State Electronics (SSE’22) (2022).
    40. SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2022), pp. 1--14. DOI: https://doi.org/10.1109/TCAD.2022.3158250
    41. Novel FDSOI-Based Dynamic XNOR Logic for Ultra-Efficient High-Dense Computing. Shubham Kumar; Swetaki Chatterjee; Chetankumar Dabhi; Hussam Amrouch and Yogesh S. Chauhan. In Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS’22), Austin Texas, USA, 2022.
    42. Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization. Hussam Amrouch; Krishnendu Chakrabarty; Dirk Pflüger; Ilia Polian; Matthias Sauer and Matteo Sonza Reorda. In 2022 IEEE European Test Symposium (ETS), 2022, pp. 1–6. DOI: https://doi.org/10.1109/ETS54262.2022.9810416
    43. Stochastic Computing Architectures for Lightweight LSTM Neural Networks. Roshwin Sengupta; Ilia Polian and John P. Hayes. In 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2022, pp. 124–129. DOI: https://doi.org/10.1109/DDECS54261.2022.9770167
    44. Test und Diagnose. Hans-Joachim Wunderlich. In Taschenbuch Digitaltechnik (4. neu bearbeitete Auflage), Christian Siemers and Axel Sikora (eds.). Carl Hanser Verlag GmbH & Co. KG, 2022, pp. 266–289. DOI: https://doi.org/10.3139/9783446470453.009
    45. Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage. Swetaki Chatterjee; Simon Thomann; Chetan; Yogesh S Chauhan and Hussam Amrouch. IEEE Transactions on Electron Devices (TED’22) (2022).
    46. Multi-Material Blind Beam Hardening Correction Based on Non-Linearity Adjustment of Projections. Ammar Alsaffar; Kaicong Sun and Sven Simon. 2022.2022. DOI: https://doi.org/10.48550/ARXIV.2203.04587
    47. FL-MISR: fast large-scale multi-image super-resolution for computed tomography based on multi-GPU acceleration. Kaicong Sun; Trung-Hieu Tran; Jajnabalkya Guhathakurta and Sven Simon. Journal of Real-Time Image Processing 19, 2 (2022), pp. 331--344. DOI: https://doi.org/10.1007/s00138-014-0623-4
    48. Printed Temperature Sensor Array for High-Resolution Thermal Mapping. Tim Buecher; Robert Huber; Carsten Eschenbaum; Adrian Mertens; Uli Lemmer and Hussam Amrouch. Nature Scientific Reports (2022).
    49. An FPGA-Based Residual Recurrent Neural Network for Real-Time Video Super-Resolution. Kaicong Sun; Maurice Koch; Zhe Wang; Slavisa Jovanovic; Hassan Rabah and Sven Simon. IEEE Transactions on Circuits and Systems for Video Technology 32, 4 (2022), pp. 1739–1750. DOI: https://doi.org/10.1109/TCSVT.2021.3080241
    50. 3DVSR: 3D EPI volume-based approach for angular and spatial light field image super-resolution. Trung-Hieu Tran; Jan Berberich and Sven Simon. Signal Processing 192, (2022), pp. 108373. DOI: https://doi.org/10.1016/j.sigpro.2021.108373
    51. Beneath the Surface - Computed Tomography for Precast Segmental Bridges. M. Rettinger; J. Guhathakurta; P. Ganz; S. Simon and M. Schlaich. Beton- und Stahlbetonbau 117, 2 (2022).
    52. Efficient Learning Strategies for Machine Learning-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    53. Scalable Machine Learning to Estimate the Impact of Aging on Circuits under Workload Dependency. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    54. Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing. Kai Ni and Hussam Amrouch. In Proceedings of the IEEE 60th International Reliability Physics Symposium  (IRPS’22), Dallas, U.S., 2022.
    55. Design-Time Exploration of Voltage Switching Against Power Analysis Attacks in 14nm FinFET Technology. J. Knechtel; Tarek Asha; Natasha Fernengel; S. Patnaik; M. Nabeel; M. Ashraf; O. Sinanoglu and H. Amrouch. Integration VLSI Journal (IVLSI) (2022).
    56. GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. Lilas Alrahis; Johann Knechtel; Florian Klemme; Hussam Amrouch and Ozgur Sinanoglu. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’22), ESWEEK Special Issue (2022).
    57. Characterizing Approximate Arithmetic Adders and Multipliers for Mitigating Aging and Temperature Degradations. Francisco J. H. Santiago; Honglan Jiang; Hussam Amrouch; Andreas Gerstlauer; Leibo Liu and Jie Han. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    58. Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022). DOI: https://doi.org/10.1109/TCSI.2022.3201431
    59. Machine Learning-Based Microarchitecture-Level Power Modeling of CPUs. Ajay Krishna; Sami Salamin; Hussam Amrouch and Andreas Gerstlauer. IEEE Transactions on Computers (TC) (2022).
    60. Security in an Approximated World: New Threats and Opportunities in the Approximate Computing Paradigm. Paolo Palmieri; Ilia Polian and Francesco Regazzoni. In Approximate Computing Techniques: From Component- to Application-Level, Alberto Bosio; Daniel Ménard and Olivier Sentieys (eds.). Springer International Publishing, Cham, 2022, pp. 323--348. DOI: https://doi.org/10.1007/978-3-030-94705-7_11
    61. On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks. Florian Neugebauer; Stefan Holst and Ilia Polian. In 2022 IEEE European Test Symposium (ETS), 2022, pp. 1–6. DOI: https://doi.org/10.1109/ETS54262.2022.9810429
    62. Modeling TPU Thermal Maps under Superlattice Thermoelectric Cooling. Tim Buecher and Hussam Amrouch. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access) (2022).
    63. All-in-Memory Brain-Inspired Computing using FeFET Synapses. Simon Thomann; Nguyen Hong Lam Giang; Paul R. Genssler and Hussam Amrouch. Frontiers in Electronics (2022). DOI: https://doi.org/10.3389/felec.2022.833260
    64. Second Harmonic Generation Exploiting Ultra-Stable Resistive Switching Devices for Secure Hardware Systems. Ziang Chen; Nan Du; Mahdi Kiani; Xianyue Zhao; Ilona Skorupa; Stefan E. Schulz; Danilo Bürger; Massimiliano Di Ventra; Ilia Polian and Heidemarie Schmidt. IEEE Transactions on Nanotechnology 21, (2022), pp. 71–80. DOI: https://doi.org/10.1109/TNANO.2021.3135713
    65. Computational Scatter Correction for High-Resolution Flat-Panel CT Based on a Fast Monte Carlo Photon Transport Model. Ammar Alsaffar; Steffen Kieß; Kaicong Sun and Sven Simon. 2022.2022. DOI: https://doi.org/10.48550/ARXIV.2201.13191
    66. Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. Konstantinos Balaskas; Florian Klemme; Georgios Zervakis; Kostas Siozios; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
  3. 2021

    1. On the Channel Percolation in Ferroelectric FET Towards Proper Analog States Engineering. Kai Ni; Simon Thomann; Om Prakash; Zijian Zhao; Shan Deng and Hussam Amrouch. In 67th Annual IEEE International Electron Devices Meeting (IEDM’21), 2021.
    2. Positive/Negative Approximate Multipliers for DNN Accelerators. Ourania Spantidi; Georgios Zervakis; Hussam Amrouch; Jörg Henkel and Iraklis Anagnostopoulos. In IEEE/ACM 39th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    3. Binarized SNNs: Efficient and Error-Resilient Spiking Neural  Networks through Binarization. Ming-Liang Wei; Mikail Yayla; SY Ho; Chia-Lin Yang; Jian-Jia Chen and Hussam Amrouch. In IEEE/ACM 40th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    4. Resistive Open Defect Classification of Embedded Cells under Variations. Zahra Paria Najafi-Haghi and Hans-Joachim Wunderlich. In Proceedings of the IEEE Latin-American Test Symposium (LATS’21), Virtual, 2021, pp. 1--6. DOI: https://doi.org/10.1109/LATS53581.2021.9651857
    5. Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’21), Virtual, 2021, pp. 1--10. DOI: https://doi.org/10.1109/ITC50571.2021.00009
    6. Machine Learning for Circuit Aging Estimation under Workload Dependency. Florian Klemme and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    7. Brain-Inspired Computing for Wafer Map Defect Pattern Classification. Paul R. Genssler and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    8. Variability Effects in FinFET and Negative Captitance FinFET technologies. Aniket Gupta; Nitanshu Chauhan; Om Prakash and Hussam Amrouch. In 19th IEEE International Conference on IC Design and Technology (ICICDT’21), 2021.
    9. On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure. Anekit Gupta; Nitanshu Chauhan; Om Prakash and Hussam Amrouch. In International Conference on Simulation of Semiconductor Processes and Devices (SISPAD’21), 2021.
    10. Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. Chih-Hao Wang; Natalia Lylina; Ahmed Atteya; Tong-Yu Hsieh and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/IOLTS52814.2021.9486710
    11. Introduction to the Special Issue on Emerging Challenges and Solutions in Hardware Security. Domenic Forte; Debdeep Mukhopadhyay; Ilia Polian; Yunsi Fei and Rosario Cammarota. J. Emerg. Technol. Comput. Syst. 17, 3 (June 2021). DOI: https://doi.org/10.1145/3464326
    12. ArsoNISQ: Analyzing Quantum Algorithms on Near-Term Architectures. Sebastian Brandhofer; Simon Devitt and Ilia Polian. In Proceedings of the 26th IEEE European Test Symposium (ETS’21), Virtual, 2021, pp. 1--6.
    13. Security, Reliability and Test Aspects of the RISC-V Ecosystem. Jaume Abella; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker; Elke De Mulder; Nourhan Elhamawy; Frank K. Gürkaynak; Helena Handschuh; Carles Hernandez; Mike Hutter; Leonidas Kosmidis; Ilia Polian; Matthias Sauer; Stefan Wagner and Francesco Regazzoni. In Proceedings of the 26th IEEE European Test Symposium (ETS’21), 2021.
    14. Noisy Intermediate-Scale Quantum (NISQ) Computers: How They Work, How They Fail, How to Test Them? Sebastian Brandhofer; Simon Devitt; Thomas Wellens and Ilia Polian. In Proceedings of the 39th IEEE VLSI Test Symposium (VTS’21), Virtual, 2021, pp. 1--6.
    15. A Hybrid Protection Scheme for Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya and Hans-Joachim Wunderlich. In Proceedings of the IEEE VLSI Test Symposium (VTS’21), Virtual, 2021, pp. 1--7. DOI: https://doi.org/10.1109/VTS50974.2021.9441029
    16. Impact of Transistor Self-Heating  on Logic Gates. Victor M. van Santen; Linda Schillinger and Hussam Amrouch. In IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT’21), Virtual, 2021.
    17. On the Critical Role of Ferroelectric Thickness for Negative Capacitance Transistor Optimization. Om Prakash; Aniket Gupta; Girish Pahwa; Yogesh Chauhan and Hussam Amrouch. In IEEE Electron Devices Technology & Manufacturing Conference    (EDTM’21), 2021.
    18. Soft Errors in Negative Capacitance FDSOI SRAMs. Govind Bajpai; Aniket Gupta; Om Prakash; Yogesh Chauhan and Hussam Amrouch. In IEEE Electron Devices Technology & Manufacturing Conference    (EDTM’21), 2021.
    19. Towards Utilizing Self-awareness During System-level Test. Denis Schwachhofer; Steffen Becker; Matthias Sauer; Stefan Wagner and Ilia Polian. In 33. GI / GMM / ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ’21)), 2021.
    20. Reliability-Aware Quantization for Anti-Aging NPUs. Sami Salamin; Georgios Zervakis; Ourania Spantidi; Iraklis Anagnostopoulos; Jörg Henkel and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’21), Virtual Event, 2021.
    21. Machine Learning for Semiconductor Test and Reliability. Hussam Amrouch; Animesh Basak Chowdhury; Wentian Jin; Ramesh Karri; Khorrami Farshad; Prashanth Krishnamurthy; Ilia Polian; Victor M. van Santen; Benjamin Tan and Sheldon Tan. In IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    22. Nano Security: From Nano-Electronics to Secure Systems. Ilia Polian; Frank Altmann; Tolga Arul; Christian Boit; Ralf Brederlow; Lucas Davi; Rolf Drechsler; Nan Du; Thomas Eisenbarth; Tim Güneysu; Sascha Hermann; Matthias Hiller; Rainer Leupers; Farhad Merchant; Thomas Mussenbrock; Stefan Katzenbeisser; Akash Kumar; Wolfgang Kunz; Thomas Mikolajick; Vivek Pachauri; Jean-Pierre Seifert; Frank Sill Torres and Jens Trommer. In Proceedings of the Conference on Design, Automation &  Test in Europe (DATE’21), Virtual Event, 2021.
    23. Approximate Computing for ML: State-of-the-art, Challenges and  Visions. Georgios Zervakis; Hassaan Saadat; Hussam Amrouch; Andreas Gerstlauer; Sri Parameswaran and Joerg Henkel. In 26th Asia and South Pacific Design Automation Conference  (ASP-DAC’21), 2021.
    24. Cross-layer Design for Computing-in-Memory: From Devices,  Circuits, to Architectures and Applications. Hussam Amrouch; Xiaobo Sharon Hu; Mohsen Imani; Ann Franchesca Laguna; Michael Niemier; Simon Thomann; Xunzhao Yin and Cheng Zhuo. In 26th Asia and South Pacific Design Automation Conference  (ASP-DAC’21), 2021.
    25. On-demand Mobile CPU Cooling with Thin-Film Thermoelectric  Array. Hammam Kattan; Sung Woo Chung; Joerg Henkel and Hussam Amrouch. IEEE Micro Magazine (MICRO’21) (2021).
    26. Automated Design Approximation to Suppress Circuit Aging. Konstantinos Balaskas; Georgios Zervakis; Hussam Amrouch; Jörg Henkel and Kostas Siozios. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    27. Control Variate Approximation for DNN Accelerators. Georgios Zervakis; Ourania Spantidi; Iraklis Anagnostopoulos; Hussam Amrouch and Joerg Henkel. In Proceedings of the 58th Annual Design Automation Conference (DAC’21), San Francisco, USA, 2021.
    28. Traps Based Reliability Barrier on Performance and Revealing  Early Ageing in Negative Capacitance (NC) FET. Nitanshu Chauhan; Aniket Gupta; Govind Bajapi; Priynshi Singhal; Navjeet Bagga; Om Prakash; Shashank Banchhor and Hussam Amrouch. In Proceedings of the IEEE 59th International Reliability Physics Symposium  (IRPS’21), Dallas, Texas, U.S., Virtual, 2021.
    29. GVLD: A Fast and Accurate GPU-Based Variational Light-Field Disparity Estimation Approach. Trung-Hieu Tran; Gasim Mammadov and Sven Simon. IEEE Transactions on Circuits and Systems for Video Technology 31, 7 (2021), pp. 2562–2574. DOI: https://doi.org/10.1109/TCSVT.2020.3028258
    30. A lightweight and robust VCSEL-based 3D-depth sensing approach for mobile application. Trung-Hieu Tran; Sven Simon; Bo Chen; Detlef Russ and Daniel Claus. In Digital Optical Technologies 2021, 2021, pp. 70-- 77. DOI: https://doi.org/10.1117/12.2591653
    31. Robust Brain-Inspired Computing: On the Reliability of  Spiking Neural Network Using Emerging Non-Volatile Synapses. Ming-Ling Wei; Hussam Amrouch; Cheng-Lin Sung; Chia-Lin Yang; Khe-Chung Wang and Chin-Yuan Lu. In Proceedings of the IEEE 59th International Reliability Physics Symposium  (IRPS’21), Dallas, Texas, U.S., Virtual, 2021.
    32. Impact of Self-Heating on Negative-Capacitance FinFET:  Device-Circuit Interaction. Om Prakash; Girish Pahwa; Chetan Dabhi; Yogesh S Chauhan and Hussam Amrouch. IEEE Transactions on Electron Devices (TED’21) (2021).
    33. Toward Security Closure in the Face of Physical Migration Effects. Jens Lienig; Susann Rothe; Matthias Thiele; Mohammed Ashraf; Mohammed Nabeel; Nikhil Rangarajan; Hussam Amrouch; Ozgur Sinanoglu; Ramesh Karri and Johann Knechtel. In IEEE/ACM 40th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    34. System-Level Test: State of the art and challenges. Davide Appello; H. H. Chen; Matthias Sauer; Ilia Polian; Paolo Bernardi and Matteo Sonza Reorda. In Proc. IEEE Int’l On-Line Test Test Symp., online, 2021.
    35. MLCAD: A Survey of Research in Machine Learning for CAD. Martin Rapp; Hussam Amrouch; Yibo Lin; Bei Yu; David Pan; M. Wolf and J. Henkel. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2021).
    36. Energy Efficient Edge Computing Enabled by Satisfaction Games and Approximate Computing. Nafis Irtija; Iraklis Anagnostopoulos; Georgios Zervakis; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Green Communications and Networking (TGCN) (2021).
    37. Brain-Inspired Computing: Adventure from Beyond CMOS Technologies to Beyond von Neumann Architectures. Hussam Amrouch; Jian-Jia Chen; Kaushik Roy; Yuan Xie; Indranil Chakraborty; Wenqin Huangfu; Ling Liang; Fengbin Tu; Cheng Wang and Mikail Yayla. In IEEE/ACM 40th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    38. Towards reliable in-memory computing: From emerging devices to post-von-Neumann architectures. Hussam Amrouch; Nan Du; Anteneh Gebregiorgis; Said Hamdioui and Ilia Polian. In Proc. IFIP / IEEE Int’l Conf. on Very Large Scale Integration (VLSI-SoC). (Accepted), online, 2021.
    39. Machine Learning for On-the-fly Reliability-Aware Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    40. Bridging the Gap Between Voltage Over-Scaling and Joint  Hardware Accelerator-Algorithm Closed-Loop. Guilherme Paim; Hussam Amrouch; Eduardo A. C. da Costa; Sergio Bampi and Jörg Henkel. IEEE Transactions on Circuits and Systems for Video Technology  (TCSVT’21) (2021).
    41. Detection of malicious spatial-domain steganography over noisy channels. Swaroop Shankar Prasad; Ofer Hadar and Ilia Polian. In Multidisciplinary Approach to Modern Digital Steganography, Sabyasachi Pramanik; Mangesh Manikrao Ghonge; Renjith V. Ravi and Korhan Cengiz (eds.). IGI Global, 2021.
    42. Investigation of the Influence of Transport Processes on Chemical Reactions in Bubbly Flows Using Space-Resolved In Situ Analytics and Simultaneous Characterization of Bubble Dynamics in Real-Time, Reactive Bubbly Flows. J. Guhathakurta; D. Schurr; G. Rinke; D. Grottke; Kraut M.; R. Dittmeyer and S. Simon. Springer (2021), pp. 163–196.
    43. 3DVSR: 3D EPI Volume-based Approach for Angular and Spatial Light filed Image Super-resolution. T. H. Tran; J. Berberich and S. Simon. Signal processing (2021), pp. 108373.
    44. Guest Editors’ Introduction: Stochastic Computing for Neuromorphic Applications. Ilia Polian; John P. Hayes; Vincent T. Lee and Weikang Qian. IEEE Design & Test 38, 6 (2021), pp. 5–15. DOI: https://doi.org/10.1109/MDAT.2021.3080989
    45. On the Reliability of In-Memory Computing: Impact of  Temperature on Ferroelectric TCAM. Simon Thomann; Chao Li; Cheng Zhuo; Om Prakash; Xunzhao Yin; X. Sharon Hu and Hussam Amrouch. In Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    46. FeFET and NCFET for Future DNNs: Visions and Opportunities. Yayla Mikail; Kuan-Hsun Chen; Christian Hakert; Georgios Zervakis; Jian-Jia Chen; Jörg Henkel and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’21), Virtual Event, 2021.
    47. Online Test Strategies and Optimizations for Reliable Reconfigurable Architectures. Lars Bauer; Hongyan Zhang; Michael A. Kochte; Eric Schneider; Hans-Joachim Wunderlich and Jörg Henkel. In Dependable Embedded Systems, Jörg Henkel and Nikil Dutt (eds.). Springer International Publishing, Cham, 2021, pp. 277--302. DOI: https://doi.org/10.1007/978-3-030-52017-5_12
    48. Extending circuit design flow for early assessment of fault attack vulnerabilities. Felipe Valencia; Ilia Polian and Francesco Regazzoni. In Proc. Euromicro Conf. on Digital System Design. (Accepted), online, 2021.
    49. Protecting artificial intelligence IPs: a survey of watermarking and fingerprinting for machine learning. Francesco Regazzoni; Paolo Palmieri; Fethulah Smailbegovic; Rosario Cammarota and Ilia Polian. CAAI Transactions on Intelligence Technology 6, 2 (2021), pp. 180–191. DOI: https://doi.org/10.1049/cit2.12029
    50. PROTON: Post-synthesis ferROelectric Thickness OptimizatioN for NCFET Circuits. Sami Salamin; Georgios Zervakis; Joerg Henkel and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    51. On the Reliability of FeFET On-Chip Memory. Paul R. Genssler; Victor M. van Santen; Joerg Henkel and Hussam Amrouch. IEEE Transactions on Computers (TC’21) (2021).
    52. FeFET-based Binarized Neural Networks Under Temperature-dependent Bit Errors. Mikail Yayla; Sebastian Buschjäger; Aniket Gupta; Jian-Jia Chen; Joerg Henkel; Katharina Morik; Kuan-Hsun Chen and Hussam Amrouch. IEEE Transactions on Computers (TC) (2021).
    53. On resilience of security-oriented error detecting architectures against power attacks: A theoretical analysis. Osnat Keren and I. Polian. In Proc. Computing Frontiers Conference / MalIoT Workshop., online, 2021.
    54. Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU. Sami Salamin; Georgios Zervakis; Florian Klemme; Hammam Kattan; Yogesh Chauhan; Jörg Henkel and Hussam Amrouch. IEEE Transactions on Computers (TC’21) (2021).
    55. Optimal Mapping for Near-Term Quantum Architectures based on Rydberg Atoms. Sebastian Brandhofer; Ilia Polian and Hans Peter Büchler. In 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2021, pp. 1–7. DOI: https://doi.org/10.1109/ICCAD51958.2021.9643490
    56. Bilateral Spectrum Weighted Total Variation for Noisy-Image Super-Resolution and Image Denoising. Kaicong Sun and Sven Simon. IEEE Transactions on Signal Processing 69, (2021), pp. 6329–6341. DOI: https://doi.org/10.1109/TSP.2021.3127679
    57. On the Resiliency of NCFET Circuits against Voltage  Over-Scaling. Guilherme Paim; Georgios Zervakis; Eduardo A. C. da Costa; Sergio Bampi; Jörg Henkel and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I’21) (2021).
    58. Real-Time Full-Chip Thermal Tracking: A Post-Silicon, Machine Learning Perspective. Sheriff Sadiqbatcha; Jinwei Zhao; Hussam Amrouch and Sheldon Tan. IEEE Transactions on Computers (TC) (2021).
    59. Longevity of Commodity DRAMs in Harsh Environments through Thermoelectric Cooling. Deepak M. Mathew; Hammam Kattan; Christian Weis; Jörg Henkel; Norbert Wehn and Hussam Amrouch. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access) (2021).
    60. Adv-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies. Divya Praneetha; Rajesh Kedia; Victor van Santen; Preeti Panda and Hussam Amrouch. IEEE Transactions on Very Large Scale Integration Systems (TVLSI) (2021).
    61. Containing Self-Heating Effects in Advanced Technologies. S. Salamin; V. van Santen; M. Rapp; J. Henkel and H. Amrouch. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access’21) (2021).
    62. Making Historical Gyroscopes Alive -- 2D and 3D Preservations by Sensor Fusion and Open Data Access. J. Wagner Fritsch; B. Ceranski; S. Simon; M. Niklaus; K. Zhan and G. Mammadov. Sensors 21, 3 (2021), pp. 957.
    63. Bilateral Spectrum Weighted Total Variation for Real-World Super Resolution and Image Denoising. K. Sun and S. Simon. (2021), pp. 1–13.
    64. Comprehensive Design-Space Exploration for NCFET-based SRAM  Arrays. Victor M van Santen; Simon Thomann; Yogesh S. Chauhan; Joerg Henkel and Hussam Amrouch. In Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    65. Ferroelectric FET Technologies and Its Applications: From Device to System. Hussam Amrouch; Di Gao; Xiaobo Sharon Hu; Arman Kazemi; Ann Franchesca Laguna; Kai Ni; Michael Niemier; Simon Thomann; Xunzhao and Cheng Zhuo. In IEEE/ACM 40th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    66. Impact of NCFET on Neural Network Accelerators. Georgios Zervakis; Iraklis Anagnostopoulos; Yogesh Chauhan; Jörg Henkel and Hussam Amrouch. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access’21) (2021).
    67. Security Closure of Physical Layouts. Johann Knechtel; Jayanth Gopinath; Jitendra Bhandari; Mohammed Ashraf; Hussam Amrouch; Shekhar Borkar; Sung-Kyu Lim; Ozgur Sinanoglu and Ramesh Karri. In IEEE/ACM 40th International Conference on Computer-Aided Design (ICCAD’21), 2021.
    68. Electrothermal Simulation and Optimization of Thermoelectric Cooler using an Analytical Approach. Liang Chen; Hussam Amrouch and Sheldon Tan. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2021).
    69. Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology. Om Prakash; Nitanshu Chauhan; Anekit Gupta and Hussam Amrouch. Elsevier Microelectronics Journal (Microelectronics’21) (2021).
    70. Characterizing the Thermal Feasibility of Monolithic 3D Microprocessors. Ji Heon Lee; Jeong Hwan Choi; Young Seo Lee; Hussam Amrouch; Joonho Kong; Young-Ho Gong and Sung Woo Chung. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access) (2021).
    71. Software Based Read and Write Wear-Leveling for Non-Volatile Main Memory. Christian Hakert; Kuan-Hsun Chen; Horst Schirmeier; Lars Bauer; Paul Genßler; Georg von der Brüggen; Hussam Amrouch; Jörg Henkel and Jian-Jia Chen. ACM Transactions on Embedded Computing Systems (TECS) (2021).
    72. Full-Chip  Power Density and Thermal Map Characterization for Commercial Microprocessors under Heat Sink Cooling. Jinwei Zhang; Sadiqbatcha Sheriff; Michael O’Dea; Hussam Amrouch and Sheldon Tan. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2021).
    73. Low-power emerging memristive designs towards secure hardware systems for applications in internet of things. Nan Du; Heidemarie Schmidt and Ilia Polian. Nano Materials Science 3, 2 (2021), pp. 186–204.
    74. Transistor Self-Heating: The Rising Challenge for  Semiconductor Testing. Om Prakash; Chetan Dabhim; Yogesh Chauhan and Hussam Amrouch. In Proceedings of IEEE VLSI Test Symposium (VTS’21), Virtual, 2021.
    75. Error Analysis of the Variational Quantum Eigensolver Algorithm. Sebastian Brandhofer; Simon Devitt and Ilia Polian. In 2021 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 2021, pp. 1–6. DOI: https://doi.org/10.1109/NANOARCH53687.2021.9642249
    76. Making Historical Gyroscopes Alive—2D and 3D Preservations by Sensor Fusion and Open Data Access. Dieter Fritsch; Jörg F. Wagner; Beate Ceranski; Sven Simon; Maria Niklaus; Kun Zhan and Gasim Mammadov. Sensors 21, 3 (2021). DOI: https://doi.org/10.3390/s21030957
    77. Investigation of the Influence of Transport Processes on Chemical Reactions in Bubbly Flows Using Space-Resolved In Situ Analytics and Simultaneous Characterization of Bubble Dynamics in Real-Time. Jajnabalkya Guhathakurta; Daniela Schurr; Günter Rinke; Daniel Grottke; Manfred Kraut; Roland Dittmeyer and Sven Simon. In Reactive Bubbly Flows: Final Report of the DFG Priority Program 1740, Michael Schlüter; Dieter Bothe; Sonja Herres-Pawlis and Ulrich Nieken (eds.). Springer International Publishing, Cham, 2021, pp. 163--196. DOI: https://doi.org/10.1007/978-3-030-72361-3_9
    78. FDRN: A fast deformable registration network for medical images. Kaicong Sun and Sven Simon. Medical Physics 48, 10 (2021), pp. 6453–6463. DOI: https://doi.org/10.1002/mp.15011
  4. 2020

    1. Logic Fault Diagnosis of Hidden Delay Defects. Stefan Holst; Matthias Kampmann; Alexander Sprenger; Jan Dennis Reimer; Sybille Hellebrand; Hans-Joachim Wunderlich and Xiaoqing Wen. In Proceedings of the IEEE International Test Conference (ITC’20), Washington DC, USA, 2020. DOI: https://doi.org/10.1109/ITC44778.2020.9325234
    2. Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya; Chih-Hao Wang and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Test Conference (ITC’20), Washington DC, USA, 2020. DOI: https://doi.org/10.1109/ITC44778.2020.9325227
    3. Cell Library Characterization using Machine Learning for Design Technology Co-Optimization. Florian Klemme; Yogesh Chauhan; Joerg Henkel and Hussam Amrouch. In IEEE/ACM 38th International Conference on Computer-Aided Design (ICCAD’20), 2020.
    4. Machine learning and hardware security: challenges and opportunities. Francesco Regazzoni; Shivam Bhasin; Amir Ali Pour; Ihab Alshaer; Furkan Aydin; Aydin Aysu; Vincent Beroulle; Giorgio Di Natal; Paul Franzon; David Hely; Naofumi Homma; Akira Ito; Dirmanto Jap; Priyank Kashyap; Ilia Polian; Seetal Potluri; Rei Ueno; Elena Ioana Vatajelu and Ville Yli-Mayry. In Proceedings of the 39th IEEE International Conference On Computer Aided Design 2020 (ICCAD’20), 2020.
    5. Modeling Emerging Technologies using Machine Learning:  Challenges and Opportunities. Florian Klemme; Jannik Prinz; Victor M. van Santen; Joerg Henkel and Hussam Amrouch. In IEEE/ACM 38th International Conference on Computer-Aided Design (ICCAD’20), 2020.
    6. Exploring the mysteries of system-level test. Ilia Polian; Jens Anders; Stefan Becker; Paolo Bernardi; Krishnendu Chakrabarty; Nourhan Elhamawy; Matthias Sauer; Adith Singh; Matteo Sonza Reorda and Stefan Wagner. In Proceedings of the 29th IEEE Asian Test Symposium (ATS’20), 2020.
    7. Hardware-based fast real-time image classification with stochastic computing. Ponana Kelettira Muthappa; Florian Neugebauer; Ilia Polian and John P. Hayes. In Proceedings of the 38th IEEE International Conference on Computer Design (ICCD’20), 2020.
    8. Side Channel Attacks vs Approximated Computing. Francesco Regazzoni and Ilia Polian. In Proceedings of the 30th ACM Great Lakes Symposium on VLSI 2020 (GLSVLSI ’20), 2020, pp. 321–326. DOI: https://doi.org/10.1145/3386263.3407592
    9. FDRN: Fast Deformable Image Registration Based on Unsupervised Convolutional Neural Networks. Kaicong Sun; Zhaowen Gong and Sven Simon. In Proceedings of the 6th International Conference on Image Formation in X-Ray Computed Tomography, Regensburg, Germany, 2020, pp. 202--205.
    10. An Open-Source Area-Optimized ECEG Cryptosystem in Hardware. Nourhan Elhamawy; Mael Gay and Ilia Polian. In 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2020, pp. 120–125. DOI: https://doi.org/10.1109/ISVLSI49217.2020.00031
    11. Retraining and Regularization to Optimize Neural Networks for Stochastic Computing. Junseok Oh; Florian Neugebauer; Ilia Polian and John Hayes. In 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2020, pp. 246–251. DOI: https://doi.org/10.1109/ISVLSI49217.2020.00052
    12. IPM-RED: combining higher-order masking with robust error detection. Osnat Keren and Ilia Polian. Journal of Cryptographic Engineering 10, (June 2020). DOI: https://doi.org/10.1007/s13389-020-00229-4
    13. Error control scheme for malicious and natural faults in cryptographic modules. Mael Gay; Batya Karp; Osnat Keren and Ilia Polian. Journal of Cryptographic Engineering 10, (June 2020). DOI: https://doi.org/10.1007/s13389-020-00234-7
    14. Variation-Aware Defect Characterization at Cell Level. Zahra Najafi Haghi; Marzieh Hashemipour Nazari and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE European Test Symposium (ETS’20), Tallinn, Estonia, 2020, pp. 1--6. DOI: https://doi.org/10.1109/ETS48528.2020.9131600
    15. Switch Level Time Simulation of CMOS Circuits with Adaptive Voltage and Frequency Scaling. Eric Schneider and Hans-Joachim Wunderlich. In Proceedings of the  IEEE VLSI TestSymposium (VTS’20), San Diego, US, 2020, pp. 1--6.
    16. BTI and HCI Degradation in a Complete 32X64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity. Victor van Santen; Simon Thomann; C. Pasupuleti; P. Genssler; N. Gangwar; U. Sharma; J. Henkel; S. Mahapatra and H. Amrouch. In Proceedings of the IEEE 58th International Reliability Physics Symposium  (IRPS’20), Dallas, Texas, U.S., Dallas, Texas, 2020.
    17. GPU-accelerated Time Simulation of  Systems with Adaptive Voltage and Frequency Scaling. Eric Schneider and Hans-Joachim Wunderlich. In Proceedings of the ACM/IEEEConference  on Design, Automation Test in Europe (DATE’20), Grenoble, France, 2020, pp. 1--6. DOI: https://doi.org/10.23919/DATE48585.2020.9116256
    18. Using Programmable Delay Monitors for  Wear-Out and Early Life Failure Prediction. Chang Liu; Eric Schneider and Hans-Joachim. Wunderlich. In Proceedings of the ACM/IEEEConference  on Design, Automation Test in Europe (DATE’20), Grenoble, France, 2020, pp. 1--6. DOI: https://doi.org/10.23919/DATE48585.2020.9116284
    19. Synthesis of Fault-Tolerant Reconfigurable Scan Networks. Sebastian Brandhofer; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the ACM/IEEE Conference on Design, Automation Test in Europe (DATE’20), Grenoble, France, 2020, pp. 1--6. DOI: https://doi.org/10.23919/DATE48585.2020.9116525
    20. Impact of NBTI Aging on Self-Heating in Nanowire FET. Om Prakash; S. Manhas; Jörg Henkel and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’20), Grenoble, France, 2020.
    21. Energy Optimization in NCFET-based Processors. Sami Salamin; Martin Rapp; Hussam Amrouch; Andreas Gerstlauer and Jörg Henkel. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’20), Grenoble, France, 2020.
    22. Towards Secure Composition of Integrated Circuits and Electronic Systems: On the Role of EDA. Johann Knechtel; Elif Bilge Kavun; Francesco Regazzoni; Annelie Heuser; Anupam Chattopadhyay; Debdeep Mukhopadhyay; Soumyajit Dey; Yunsi Fei; Yaacov Belenky; Itamar Levi; Tim Güneysu; Patrick Schaumont and Ilia Polian. In 2020 Design, Automation  Test in Europe Conference  Exhibition (DATE), 2020, pp. 508–513. DOI: https://doi.org/10.23919/DATE48585.2020.9116483
    23. Impact of Interface Traps Induced Degradation on Negative Capacitance FinFET. Om Prakash; Aniket Gupta; Girish Pahwa; Jörg Henkel; Yogesh Chauhan and Hussam Amrouch. In IEEE Electron Devices Technology & Manufacturing Conference (EDTM’20), 2020.
    24. Scattering Correction of CBCT Projections for the Quality Enhanced CT Reconstruction Using an Efficient Monte Carlo Photon Transport Model. Ammar Alsaffar; Gasim Mammadov and Sven Simon. In Proceedings of the 10th Conference on Industrial Computed Tomography (iCT 2020), Wels, Austria, 2020, pp. 1--6.
    25. Machine Learning Based Online Full-Chip Heatmap Estimation. Sheriff Sadiqbatcha; Yue Zhao; Jinwei Zhang; Hussam Amrouch; Jörg Henkel and Sheldon Tan. In 25th Asia and South Pacific Design Automation Conference (ASP-DAC’20), 2020.
    26. NCFET to Rescue Technology Scaling: Opportunities and Challenges. Hussam Amrouch; Victor M. van Santen; Girish Pahwa; Yogesh Chauhan and Jörg Henkel. In 25th Asia and South Pacific Design Automation Conference (ASP-DAC’20), 2020.
    27. Impact of Self-Heating On Performance, Power and Reliability in FinFET Technology. Victor M. van Santen; Paul R. Genssler; Om Prakash; S. Thomann; Jörg Henkel and Hussam Amrouch. In 25th Asia and South Pacific Design Automation Conference (ASP-DAC’20, 2020.
    28. Detection of Malicious Spatial-Domain Steganography over Noisy Channels Using Convolutional Neural Networks. Swaroop Shankar Prasad; Ofer Hadar and Ilia Polian. Electronic Imaging 2020, 4 (January 2020), pp. 76-1-76–7. DOI: https://doi.org/10.2352/ISSN.2470-1173.2020.4.MWSF-076
    29. Towards a New Thermal Monitoring Based Framework for Embedded CPS Device Security. N. Patel; P. Krishnamurthy; H. Amrouch; J. Henkel; M. Shamouilian; R. Karri and Khorrami. R. IEEE Transactions on Dependable and Secure Computing  (TDSC’20) (2020).
    30. Power-Efficient Heterogeneous Many-Core Design with NCFET Technology. S. Salamin; M. Rapp; A. Pathania; A. Maity; J. Henkel; T. Mitra and H. Amrouch. IEEE Transactions on Computers (TC’20) (2020).
    31. Machine Learning for CAD. Marilyn Wolf; Jörg Henkel and Hussam Amrouch (Eds.). . Springer International Publishing, 2020.
    32. Multi-frame Super-resolution Reconstruction based on Mixed Poisson-Gaussian Noise. K. Sun; T.-H. Tran; R. Krawtschenko and S. Simon. Signal Processing: Image Communication, Elsevier 82, (2020), pp. 1–10.
    33. Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. H. Amrouch; G. Pahwa; A. Gaidhane; F. Klemme; O. Prakash; C. Dabhi and Y. Chauhan. IEEE Transactions on Circuits and Systems I: Regular Paper  (TCAS-I’20), 2020 (2020).
    34. Impact of Interface Traps on Negative Capacitance Transistor:  Device and Circuit Reliability. Om Prakash; Anekit Gupta; Girish Pahwa; Joerg Henkel; Yogesh S. Chauhan and Hussam Amrouch. IEEE Journal of the Electron Devices Society (JEDS’20) (2020).
    35. Hardware Trojan Detection Using Controlled Circuit Aging. V. Surabhi; P. Krishnamurthy; H. Amrouch; K. Basu; R. Henkel, J. Karri and F. Khorrami. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access) (2020).
    36. Massively Parallel Circuit Setup in GPU-SPICE. V. van Santen; F. Florian Diep; J. Henkel and H. Amrouch. IEEE Transactions on Computers (TC’20) (2020).
    37. Information leakage from robust codes protecting cryptographic primitives. Osnat Keren and Ilia Polian. In Frontiers in Hardware Security and Trust: Theory, design and practice, C.H. Chang and Y Cao (eds.). The Institution of Engineering and Technology, 2020.
    38. Scattering Correction of CBCT Projections for the Quality Enhanced CT Reconstruction Using Efficient Monte Carlo Photon Transport Model. A. Alsaffar; G. Mammadov and S. Simon. In 10th Conference on Industrial Computed Tomography, 2020, pp. 1–6.
    39. Exposing Hardware Trojans in Embedded Platforms via Short-Term Aging. V. Surabhi; P. Krishnamurthy; H. Amrouch; R. Henkel, J. Karri and F. Khorrami. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’20), ESWEEK Special Issue (2020).
    40. Dynamic Power and Energy Management for NCFET-based Processors. Sami Salamin; Martin Rapp; Andreas Gerstlauer; Joerg Henkel and Hussam Amrouch. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’20), ESWEEK Special Issue (2020).
    41. Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET. Aniket Gupta; Kai Ni; Om Prakash; X. Sharon Hu and Hussam Amrouch. In Proceedings of the IEEE 58th International Reliability Physics Symposium  (IRPS’20), Dallas, Texas, U.S., Dallas, Texas, 2020.
    42. Weight-Oriented Approximation for Energy-Efficient Neural  Network Inference Accelerators. Zois-Gerasimos Tasoulas; Georgios Zervakis; Iraklis Anagnostopoulos; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers  (TCAS-I) (2020).
    43. A Framework for Crossing Temperature-Induced Timing Errors  Underlying Hardware Accelerators to the Algorithm and Application Layers. G. Paim; H. Amrouch; L. Rocha; B. Abreu; E. da Costa; S. Bampi and J. Henkel. IEEE Transactions on Computers (TC’20) (2020).
    44. Data compression by means of adaptive subsampling. Z. Wang; Y. Baroud; S. Najmabadi and S. Simon. US Patent 10,867,412 (2020).
    45. Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. Kai Ni; Aniket Gupta; Om Prakash; Simon Thomann; X. Sharon Hu and Hussam Amrouch. In Proceedings of the IEEE 58th International Reliability Physics Symposium  (IRPS’20), Dallas, Texas, U.S., Dallas, Texas, 2020.
    46. Impact of Negative Capacitance Field-Effect Transistor (NCFET) on Many-Core Systems. Hussam Amrouch; Martin Rapp; Sami Salamin and Jörg Henkel. In A Journey of Embedded and Cyber-Physical Systems. Springer, Cham, 2020, pp. 107.
    47. Analysis of Digital Logic Circuit Degradation. Subrat Misra; Thirunavukkarasu Vignesh; Jerin Joe; Hussam Amrouch; Jörg Henkel and Souvik Mahapatra. In Recent Advances in Negative Bias Temperature Instability, Souvik Mahapatra (ed.). Springer International Publishing, 2020.
    48. Power Side-Channel Attacks in Negative Capacitance Transistor (NCFET). J. Knechtel; S. Patnaik; M. Nabeel; M. Ashraf; Y. Chauhan; J. Henkel; O. Sinanoglu and H. Amrouch. IEEE Micro Magazine (MICRO’20) (2020).
    49. Design Automation of Approximate Circuits With Runtime Reconfigurable Accuracy. G. Zervakis; H. Amrouch and J. Henkel. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access) (2020).
    50. NPU Thermal Management. Hussam Amrouch; Georgios Zervakis; Kattan; Hammam; Iraklis Anagnostopoulos and Joerg Henkel. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’20), ESWEEK Special Issue (2020).
    51. Impact of Radiation on Negative Capacitance FinFET. Govind Bajpai; Aniket Gupta; Om Prakash; Girish Pahwa; Jörg Henkel; Yogesh Chauhan and Hussam Amrouch. In Proceedings of the IEEE 58th International Reliability Physics Symposium  (IRPS’20), Dallas, Texas, U.S., Dallas, Texas, 2020.
    52. Aging Compensation with Dynamic Computation Approximation. H. Kim; J. Kim; H. Amrouch; Jörg Henkel; A. Gerstlauer; K. Choi and P. Hanmin. IEEE Transactions on Circuits and Systems I: Regular Paper  (TCAS-I’20) (2020).
    53. Post-Silicon Hot-Spot Identification and Machine-LearningBased Thermal Modeling Using Infrared Thermal Imaging. S. M Sheriff; Z. Jinwei; Z. Hengyang; Amrouch; H.; Jörg Henkel and S. Tan. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’20) (2020).

Former Publications

  1. 2024

    1. Time and Space Optimized Storage-based BIST under Multiple  Voltages and Variations. Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In To appear in the Proceedings of the IEEE European Test Symposium (ETS´24), The Hague, Netherland, 2024.
    2. Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle. Sybille Hellebrand; Somayeh Sadeghi-Kohan and Hans-Joachim Wunderlich. In To appear in the International Symposium of EDA 2024 (ISEDA´24), Xi’an, China, 2024.
    3. Robust Tests of Small Delay Faults under PVT-Variations. Hans-Joachim Wunderlich; Hanieh Jafarzadeh and Sybille Hellebrand. In To appear in the International Symposium of EDA 2024 (ISEDA´24), Xi’an, China, 2024.
    4. Scenario-based test content optimization: Scan-test vs.~system-level test. Nourhan Elhamawy; Ilia Polian; Jens Anders and Matthias Sauer. In To appear in Proceedings of 42nd IEEE VLSI Test Symposium (VTS), Tempe, AZ, USA, 2024.
    5. Vmin Testing under Variations: Defect vs. Fault Coverage. Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In To appear in the Proceedings of the IEEE Latin-American Test Symposium (LATS’24), Maceio, Brazil, 2024.
    6. Frontiers in Edge AI with RISC-V: Hyperdimensional Computing vs. Quantized Neural Networks. Paul R. Genssler; Sandy A. Wasif; Miran Wael; Rodion Novkin and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    7. Machine Learning Unleashes Aging and Self-Heating Effects:  From Transistors to Full Processor. Hussam Amrouch; Victor van Santan; Javier Diaz Fortuny and Florian Klemme. In Proceedings of the IEEE 62nd International Reliability  Physics Symposium  (IRPS’24), Dallas, Texas, U.S., 2024.
    8. In-Memory Acceleration of Hyperdimensional Genome Matching on Unreliable Emerging Technologies. Hamza E. Barkam; Sanggeon Yun; Paul R. Genssler; Che-Kai Liu; Zhuowen Zou; Hussam Amrouch and Mohsen Imani. (2024). DOI: https://doi.org/10.1109/TCSI.2024.3351966
    9. Algorithm to Technology Co-Optimization for CiM-based Hyperdimensional Computing. Mahta Mayahinia; Simon Thomann; Paul R. Genssler; Christopher Münch; Hussam Amrouch and Mehdi B. Tahoori. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    10. HDCircuit: Brain-inspired Hyperdimensional Computing for Circuit Recognition. Paul R. Genssler; Lilas Alrahis; Ozgur Sinanoglu and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    11. Locking enabled security analysis of cryptographic circuits. Devanshi Upadhyaya; Maël Gay and Ilia Polian. Cryptography 8, 1 (2024).
    12. On the Severity of Self-Heating in FDSOI at Cryogenic  Temperatures: In-depth analysis from Transistors to Full Processor. Anirban Kar; Florian Klemme; Yogesh Chauhan. S and Hussam Amrouch. In Proceedings of the IEEE 62nd International Reliability  Physics Symposium  (IRPS’24), Dallas, Texas, U.S., 2024.
    13. DropHD: Technology/Algorithm Co-design for Reliable Energy-efficient NVM-based Hyperdimensional Computing under Voltage Scaling. Paul R. Genssler; Mahta Mayahinia; Simon Thomann; Mehdi Tahoori and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’24), 2024.
    14. WaSSaBi: Wafer Selection with Self-supervised Representations and Brain-inspired Active Learning. Karthik Pandaram; Paul R. Genssler and Hussam Amrouch. (2024). DOI: https://doi.org/10.1109/TCSI.2024.3357975
  2. 2019

    1. Architecture for parallel marker-free variable length streams decoding. Yousef Baroud; José Manuel Mariños Velarde; Zhe Wang; Steffen Kieß; Seyyed Mahdi Najmabadi; Jajnabalkya Guhathakurta and Sven Simon. Journal of Real-Time Image Processing 16, 6 (December 2019), pp. 2127–2146. DOI: https://doi.org/10.1007/s11554-017-0715-2
    2. Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. Stefan Holst; Eric Schneider; Michael A. Kochte; Xiaoqing Wen and Hans-Joachim Wunderlich. In Proceedings of the IEEE International TestConference (ITC’19), Washington DC, USA, 2019. DOI: https://doi.org/10.1109/ITC44170.2019.9000143
    3. Security Compliance Analysis of Reconfigurable Scan Networks. Natalia Lylina; Ahmed Atteya; Pascal Raiola; Matthias Sauer; Bernd Becker and Hans-Joachim Wunderlich. In Proceedings of the IEEE International TestConference (ITC’19), Washington DC, USA, 2019. DOI: https://doi.org/10.1109/ITC44170.2019.9000114
    4. Combined MPSoC Task Mapping and Memory Optimization for Low-Power. Manuel Strobel; Gereon Führ; Martin Radetzki and Rainer Leupers. In Proc. IEEE Asia Pacific Conference on Circuit and Systems (APCCAS), Bangkok, Thailand, 2019.
    5. On the Limits of Stochastic Computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In 2019 IEEE International Conference on Rebooting Computing, ICRC, 2019, pp. 98--105. DOI: https://doi.org/10.1109/ICRC.2019.8914706
    6. The Impact of Emerging Technologies on Architectures and System-level Management. Jörg Henkel; Hussam Amrouch; Martin Rapp; Sami Salamin; Dayane Reis; Di Gao; Xunzhao Yin; Michael Niemier; Cheng Zhuo; Hu X. Sharon; Hsiang-Yun Cheng and Chia-Lin Yang. In IEEE/ACM 38th International Conference on Computer-Aided Design (ICCAD’19), 2019.
    7. Design-Time Memory Subsystem Optimization for Low- Power Multi-Core Embedded Systems. Manuel Strobel and Martin Radetzki. In Proceedings of the 2019 IEEE 13th International Symposium on Embedded(MCSoC), Singapore, 2019. DOI: https://doi.org/10.1109/MCSoC.2019.00056
    8. A Machine Learning Enabled Long-Term Performance Evaluation Framework for NoCs. Jie Hou; Q. Han and Martin Radetzki. In Proceedings of the 2019 IEEE 13th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC), Singapore, 2019.
    9. Comparative Study and Proof of Single-Pass Connected Components Algorithms. Michael J. Klaiber; Donald G. Bailey and Sven Simon. J. Math. Imaging Vis. 61, 8 (October 2019), pp. 1112–1134. DOI: https://doi.org/10.1007/s10851-019-00891-2
    10. Built-in Test for Hidden Delay Faults. Matthias Kampmann; Michael A. Kochte; Chang Liu; Eric Schneider; Sybille Hellebrand and Hans-Joachim Wunderlich. IEEE Transactions on Computer-Aided Design of IntegratedCircuits and Systems (TCAD) 38, 10 (October 2019), pp. 1956–1968. DOI: https://doi.org/10.1109/TCAD.2018.2864255
    11. A Backend Tool for the Integration of Memory Optimizations into Embedded Software. Manuel Strobel and Martin Radetzki. In Proceedings of the 2019 Forum on Specification and Design Languages (FDL), Southampton, UK, 2019. DOI: https://doi.org/10.1109/FDL.2019.8876895
    12. A Methodology to Compute Long-Term Fault Resilience of NoCs under Fault-Tolerant Routing Algorithms. Jie Hou and Martin Radetzki. In Proceedings of the 2019 Forum on Specification and Design Languages(FDL), Southampton, UK, 2019.
    13. Hardware-Oriented Algebraic Fault Attack Framework with Multiple Fault Injection Support. Mael Gay; Tobias Paxian; Devanshi Upadhyaya; Bernd Becker and Ilia Polian. In 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 2019, pp. 25–32. DOI: https://doi.org/10.1109/FDTC.2019.00012
    14. NCFET-Aware Voltage Scaling. Sami Salamin; Martin Rapp; Hussam Amrouch; Girish Pahwa; Yogesh S. Chauhan and Jörg Henkel. In 2019 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED’19), 2019.
    15. Automated Sensor Firmware Development - Generation, Optimization, and Analysis. Jens Rudolf; Manuel Strobel; Joscha Benz; Cristian Haubelt; Martin Radetzki and Oliver Bringmann. In MBMV 2019; 22nd Workshop - Methods and Description Languages for Modelling and Verification of Circuits and Systems, 2019, pp. 1–12.
    16. On Secure Data Flow in Reconfigurable Scan Networks. Pascal Raiola; Benjamin Thiemann; Jan Burchard; Ahmed Atteya; Natalia Lylina; Hans-Joachim Wunderlich; Bernd Becker and Matthias Sauer. In Proceedings of the Conference on Design, Automation and Test in Europe (DATE’19), Florence, Italy, 2019, pp. 1016--1021. DOI: https://doi.org/10.23919/DATE.2019.8715172
    17. Spatial Resolution Enhancement Based on Detector Displacement for Computed Tomography. Kaicong Sun; Steffen Kieß and Sven Simon. In Proceedings of the 9th Conference on Industrial Computed Tomography (iCT 2019), Padova, Italy, 2019, pp. 1--8.
    18. Multi-Level Timing and Fault Simulation on GPUs. Eric Schneider and Hans-Joachim Wunderlich. INTEGRATION, the VLSI Journal -- Special Issue of ASP-DAC 2018 64, (January 2019), pp. 78--91. DOI: https://doi.org/10.1016/j.vlsi.2018.08.005
    19. SWIFT: Switch Level Fault Simulation on GPUs. Eric Schneider and Hans-Joachim Wunderlich. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38, 1 (January 2019), pp. 122--135. DOI: https://doi.org/10.1109/TCAD.2018.2802871
    20. Advances in Hardware Reliability of Reconfigurable Many-core Embedded Systems. Lars Bauer; Hongyan Zhang; Michael A. Kochte; Eric Schneider; Hans-Joachim. Wunderlich and Jörg Henkel. In Many-Core Computing: Hardware and software, B. M. Al-Hashimi and G. V. Merrett (eds.). Institution of Engineering and Technology (IET), 2019, pp. 395--416. DOI: https://doi.org/10.1049/PBPC022E_ch16
    21. Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores. Martin Rapp; Sami Salamin; Hussam Amrouch; Girish Pahwa; Yogesh S. Chauhan and Jörg Henkel. In Proceedings of the 56th Annual Design Automation Conference (DAC’19), Las Vegas, USA, 2019.
    22. Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging. Sheriff Sadiqbatcha; Hengyang Zhao; Hussam Amrouch; Jörg Henkel and Sheldon Tan. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’19), Florence, Italy, 2019.
    23. Hybrid telecentric triangulation sensor system with real-time field-dependent deconvolution. A. Faulhaber; M. Gronle; T. Haist; C. Pruß; Y. Baroud; W. Osten and S. Simon. Optical Measurement Systems for Industrial Inspection XI 1105, (2019), pp. 1105613.
    24. On the maximum function in stochastic computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In Proceedings of the 16th ACM International Conference on Computing Frontiers, CF 2019, Alghero, Italy, April 30 - May 2, 2019., 2019, pp. 59--66. DOI: https://doi.org/10.1145/3310273.3323050
    25. Unveiling the Impact of IR-drop on Performance Gain in NCFET-based Processors. Hussam Amrouch; Sami Salamin; Girish Pahwa; Amol D Gaidhane; Jörg Henkel and Yogesh S Chauhan. IEEE Transactions on Electron Devices (T-ED’19) (2019).
    26. Device to Circuit Framework for Activity-Dependent NBTI Aging in Digital Circuits. A Thirunavukkarasu; Hussam Amrouch; Jerin Joe; Nilesh Goel; Narendra Parihar; Subrat Mishra; Chetan K Dabhi; Yogesh S Chauhan; Jörg Henkel and Souvik Mahapatra. IEEE Transactions on Electron Devices (T-ED’19) 66, 1 (2019), pp. 316--323.
    27. Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation. Frank Sill Torres; Hussam Amrouch; Jörg Henkel and Rolf Drechsler. In Proceedings of the IEEE 56th International Reliability Physics Symposium  (IRPS’19), Las Vegas, USA, 2019.
    28. Rebirth-FTL: Lifetime optimization via Approximate Storage for NAND Flash. Lei Han; Hussam Amrouch; Zili Shao and Jörg Henkel. In IEEE Non-Volatile Memory Systems and Applications Symposium  (NVMSA’19), Hangzhou, China, 2019.
    29. Aging Gracefully with Approximation. Jongho Kim; Heesu Kim; Hussam Amrouch; Jörg Henkel; Andreas Gerstlauer and Kiyoung Choi. In Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS’19), Las Vegas, USA, 2019.
    30. Hybrid telecentric triangulation sensor system with real-time field-dependent deconvolution. Andreas Faulhaber; Marc Gronle; Tobias Haist; Christof Pruß; Yousef Baroud; Wolfgang Osten and Sven Simon. In Optical Measurement Systems for Industrial Inspection XI, 2019, pp. 264-- 277. DOI: https://doi.org/10.1117/12.2525568
    31. A JND-Based Pixel-Domain Algorithm and Hardware Architecture for Perceptual Image Coding. Zhe Wang; Trung-Hieu Tran; Ponnanna Kelettira Muthappa and Sven Simon. Journal of Imaging 5, 5 (2019). DOI: https://doi.org/10.3390/jimaging5050050
    32. An Architecture for Asymmetric Numeral Systems Entropy Decoder-A Comparison with a Canonical Huffman Decoder. S. M. Najmabadi; T. H. Tran; S. Eissa; S. Tungal and S. Simon. Journal of Signal Processing Systems 91, 7 (2019), pp. 805–817.
    33. On the Workload Dependence of Self-Heating in FinFET Circuits. Victor M van Santen; Hussam Amrouch; Pooja Sharma and Jörg Henkel. IEEE Transactions on Circuits and Systems II: Express Briefs (TCAS-II’19) (2019).
    34. On the Efficiency of Voltage Overscaling under Temperature and Aging Effects. Hussam Amrouch; Borna Ehsani; Andreas Gerstlauer and Jörg Henkel. IEEE Transactions on Computers (TC’19) (2019).
    35. New Worst-Case Timing for Standard Cells Under Aging Effects. Victor M van Santen; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Device and Materials Reliability (T-DMR’19) 19, 1 (2019), pp. 149--158.
    36. Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level. Victor M van Santen; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I’19) (2019).
    37. Aging Effects: From Physics to CAD. Hussam Amrouch; Heba Khdr and Jörg Henkel. In Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms: A Cross-layer Approach, William Fornaciari and Dimitrios Soudris (eds.). Springer International Publishing, 2019, pp. 43--69. DOI: https://doi.org/10.1007/978-3-319-91962-1_3
    38. Reliability Challenges with Self-Heating in FinFET Technology. H. Amrouch; V. M. van Santen; O. Prakash; H. Kattan; S. Salamin; S. Thomann and J. Henkel. In IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS’19), 2019.
    39. A comment on information leakage from robust code-based checkers detecting fault attacks on cryptographic primitives. Osnat Keren and Ilia Polian. In Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, 2019, pp. 49--63. DOI: https://doi.org/10.29007/r2sc
    40. Constructive Side-Channel Analysis and Secure Design - 10th International Workshop, COSADE 2019, Darmstadt, Germany, April 3-5, 2019, Proceedings. Ilia Polian and Marc Stöttinger (Eds.). Springer.2019. DOI: https://doi.org/10.1007/978-3-030-16350-1
    41. Power-Mode-Aware Memory Subsystem Optimization for Low-Power System-on-Chip Design. Manuel Strobel and Martin Radetzki. ACM Transactions on Embedded Computing Systems(TECS) (2019). DOI: https://doi.org/10.1145/3356583
    42. Hardware-oriented security. Ilia Polian. it - Information Technology 61, 1 (2019), pp. 1--2. DOI: https://doi.org/10.1515/itit-2019-0008
    43. Multi-Branch Deep Residual Neural Networks for Enhancing the Spatial Resolution of 2D Computed Tomography Images. K. Sun; Y. Liu and S. Simon. 15th International Meeting on Fully Three-Dimensional Image Reconstruction (2019), pp. 2.
    44. Automatic construction of fault attacks on cryptographic hardware implementations. Ilia Polian; Maël Gay; Tobias Paxian; Matthias Sauer and Bernd Becker. In Automated Methods in Cryptographic Fault Analysis, Jakub Breier; Xiaolu Hou and Shivam Bhasin (eds.). Springer International Publishing, Cham, 2019, pp. 151–170. DOI: https://doi.org/10.1007/978-3-030-11333-9_6
    45. Selecting the Optimal Energy Point in Near-Threshold Computing. Sami Salamin; Hussam Amrouch and Jörg Henkel. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’19), Florence, Italy, 2019.
    46. Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. Sami Salamin; Victor M van Santen; Hussam Amrouch; Narendra Parihar; Souvik Mahapatra and Jörg Henkel. IEEE Transactions on Very Large Scale Integration Systems (TVLSI’19) (2019).
    47. Estimating and Mitigating Aging Effects in Routing Network of FPGAs. Behnam Khaleghi; Behzad Omidi; Hussam Amrouch; Jörg Henkel and Hossein Asadi. IEEE Transactions on Very Large Scale Integration Systems (TVLSI’19) 27, 3 (2019), pp. 651--664.
    48. Sub-Pixel Registration Technique for X-ray Phase Contrast Imaging. Hamish Bradley; Donald Bailey; Steven Le Moan; Peter Gaenz and Sven Simon. In 2019 International Conference on Image and Vision Computing New Zealand (IVCNZ), 2019, pp. 1–5. DOI: https://doi.org/10.1109/IVCNZ48456.2019.8960959
    49. Improving Testability and Reliability of Advanced SRAM Architectures. Josef Kinseher; Moritz Völker and Ilia Polian. IEEE Trans. Emerging Topics Comput. 7, 3 (2019), pp. 456–467.
    50. A Cross-layer Gate-Level-to-Application Co-simulation for Design Space Exploration of Approximate Circuits in HEVC Video Encoders. Guilherme Paim; Leandro M. G. Rocha; Hussam Amrouch; A. C. da Costa Eduardo; Sergio Bampi and Jörg Henkel. IEEE Transactions on Circuits and Systems for Video Technology  (TCSVT’19) (2019).
    51. Dynamic guardband selection: Thermal-aware optimization for unreliable multi-core systems. Heba Khdr; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Computers (TC’19) 68, 1 (2019), pp. 53--66.
    52. A simulation study of NBTI impact on 14-nm node FinFET technology for logic applications: Device degradation to circuit-level interaction. Subrat Mishra; Hussam Amrouch; Jerin Joe; Chetan K Dabhi; Karansingh Thakor; Yogesh S Chauhan; Jörg Henkel and Souvik Mahapatra. IEEE Transactions on Electron Devices (T-ED’19) 66, 1 (2019), pp. 271--278.
    53. An Architecture for Asymmetric Numeral Systems Entropy Decoder - A                Comparison with a Canonical Huffman Decoder. Seyyed Mahdi Najmabadi; Trung-Hieu Tran; Sherif Eissa; Harsimran Singh Tungal and Sven Simon. J. Signal Process. Syst. 91, 7 (2019), pp. 805--817. DOI: https://doi.org/10.1007/s11265-018-1421-4
    54. Spatial Resolution Enhancement Based on Detector Displacement for Computed Tomography. K. Sun; S. Kieß and S. Simon. In 9th Conference on Industrial Computed Tomography, 2019, pp. 1–8.
  3. 2018

    1. Extending Aging Monitors for Early Life and Wear-out Failure Prevention. Chang Liu; Eric Schneider; Matthias Kampmann; Sybille Hellebrand and Hans-Joachim Wunderlich. In Proceedings of the 27th IEEE Asian Test Symposium (ATS’18), Hefei, Anhui, China, 2018, pp. 92--97. DOI: https://doi.org/10.1109/ATS.2018.00028
    2. Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures  in Low-Power Scan Testing. Yucong Zhang; Xiaoqing Wen; Stefan Holst; Kohei Miyase; Seiji Kajihara; Hans-Joachim Wunderlich and Jun Qian. In Proceedings of the 27th IEEE Asian Test Symposium (ATS’18), Hefei, Anhui, China, 2018, pp. 149--154. DOI: https://doi.org/10.1109/ATS.2018.00037
    3. Self-Test and Diagnosis for Self-Aware Systems. Michael A. Kochte and Hans-Joachim Wunderlich. IEEE Design & Test 35, 5 (October 2018), pp. 7--18. DOI: https://doi.org/10.1109/MDAT.2017.2762903
    4. Device aging: A reliability and security concern. Daniel Kraak; Mottaqiallah Taouil; Said Hamdioui; Pieter Weckx; Francky Catthoor; Abhijit Chatterjee; Adit Singh; Hans-Joachim Wunderlich and Naghmeh Karimi. In Proceedings of the 23rd IEEE European Test Symposium (ETS’18), Bremen, Germany, 2018, pp. 1--10. DOI: https://doi.org/10.1109/ETS.2018.8400702
    5. Online Prevention of Security Violations in Reconfigurable Scan Networks. Ahmed Atteya; Michael A. Kochte; Matthias Sauer; Pascal Raiola; Bernd Becker and Hans-Joachim Wunderlich. In Proceedings of the 23rd IEEE European Test Symposium (ETS’18), Bremen, Germany, 2018, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2018.8400685
    6. Detecting and Resolving Security Violations in Reconfigurable Scan Networks. Pascal Raiola; Michael A. Kochte; Ahmed Atteya; Laura Rodríguez Gómez; Hans-Joachim Wunderlich; Bernd Becker and Matthias Sauer. In Proceedings of the 24th IEEE International Symposium on  On-Line Testing and Robust System Design (IOLTS’18), Platja d’Aro, Spain, 2018, pp. 91--96. DOI: https://doi.org/10.1109/IOLTS.2018.8474188
    7. Guest Editor’s Introduction. Hans-Joachim Wunderlich and Yervant Zorian. IEEE Design & Test 35, 3 (June 2018), pp. 5--6. DOI: https://doi.org/10.1109/MDAT.2018.2799806
    8. Design-Time Optimization Techniques for Low-Power Embedded Memory Subsystems. Manuel Strobel and Martin Radetzki. In Proc. of the 1st International Workshop on Embedded Software for Industrial IOT (ESIIT), Dresden, Germany, 2018.
    9. Guest Editors’ Introduction. Sybille Hellebrand; Jörg Henkel; Anand Raghunathan and Hans-Joachim Wunderlich. IEEE Embedded Systems Letters 10, 1 (March 2018), pp. 1--1. DOI: https://doi.org/10.1109/LES.2018.2789942
    10. Efficient Data Structures for the Fast 3D Reconstruction of Voxel Volumes with Inhomogeneous Spatial Resolution. Benjamin Betz; Steffen Kieß; Michael Krumm; Gunnar Knuppe; Tsegaye Eshete and Sven Simon. In 8th Conference on Industrial Computed Tomography (iCT), Wels, Austria, 2018.
    11. Multi-Level Timing Simulation on GPUs. Eric Schneider; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC’18), Jeju Island, Korea, 2018, pp. 470--475. DOI: https://doi.org/10.1109/ASPDAC.2018.8297368
    12. Recent Advances in EM and BTI Induced Reliability Modeling, Analysis and Optimization. Sheldon X.-D. Tan; Hussam Amrouch; Taeyoung Kim; Zeyu Sun; Chase Cook and Jrg Henkel. Integration VLSI Journal (IVLSI’18) 60, C (January 2018), pp. 132--152.
    13. Hardware-oriented Security in a Computer Science Curriculum. Ilia Polian and Mael Gay. In 12th European Workshop on Microelectronics Education, EWME 2018, Braunschweig, Germany, September 24-26, 2018, 2018, pp. 59--62. DOI: https://doi.org/10.1109/EWME.2018.8629483
    14. Test and Reliability Challenges for Approximate Circuitry. Ilia Polian. Embedded Systems Letters 10, 1 (2018), pp. 26--29. DOI: https://doi.org/10.1109/LES.2017.2754446
    15. S-box-based random number generation for stochastic computing. Florian Neugebauer; Ilia Polian and John P. Hayes. Microprocessors and Microsystems - Embedded Hardware Design 61, (2018), pp. 316--326. DOI: https://doi.org/10.1016/j.micpro.2018.06.009
    16. Quantum era challenges for classical computers. Francesco Regazzoni; Austin G. Fowler and Ilia Polian. In Proceedings of the 18th International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, Pythagorion, Greece, July 15-19, 2018., 2018, pp. 173--178. DOI: https://doi.org/10.1145/3229631.3264737
    17. Detection and Correction of Malicious and Natural Faults in Cryptographic Modules. Batya Karp; Maël Gay; Osnat Keren and Ilia Polian. In PROOFS 2018, 7th International Workshop on Security Proofs for Embedded Systems, colocated with CHES 2018, Amsterdam, The Netherlands, September 13, 2018, 2018, pp. 68--82.
    18. Voltage Adaptation Under Temperature Variation. H. Amrouch; B. Khaleghi and J. Henkel. In 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD’18), 2018, pp. 57–60.
    19. Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE. V. M. van Santen; H. Amrouch and J. Henkel. In IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS’18), 2018, pp. 143–146.
    20. Aging-constrained Performance Optimization for Multi Cores. Heba Khdr; Hussam Amrouch and Jürg Henkel. In Proceedings of the 55th Annual Design Automation Conference (DAC’18), San Francisco, California, 2018, pp. 63:1--63:6.
    21. Aging-Aware Boosting. H. Khdr; H. Amrouch and J. Henkel. IEEE Transactions on Computers (TC’18) 67, 9 (2018), pp. 1217–1230.
    22. Gyrolog — Towards VR Preservations of Gyro Instruments for Historical and Didactical Research. Dieter Fritsch; Joerg F. Wagner; Sven Simon; Beate Ceranski; Maria Niklaus; Kun Zhan; Timo Schweizer and Zhe Wang. In 2018 Pacific Neighborhood Consortium Annual Conference and Joint Meetings (PNC), 2018, pp. 1–7. DOI: https://doi.org/10.23919/PNC.2018.8579456
    23. Effiziente CT-Rekonstruktion eines Voxel-Volumens mit inhomogener räumlicher Auflösung mithilfe eines Octrees. B. Betz; S. Kie; M. Krumm; G. Knupe; T. Eshete and S. Simon. DGZfP-JAHRESTAGUNG (2018), pp. 1–5.
    24. GPU-Accelerated Light-Field Image Super-Resolution. Trung-Hieu Tran; Gasim Mammadov; Kaicong Sun and Sven Simon. In 2018 International Conference on Advanced Computing and Applications (ACOMP), 2018, pp. 7–13. DOI: https://doi.org/10.1109/ACOMP.2018.00010
    25. Security-oriented Code-based Architectures for Mitigating Fault Attacks. Batya Karp; Mael Gay; Osnat Keren and Ilia Polian. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018, 2018, pp. 1--6. DOI: https://doi.org/10.1109/DCIS.2018.8681476
    26. Modeling and Evaluating the Gate Length Dependence of BTI. Victor M van Santen; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems II: Express Briefs (TCAS-II’18) (2018).
    27. Efficient Data Structures for the Fast 3D Reconstruction of Voxel Volumes with Inhomogeneous Spatial Resolution. B. Betz; S. Kieß; M. Krumm; G. Knupe; T. Eshete and S. Simon. In 8th Conference on Industrial Computed Tomography, 2018, pp. 1–6.
    28. Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. V. M. van Santen; J. Martin-Martinez; H. Amrouch; M. M. Nafria and J. Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I’18) 65, 1 (2018), pp. 293–306.
    29. Dynamic Resource Management for Heterogeneous Many-cores. Jörg Henkel; Jürgen Teich; Stefan Wildermann and Hussam Amrouch. In Proceedings of the International Conference on Computer-Aided Design (ICCAD’18), San Diego, California, 2018, pp. 60:1--60:6.
    30. Performability Analysis of Mesh-Based NoCs Using Markov Reward Model. Jie Hou and Martin Radetzki. In 26th Euromicro International Conference on Parallel, Distributed and Network-based Processing, PDP 2018, Cambridge, United Kingdom, March 21-23, 2018, 2018, pp. 609--616. DOI: https://doi.org/10.1109/PDP2018.2018.00102
    31. Security: the dark side of approximate computing? Francesco Regazzoni; Cesare Alippi and Ilia Polian. In Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018, 2018, pp. 44. DOI: https://doi.org/10.1145/3240765.3243497
    32. Dynamic holography for speckle noise reduction in hybrid measurement system. A. Faulhaber; T. Haist; W. Osten and S. Simon. In Laser Beam Shaping XVIII, 2018, pp. 1–12.
    33. Dynamic holography for speckle noise reduction in hybrid measurement system. Andreas Faulhaber; Stefan Haberl; Tobias Haist; Marc Gronle; Yousef Baroud; Wolfgang Osten and Sven Simon. In Laser Beam Shaping XVIII, 2018, pp. 94-- 105. DOI: https://doi.org/10.1117/12.2320486
    34. A spatial moments sub-pixel edge detector with edge blur compensation for imaging metrology. D. Gester and S. Simon. In 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2018, pp. 1–6. DOI: https://doi.org/10.1109/I2MTC.2018.8409664
    35. Framework for Quantifying and Managing Accuracy in Stochastic Circuit Design. Florian Neugebauer; Ilia Polian and John P. Hayes. JETC 14, 2 (2018), pp. 31:1--31:21. DOI: https://doi.org/10.1145/3183345
    36. Estimating and Optimizing BTI Aging Effects: From Physics to CAD. Hussam Amrouch; Victor M. van Santen and Jörg Henkel. In Proceedings of the International Conference on Computer-Aided Design (ICCAD’18), San Diego, California, 2018, pp. 125:1--125:6.
    37. Trading Off Temperature Guardbands via Adaptive Approximations. B. Boroujerdian; H. Amrouch; J. Henkel and A. Gerstlauer. In 2018 IEEE 36th International Conference on Computer Design (ICCD’18), 2018, pp. 202–209.
    38. Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability. V. M. van Santen; J. Diaz-Fortuny; H. Amrouch; J. Martin-Martinez; R. Rodriguez; R. Castro-Lopez; E. Roca; F. V. Fernandez; J. Henkel and M. Nafria. In IEEE International Reliability Physics Symposium (IRPS’18), 2018, pp. P-CR.6-1-P-CR.6-6.
    39. Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance. Hussam Amrouch; Girish Pahwa; Amol D Gaidhane; Jörg Henkel and Yogesh Singh Chauhan. The Multidisciplinary Open Access Journal IEEE Access (IEEE Access’18) 6, (2018), pp. 52754--52765.
  4. 2017

    1. Structure-oriented Test of Reconfigurable Scan Networks. Dominik Ull; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 26th IEEE Asian Test Symposium (ATS’17), Taipei, Taiwan, 2017. DOI: https://doi.org/10.1109/ATS.2017.34
    2. Hardware and software innovations in energy-efficient system-reliability monitoring. V. Tenentes; C. Leech; G. M. Bragg; G. Merrett; B. M. Al-Hashimi; H. Amrouch; J. Henkel and S. Das. In 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’17), 2017, pp. 1–5.
    3. Trustworthy Reconfigurable Access to On-Chip Infrastructure. Michael A. Kochte; Rafal Baranowski and Hans-Joachim Wunderlich. In Proceedings of the 1st International Test Conference in Asia (ITC-Asia’17), Taipei, Taiwan, 2017, pp. 119--124. DOI: https://doi.org/10.1109/ITC-ASIA.2017.8097125
    4. Energy-efficient and Error-resilient Iterative Solvers for Approximate Computing. Alexander Schöll; Claus Braun and Hans-Joachim Wunderlich. In Proceedings of the 23rd IEEE International Symposium on  On-Line Testing and Robust System Design (IOLTS’17), Thessaloniki, Greece, 2017, pp. 237--239. DOI: https://doi.org/10.1109/IOLTS.2017.8046244
    5. Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures. Hongyan Zhang; Lars Bauer; Michael A. Kochte; Eric Schneider; Hans-Joachim Wunderlich and Jörg Henkel. IEEE Transactions on Computers 66, 6 (June 2017), pp. 957--970. DOI: https://doi.org/10.1109/TC.2016.2616405
    6. Towards aging-induced approximations. H. Amrouch; B. Khaleghi; A. Gerstlauer and J. Henkel. In 54th ACM/EDAC/IEEE Design Automation Conference (DAC’17), 2017, pp. 1–6.
    7. Quantifying Security in Reconfigurable Scan Networks. Laura Rodríguez Gómez; Michael A. Kochte; Ahmed Atteya and Hans-Joachim Wunderlich. In 2nd International Test Standards Application Workshop (TESTA), co-located with IEEE European Test Symposium, Limassol, Cyprus, 2017.
    8. Probabilistic Sensitization Analysis for Variation-Aware Path Delay Fault Test Evaluation. Marcus Wagner and Hans-Joachim Wunderlich. In Proceedings of the 22nd IEEE European Test Symposium (ETS’17), Limassol, Cyprus, 2017, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2017.7968226
    9. Specification and Verification of Security in Reconfigurable Scan Networks. Michael A. Kochte; Matthias Sauer; Laura Rodríguez Gómez; Pascal Raiola; Bernd Becker and Hans-Joachim Wunderlich. In Proceedings of the 22nd IEEE European Test Symposium (ETS’17), Limassol, Cyprus, 2017, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2017.7968247
    10. Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip. Gert Schley; Atefe Dalirsani; Marcus Eggenberger; Nadereh Hatami; Hans-Joachim Wunderlich and Martin Radetzki. IEEE Transactions on Computers 66, 5 (May 2017), pp. 848--861. DOI: https://doi.org/10.1109/TC.2016.2628058
    11. GPU-Accelerated Simulation of Small Delay Faults. Eric Schneider; Michael A. Kochte; Stefan Holst; Xiaoqing Wen and Hans-Joachim Wunderlich. IEEE Transactions on Computer-Aided Design of Integrated  Circuits and Systems (TCAD) 36, 5 (May 2017), pp. 829--841. DOI: https://doi.org/10.1109/TCAD.2016.2598560
    12. Special Session on Early Life Failures. Jyotirmoy Deshmukh; Wolfgang Kunz; Hans-Joachim Wunderlich and Sybille Hellebrand. In Proceedings of the 35th VLSI Test Symposium (VTS’17), Caesars Palace, Las Vegas, Nevada, USA, 2017. DOI: https://doi.org/10.1109/VTS.2017.7928933
    13. Aging Monitor Reuse for Small Delay Fault Testing. Chang Liu; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 35th VLSI Test Symposium (VTS’17), Caesars Palace, Las Vegas, Nevada, USA, 2017, pp. 1--6. DOI: https://doi.org/10.1109/VTS.2017.7928921
    14. Impact of BTI on dynamic and static power: From the physical to circuit level. H. Amrouch; S. Mishra; V. van Santen; S. Mahapatra and J. Henkel. In 017 IEEE International Reliability Physics Symposium (IRPS’17), 2017, pp. CR-3.1-CR-3.6.
    15. Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies). J. Henkel; S. Pagani; H. Amrouch; L. Bauer and F. Samie. In Design, Automation Test in Europe Conference Exhibition (DATE’17), 2017, pp. 954–959.
    16. Containing guardbands. H. Amrouch and J. Henkel. In 22nd Asia and South Pacific Design Automation Conference (ASP-DAC’17), 2017, pp. 537–542.
    17. Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors. Stefan Holst; Eric Schneider; Koshi Kawagoe; Michael A. Kochte; Kohei Miyase; Hans-Joachim Wunderlich; Seiji Kajihara and Xiaoqing Wen. In Proceedings of the IEEE International Test Conference (ITC’17), Fort Worth, Texas, USA, 2017, pp. 1--8. DOI: https://doi.org/10.1109/TEST.2017.8242055
    18. Analyzing the effects of peripheral circuit aging of embedded SRAM architectures. Josef Kinseher; Leonhard Heis and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 852--857. DOI: https://doi.org/10.23919/DATE.2017.7927106
    19. AutoFault: Towards Automatic Construction of Algebraic Fault Attacks. Jan Burchard; Mael Gay; Ange Salome Messeng Ekossono; Jan Horácek; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2017, Taipei, Taiwan, September 25, 2017, 2017, pp. 65--72. DOI: https://doi.org/10.1109/FDTC.2017.13
    20. Framework for quantifying and managing accuracy in stochastic circuit design. Florian Neugebauer; Ilia Polian and John P. Hayes. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 1--6. DOI: https://doi.org/10.23919/DATE.2017.7926949
    21. Introduction to hardware-oriented security for MPSoCs. Ilia Polian; Francesco Regazzoni and Johanna Sepúlveda. In 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017, 2017, pp. 102--107. DOI: https://doi.org/10.1109/SOCC.2017.8226017
    22. Special session: emerging (Un-)reliability based security threats and mitigations for embedded systems. H. Amrouch; P. Krishnamurthy; N. Patel; J. Henkel; R. Karri and F. Khorrami. In International Conference on Compilers, Architectures and Synthesis For Embedded Systems (CASES’17), 2017, pp. 1–10.
    23. Simultaneous In Situ Characterisation of Bubble Dynamics and a Spatially Resolved Concentration Profile: A Combined Mach--Zehnder Holography and Confocal Raman-Spectroscopy Sensor System. J. Guhathakurta; D. Schurr; G. Rinke; R. Dittmeyer and S. Simon. Journal of Sensors and Sensor Systems 6, 1 (2017), pp. 223–236.
    24. Securing the hardware of cyber-physical systems. Francesco Regazzoni and Ilia Polian. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 2017, pp. 194--199. DOI: https://doi.org/10.1109/ASPDAC.2017.7858319
    25. Hybrid instruction set simulation for fast and accurate memory access profiling. Manuel Strobel and Martin Radetzki. In 13th Workshop on Intelligent Solutions in Embedded Systems, WISES 2017, Hamburg, Germany, June 12-13, 2017, 2017, pp. 23--28. DOI: https://doi.org/10.1109/WISES.2017.7986927
    26. Low power memory allocation and mapping for area-constrained systems-on-chips. Manuel Strobel; Marcus Eggenberger and Martin Radetzki. EURASIP J. Emb. Sys. 2017, (2017), pp. 2. DOI: https://doi.org/10.1186/s13639-016-0039-5
    27. Contactless characterization of electric structures with simulation models based on CT data. C. Jauch; J. Denecke; J. Kuehnle; I. Effenberger; S. Kiess and S. Simon. In 7th Conference on Industrial Computed Tomography, 2017, pp. 1–7.
    28. Variational disparity estimation framework for plenoptic images. Trung-Hieu Tran; Zhe Wang and Sven Simon. In 2017 IEEE International Conference on Multimedia and Expo (ICME), 2017, pp. 1189–1194. DOI: https://doi.org/10.1109/ICME.2017.8019377
    29. Towards mixed structural-functional models for algebraic fault attacks on ciphers. Jan Burchard; Ange Salome Messeng Ekossono; Jan Horácek; Mael Gay; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In IEEE 2nd International Verification and Security Workshop, IVSW 2017, Thessaloniki, Greece, July 3-5, 2017, 2017, pp. 7--12. DOI: https://doi.org/10.1109/IVSW.2017.8031537
    30. Sensitized path PUF: A lightweight embedded physical unclonable function. Matthias Sauer; Pascal Raiola; Linus Feiten; Bernd Becker; Ulrich Rührmair and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 680--685. DOI: https://doi.org/10.23919/DATE.2017.7927076
    31. Counteracting malicious faults in cryptographic circuits. Ilia Polian and Francesco Regazzoni. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, 2017, pp. 1--10. DOI: https://doi.org/10.1109/ETS.2017.7968230
    32. Semi-symbolic operational computation for robust control system design. Leandro Gil and Martin Radetzki. In 22nd International Conference on Methods and Models in Automation and Robotics, MMAR 2017, Miedzyzdroje, Poland, August 28-31, 2017, 2017, pp. 779--784. DOI: https://doi.org/10.1109/MMAR.2017.8046927
    33. Hardware-based architecture for asymmetric numeral systems entropy decoder. Seyyed Mahdi Najmabadi; Harsimran Singh Tungal; Trung-Hieu Tran and Sven Simon. In 2017 Conference on Design and Architectures for Signal and Image Processing (DASIP), 2017, pp. 1–6. DOI: https://doi.org/10.1109/DASIP.2017.8122109
    34. Characterization of a Raman Spectroscopic and Holographic System for Gas-Liquid Flows in Microchannels. D. Schurr; J. Guhathakurta; S. Simon; G. Rinke and R. Dittmeyer. Chemical Engineering & Technology 40, 8 (2017), pp. 1400–1407.
    35. Architecture for parallel marker-free variable length streams decoding. Y. Baroud; J. M. M. Velarde; Z. Wang; S. Kieß; M. Najmabadi; J. Guhathakurta and S. Simon. Journal of Real-Time Image Processing (2017), pp. 1–20.
    36. A resource-efficient monitoring architecture for hardware accelerated self-adaptive online data stream compression. Seyyed Mahdi Najmabadi; Prajwala Pandit; Trung-Hieu Tran and Sven Simon. In 2017 Signal Processing: Algorithms, Architectures, Arrangements, and Applications (SPA), 2017, pp. 222–227. DOI: https://doi.org/10.23919/SPA.2017.8166868
    37. Light-field image compression based on variational disparity estimation and motion-compensated wavelet decomposition. Trung-Hieu Tran; Yousef Baroud; Zhe Wang; Sven Simon and David Taubman. In 2017 IEEE International Conference on Image Processing (ICIP), 2017, pp. 3260–3264. DOI: https://doi.org/10.1109/ICIP.2017.8296885
    38. Building a Better Random Number Generator for Stochastic Computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In Euromicro Conference on Digital System Design, DSD 2017, Vienna, Austria, August 30 - Sept. 1, 2017, 2017, pp. 1--8. DOI: https://doi.org/10.1109/DSD.2017.29
    39. Evaluating and Mitigating Degradation Effects in Multimedia Circuits. Hussam Amrouch and Jörg Henkel. In Proceedings of the 15th IEEE/ACM Symposium on Embedded Systems for Real-Time Multimedia (ESTIMedia’17), Seoul, Republic of Korea, 2017, pp. 61--67.
    40. Optimizing Temperature Guardbands. Hussam Amrouch; Behnam Khaleghi and Jörg Henkel. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’17), Lausanne, Switzerland, 2017, pp. 175--180.
    41. Analyzing the effect and Performance of Lossy Compression on Aeroacoustic Simulation of Gas Injector. M. Najmabadi; P. Offenhäuser; M. Hamann; J. Guhathakurta; F. Hempert; C. Glass and S. Simon. Journal Computation 5, 2 (2017), pp. 24.
    42. Interdependencies of Degradation Effects and Their Impact on Computing. H. Amrouch; V. M. van Santen and J. Henkel. IEEE Design and Test Magazine (DNT’17) 34, 3 (2017), pp. 59–67.
  5. 2016

    1. Designing reliable, yet energy-efficient guardbands. J. Henkel and H. Amrouch. In IEEE International Conference on Electronics, Circuits and Systems (ICECS’16), 2016, pp. 540–543.
    2. Autonomous Testing for 3D-ICs with IEEE Std. 1687. Jin-Cun Ye; Michael A. Kochte; Kuen-Jong Lee and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 215--220. DOI: https://doi.org/10.1109/ATS.2016.56
    3. Timing-Accurate Estimation of IR-Drop Impact on  Logic- and Clock-Paths During At-Speed Scan Test. Stefan Holst; Eric Schneider; Xiaoqing Wen; Seiji Kajihara; Yuta Yamato; Hans-Joachim Wunderlich and Michael A. Kochte. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 19--24. DOI: https://doi.org/10.1109/ATS.2016.49
    4. Functional Diagnosis for Graceful Degradation of NoC Switches. Atefe Dalirsani and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 246--251. DOI: https://doi.org/10.1109/ATS.2016.18
    5. Test Strategies for Reconfigurable Scan Networks. Michael A. Kochte; Rafal Baranowski; Marcel Schaal and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 113--118. DOI: https://doi.org/10.1109/ATS.2016.35
    6. A Neural-Network-Based Fault Classifier. Laura Rodríguez Gómez and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 144--149. DOI: https://doi.org/10.1109/ATS.2016.46
    7. High-Throughput Transistor-Level Fault Simulation on GPUs. Eric Schneider and Hans-Joachim Wunderlich. In Proceedings of the 25th IEEE Asian Test Symposium (ATS’16), Hiroshima, Japan, 2016, pp. 150--155. DOI: https://doi.org/10.1109/ATS.2016.9
    8. Accuracy of 3D position measurement of spherical objects with a holographic single camera setup. J. Guhathakurta; W. Li and S. Simon. N“urnberg, Germany, 2016, pp. 431–437.
    9. Hardware/Software Co-Characterization for Approximate Computing. Alexander Schöll; Claus Braun and Hans-Joachim Wunderlich. In Workshop on Approximate Computing, Pittsburgh, Pennsylvania, USA, 2016.
    10. Power and thermal management in massive multicore chips: Theoretical foundation meets architectural innovation and resource allocation. P. Bogdan; P. P. Pande; H. Amrouch; M. Shafique and J. Henkel. In 2016 International Conference on Compliers, Architectures, and Sythesis  of Embedded Systems (CASES’16), 2016, pp. 1–2.
    11. Applying Efficient Fault Tolerance to Enable the Preconditioned  Conjugate Gradient Solver on Approximate Computing Hardware. Alexander Schöll; Claus Braun and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’16), University of Connecticut, USA, 2016, pp. 21–26. DOI: https://doi.org/10.1109/DFT.2016.7684063
    12. Stress-aware routing to mitigate aging effects in SRAM-based FPGAs. B. Khaleghi; B. Omidi; H. Amrouch; J. Henkel and H. Asadi. In 26th International Conference on Field Programmable Logic and Applications (FPL’16), 2016, pp. 1–8.
    13. Pushing the Limits: How Fault Tolerance Extends the Scope of Approximate  Computing. Hans-Joachim Wunderlich; Claus Braun and Alexander Schöll. In Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS’16), Sant Feliu de Guixols, Catalunya, Spain, 2016, pp. 133--136. DOI: https://doi.org/10.1109/IOLTS.2016.7604686
    14. position measurement of spherical objects with a holographic single camera setup. J. Guhathakurta; D. Schurr; R. Rinke and 3d S. Simon: FERMAT-DFG SPP1740 (June 2016), pp. 6–8.
    15. SHIVA: Sichere Hardware in der Informationsverarbeitung. Michael A. Kochte; Matthias Sauer; Pascal Raiola; Bernd Becker and Hans-Joachim Wunderlich. In Proceedings of the ITG/GI/GMM edaWorkshop 2016, Hannover, Germany, 2016.
    16. Local concentration measurements in the wake of bubbles based on in-situ Raman spectroscopy and statistical analysis. D. Schurr; J. Guhathakurta; Y. Baroud; S. Simon; G. Rinke and R. Dittmeyer. In 9th International Conference on Multiphase Flow (ICMF 2016), Full Paper, Florence , Italy, 2016, pp. 22–27.
    17. Fault Tolerance of Approximate Compute Algorithms. Hans-Joachim Wunderlich; Claus Braun and Alexander Schöll. In Proceedings of the 34th VLSI Test Symposium (VTS’16), Caesars Palace, Las Vegas, Nevada, USA, 2016. DOI: https://doi.org/10.1109/VTS.2016.7477307
    18. Aging-aware voltage scaling. V. M. van Santen; H. Amrouch; N. Parihar; S. Mahapatra and J. Henkel. In 2016 Design, Automation Test in Europe Conference Exhibition (DATE’16), 2016, pp. 576–581.
    19. Efficient Algorithm-Based Fault Tolerance for Sparse Matrix Operations. Alexander Schöll; Claus Braun; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN’16), Toulouse, France, 2016, pp. 251--262. DOI: https://doi.org/10.1109/DSN.2016.31
    20. Detection Performance of MIMO Unique Word OFDM. Victor Tomashevich and Ilia Polian. In WSA 2016, 20th International ITG Workshop on Smart Antennas, Munich, Germany, 9-11 March 2016., 2016, pp. 1--8.
    21. PHAETON: A SAT-Based Framework for Timing-Aware Path Sensitization. Matthias Sauer; Bernd Becker and Ilia Polian. IEEE Trans. Computers 65, 6 (2016), pp. 1869--1881. DOI: https://doi.org/10.1109/TC.2015.2458869
    22. Reconfigurable fault tolerant routing for networks-on-chip with logical hierarchy. Gert Schley; Ibrahim Ahmed; Muhammad Afzal and Martin Radetzki. Computers & Electrical Engineering 51, (2016), pp. 195--206. DOI: https://doi.org/10.1016/j.compeleceng.2016.02.013
    23. Globally Asynchronous Locally Synchronous Simulation of NoCs on Many-Core Architectures. Marcus Eggenberger; Manuel Strobel and Martin Radetzki. In 24th Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2016, Heraklion, Crete, Greece, February 17-19, 2016, 2016, pp. 763--770. DOI: https://doi.org/10.1109/PDP.2016.118
    24. Memory error resilient detection for massive MIMO systems. Victor Tomashevich and Ilia Polian. In 24th European Signal Processing Conference, EUSIPCO 2016, Budapest, Hungary, August 29 - September 2, 2016, 2016, pp. 1623--1627. DOI: https://doi.org/10.1109/EUSIPCO.2016.7760523
    25. Designing guardbands for instantaneous aging effects. V. M. van Santen; H. Amrouch; J. Martin-Martinez; M. Nafria and J. Henkel. In 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC’16), 2016, pp. 1–6, redHiPEAC Paper Award.
    26. Light scattering microscopy measurements of single nuclei compared with GPU-accelerated FDTD simulations. J. Stark; T. Rothe; S. Kieß; S. Simon and A. Kienle. Physics in Medicine and Biology 61, 7 (2016), pp. 2749–2761.
    27. Architecture for Parallelizing Decoding of Marker-Free Variable Length Code Streams. Y. Baroud; J. M. M. Velarde and S. Simon. IEEE SPA (2016), pp. 270–275.
    28. Real-time compression of high-bandwidth measurement data of thermographic cameras with high temporal and spatial resolution. Z. Wang; M. Najmabadi; Y. Baroud; M. Wachs; G. Dammass and S. Simon. NDT ISSN 1435-4934 (2016), pp. 902–909.
    29. CAD model reconstruction for electromagnetic field simulations by using computed tomography scans. J. Hillebrand; S. Kieß; K. Sun and S. Simon. Dimensional X-ray Computed Tomography Conference, NPL, UK.2016.
    30. Improving SRAM test quality by leveraging self-timed circuits. Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian and Andreas Leininger. In 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016, 2016, pp. 984--989.
    31. Orthogonal signal modeling and operational computation of AMS circuits for fast and accurate system simulation. Leandro Gil and Martin Radetzki. In 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016, 2016, pp. 499--504.
    32. Failure mechanisms and test methods for the SRAM TVC write-assist technique. Josef Kinseher; Moritz Völker; Leonardo Bonet Zordan and Ilia Polian. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016, 2016, pp. 1--2. DOI: https://doi.org/10.1109/ETS.2016.7519324
    33. Reliability-aware design to suppress aging. H. Amrouch; B. Khaleghi; A. Gerstlauer and J. Henkel. In 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC’16), 2016, pp. 1–6, redHiPEAC Paper Award.
    34. A self-adaptive dynamic partial reconfigurable architecture for online data stream compression. Seyyed Mahdi Najmabadi; Zhe Wang; Yousef Baroud and Sven Simon. In 2016 International Conference on FPGA Reconfiguration for General-Purpose Computing (FPGA4GPC), 2016, pp. 19–24. DOI: https://doi.org/10.1109/FPGA4GPC.2016.7518529
    35. On Optimal Power-Aware Path Sensitization. Matthias Sauer; Jie Jiang; Sven Reimer; Kohei Miyase; Xiaoqing Wen; Bernd Becker and Ilia Polian. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016, 2016, pp. 179--184. DOI: https://doi.org/10.1109/ATS.2016.63
    36. Hardware Security (Dagstuhl Seminar 16202). Osnat Keren; Ilia Polian and Mark M. Tehranipoor. Dagstuhl Reports 6, 5 (2016), pp. 72--93. DOI: https://doi.org/10.4230/DagRep.6.5.72
    37. Improving Mobile Gaming Performance Through Cooperative CPU-GPU Thermal Management. Alok Prakash; Hussam Amrouch; Muhammad Shafique; Tulika Mitra and Jörg Henkel. In 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC’16), Austin, Texas, 2016, pp. 47:1--47:6.
    38. Low Complexity Pixel Domain Perceptual Image Compression via Adaptive Down-Sampling. Zhe Wang and Sven Simon. In 2016 Data Compression Conference (DCC), 2016, pp. 636–636. DOI: https://doi.org/10.1109/DCC.2016.107
    39. Online Bandwidth Reduction Using Dynamic Partial Reconfiguration. Seyyed Mahdi Najmabadi; Zhe Wang; Yousef Baroud and Sven Simon. In 2016 IEEE 24th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM), 2016, pp. 168–171. DOI: https://doi.org/10.1109/FCCM.2016.49
    40. A Single-Cycle Parallel Multi-Slice Connected Components Analysis Hardware Architecture. M. Klaiber; D. Bailey and S. Simon. Journal of Real-Time Processing (2016), pp. 1–11.
    41. A Resource-Efficient Hardware Architecture for Connected Component Analysis. Michael J. Klaiber; Donald G. Bailey; Yousef O. Baroud and Sven Simon. IEEE Transactions on Circuits and Systems for Video Technology 26, 7 (2016), pp. 1334–1349. DOI: https://doi.org/10.1109/TCSVT.2015.2450371
    42. A Parallel Codec Architecture for Marker-free Variable Length Code Streams. Y. Baroud; N. Lê; Z. Wang; S. Kieß; S. M. Najmabadi and S. Simon. in Proceedings of the HiPEAC Workshop on Reconfigurable Computing (WRC) 10, (2016), pp. 1–7.
    43. Low complexity perceptual image coding by just-noticeable difference model based adaptive downsampling. Zhe Wang; Yousef Baroud; Seyyed Mahdi Najmabadi and Sven Simon. In 2016 Picture Coding Symposium (PCS), 2016, pp. 1–5. DOI: https://doi.org/10.1109/PCS.2016.7906359
  6. 2015

    1. Accurate QBF-based Test Pattern Generation in Presence of Unknown Values. Dominik Erb; Michael A. Kochte; Sven Reimer; Matthias Sauer; Hans-Joachim Wunderlich and Bernd Becker. IEEE Transactions on Computer-Aided Design of Integrated  Circuits and Systems (TCAD) 34, 12 (December 2015), pp. 2025--2038. DOI: https://doi.org/10.1109/TCAD.2015.2440315
    2. Reliability degradation in the scope of aging -- From physical to system level. H. Amrouch and J. Henkel. In 10th International Design Test Symposium (IDT’15), 2015, pp. 9–12.
    3. Intermittent and Transient Fault Diagnosis on Sparse Code Signatures. Michael Kochte; Atefe Dalirsani; Andrea Bernabei; Martin Omana; Cecilia Metra and Hans-Joachim Wunderlich. In Proceedings of the 24th IEEE Asian Test Symposium (ATS’15), Mumbai, India, 2015, pp. 157–162. DOI: https://doi.org/10.1109/ATS.2015.34
    4. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. Matthias Kampmann; Michael A. Kochte; Eric Schneider; Thomas Indlekofer; Sybille Hellebrand and Hans-Joachim Wunderlich. In Proceedings of the 24th IEEE Asian Test Symposium (ATS’15), Mumbai, India, 2015, pp. 109–114. DOI: https://doi.org/10.1109/ATS.2015.26
    5. Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. Koji Asada; Xiaoqing Wen; Stefan Holst; Kohei Miyase; Seiji Kajihara; Michael A. Kochte; Eric Schneider; Hans-Joachim Wunderlich and Jun Qian. In Proceedings of the 24th IEEE Asian Test Symposium (ATS’15), Mumbai, India, 2015, pp. 103–108. DOI: https://doi.org/10.1109/ATS.2015.25
    6. STRAP: Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable Architectures. Hongyan Zhang; Michael A. Kochte; Eric Schneider; Lars Bauer; Hans-Joachim Wunderlich and Jörg Henkel. In Proceedings of the 34th IEEE/ACM International Conference onComputer-Aided Design (ICCAD’15), Austin, Texas, USA, 2015, pp. 38–45.
    7. ABFT with Probabilistic Error Bounds for Approximate and Adaptive-Precision Computing Applications. Claus Braun and Hans-Joachim Wunderlich. In Workshop on Approximate Computing, Paderborn, Germany, 2015.
    8. Low-Overhead Fault-Tolerance for the Preconditioned Conjugate Gradient Solver. Alexander Schöll; Claus Braun; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI  and Nanotechnology Systems (DFT’15), Amherst, Massachusetts, USA, 2015, pp. 60–65. DOI: https://doi.org/10.1109/DFT.2015.7315136
    9. Multi-Layer Test and Diagnosis for Dependable NoCs. Hans-Joachim Wunderlich and Martin Radetzki. In Proceedings of the 9th IEEE/ACM International Symposium on Networks-on-Chip (NOCS’15), Vancouver, BC, Canada, 2015. DOI: https://doi.org/10.1145/2786572.2788708
    10. Efficient Observation Point Selection for Aging Monitoring. Chang Liu; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 21st IEEE International On-Line Testing Symposium (IOLTS’15), Elia, Halkidiki, Greece, 2015, pp. 176--181. DOI: https://doi.org/10.1109/IOLTS.2015.7229855
    11. Efficient On-Line Fault-Tolerance for the Preconditioned Conjugate  Gradient Method. Alexander Schöll; Claus Braun; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 21st IEEE International On-Line Testing Symposium (IOLTS’15), Elia, Halkidiki, Greece, 2015, pp. 95--100. DOI: https://doi.org/10.1109/IOLTS.2015.7229839
    12. Lucid infrared thermography of thermally-constrained processors. H. Amrouch and J. Henkel. In 2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED’15), 2015, pp. 347–352.
    13. Adaptive Multi-Layer Techniques for Increased System Dependability. Lars Bauer; Jörg Henkel; Andreas Herkersdorf; Michael A. Kochte; Johannes M. Kühn; Wolfgang Rosenstiel; Thomas Schweizer; Stefan Wallentowitz; Volker Wenzel; Thomas Wild; Hans-Joachim Wunderlich and Hongyan Zhang. it - Information Technology 57, 3 (June 2015), pp. 149--158. DOI: https://doi.org/10.1515/itit-2014-1082
    14. Fine-Grained Access Management in Reconfigurable Scan Networks. Rafal Baranowski; Michael A. Kochte and Hans-Joachim Wunderlich. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 34, 6 (June 2015), pp. 937--946. DOI: https://doi.org/10.1109/TCAD.2015.2391266
    15. High-Throughput Logic Timing Simulation on GPGPUs. Stefan Holst; Michael E. Imhof and Hans-Joachim Wunderlich. ACM Transactions on Design Automation of Electronic Systems (TODAES) 20, 3 (June 2015), pp. 37:1--37:21. DOI: https://doi.org/10.1145/2714564
    16. Connecting the physical and application level towards grasping aging effects. H. Amrouch; J. Martin-Martinez; V. M. van Santen; M. Moras; R. Rodriguez; M. Nafria and J. Henkel. In IEEE International Reliability Physics Symposium (IRPS’15), 2015, pp. 3D.1.1-3D.1.8.
    17. On-Line Prediction of NBTI-induced Aging Rates. Rafal Baranowski; Farshad Firouzi; Saman Kiamehr; Chang Liu; Mehdi Tahoori and Hans-Joachim Wunderlich. In Proceedings of the ACM/IEEE Conference onDesign, Automation and Test in Europe (DATE’15), Grenoble, France, 2015, pp. 589--592. DOI: https://doi.org/10.7873/DATE.2015.0940
    18. GPU-Accelerated Small Delay Fault Simulation. Eric Schneider; Stefan Holst; Michael A. Kochte; Xiaoqing Wen and Hans-Joachim Wunderlich. In Proceedings of the ACM/IEEE Conference onDesign, Automation and Test in Europe (DATE’15), Grenoble, France, 2015, pp. 1174--1179. DOI: https://doi.org/10.7873/DATE.2015.0077
    19. Hochbeschleunigte Simulation von Verzögerungsfehlern unter Prozessvariationen. Eric Schneider; Michael A. Kochte and Hans-Joachim Wunderlich. In 27th GI/GMM/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
    20. Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. Sybille Hellebrand; Thomas Indlekofer; Matthias Kampmann; Michael A. Kochte; Chang Liu and Hans-Joachim Wunderlich. In 27th GI/GMM/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
    21. Reconfigurable Scan Networks: Modeling, Verification, and  Optimal Pattern Generation. Rafal Baranowski; Michael A. Kochte and Hans-Joachim Wunderlich. ACM Transactions on Design Automation of Electronic Systems (TODAES) 20, 2 (February 2015), pp. 30:1--30:27. DOI: https://doi.org/10.1145/2699863
    22. A Fully Fault-Tolerant Representation of Quantum Circuits. Alexandru Paler; Ilia Polian; Kae Nemoto and Simon J. Devitt. In Reversible Computation - 7th International Conference, RC 2015,Grenoble, France, July 16-17, 2015, Proceedings, 2015, pp. 139--154. DOI: https://doi.org/10.1007/978-3-319-20860-2_9
    23. On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. Josef Kinseher; Leonardo Bonet Zordan and Ilia Polian. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015, 2015, pp. 61--66. DOI: https://doi.org/10.1109/ATS.2015.18
    24. Fault Tolerant Routing for Hierarchically Organized Networks-on-Chip. Gert Schley and Martin Radetzki. In 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2015, Turku, Finland, March 4-6, 2015, 2015, pp. 379--386. DOI: https://doi.org/10.1109/PDP.2015.36
    25. Optimal memory selection for low power embedded systems. Marcus Eggenberger and Martin Radetzki. In 12th International Workshop on Intelligent Solutions in Embedded Systems, WISES 2015, Ancona, Italy, October 29-30, 2015, 2015, pp. 11--16.
    26. Design automation challenges for scalable quantum architectures. Ilia Polian and Austin G. Fowler. In Proceedings of the 52nd Annual Design Automation Conference, San Francisco, CA, USA, June 7-11, 2015, 2015, pp. 61:1--61:6. DOI: https://doi.org/10.1145/2744769.2747921
    27. Fault-based attacks on the Bel-T block cipher family. Philipp Jovanovic and Ilia Polian. In Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, 2015, pp. 601--604.
    28. A High-Speed Process Monitoring System to Detect and Analyze Filaments and Droplet Collisions in Spray Processes in Real Time. M. Klaiber; S. Simon; J. Guhathakurta; W. Li; Z. Wang; A. Lampa and U. Fritsching. 13th Triennial Internat Conf. on Liquid Atomization and Spray Systems, Taiwan, ICLASS (2015), pp. 1–6.
    29. Formal Vulnerability Analysis of Security Components. Linus Feiten; Matthias Sauer; Tobias Schubert; Victor Tomashevich; Ilia Polian and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 34, 8 (2015), pp. 1358--1369. DOI: https://doi.org/10.1109/TCAD.2015.2448687
    30. Visually lossless image compression extension for JPEG based on just-noticeable distortion evaluation. Zhe Wang; Sven Simon; Yousef Baroud and Seyyed Mahdi Najmabadi. In 2015 International Conference on Systems, Signals and Image Processing (IWSSIP), 2015, pp. 237–240. DOI: https://doi.org/10.1109/IWSSIP.2015.7314220
    31. ’Computed Tomography Resolution Enhancement by Integrating High-Resolution 2D X-Ray Images into the CT reconstruction. S. Kieß; J. Guhathakurta; J. Hillebrand and S. Simon et al.: 2015, pp. 1–9.
    32. Signal Integrity Model Extraction Based on Computed Tomography Scans—Analysis of the Required Voxel Resolution. Jürgen Hillebrand; Steffen Kieß; Jajnabalkya Guhathakurta and Sven Simon. IEEE Transactions on Electromagnetic Compatibility 57, 4 (2015), pp. 847–857. DOI: https://doi.org/10.1109/TEMC.2015.2435995
    33. High throughput hardware architectures for asymmetric numeral systems entropy coding. Seyyed Mahdi Najmabadi; Zhe Wang; Yousef Baroud and Sven Simon. In 2015 9th International Symposium on Image and Signal Processing and Analysis (ISPA), 2015, pp. 256–259. DOI: https://doi.org/10.1109/ISPA.2015.7306068
  7. 2014

    1. Access Port Protection for Reconfigurable Scan Networks. Rafal Baranowski; Michael A. Kochte and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) 30, 6 (December 2014), pp. 711--723. DOI: https://doi.org/10.1007/s10836-014-5484-2
    2. On Covering Structural Defects in NoCs by Functional Tests. Atefe Dalirsani; Nadereh Hatami; Michael E. Imhof; Marcus Eggenberger; Gert Schley; Martin Radetzki and Hans-Joachim Wunderlich. In Proceedings of the 23rd IEEE Asian Test Symposium (ATS’14), Hangzhou, China, 2014, pp. 87--92. DOI: https://doi.org/10.1109/ATS.2014.27
    3. High Quality System Level Test and Diagnosis. Artur Jutman; Matteo Sonza Reorda and Hans-Joachim Wunderlich. In Proceedings of the 23rd IEEE Asian Test Symposium (ATS’14), Hangzhou, China, 2014, pp. 298--305. DOI: https://doi.org/10.1109/ATS.2014.62
    4. Data-Parallel Simulation for Fast and Accurate Timing Validation of CMOS Circuits. Eric Schneider; Stefan Holst; Xiaoqing Wen and Hans-Joachim Wunderlich. In Proceedings of the 33rd IEEE/ACM International Conferenceon Computer-Aided Design (ICCAD’14), San Jose, California, USA, 2014, pp. 17--23. DOI: https://doi.org/10.1109/ICCAD.2014.7001324
    5. Adaptive Parallel Simulation of a Two-Timescale-Model for Apoptotic Receptor-Clustering on GPUs. Alexander Schöll; Claus Braun; Markus Daub; Guido Schneider and Hans-Joachim Wunderlich. In Proceedings of the IEEE International Conference on Bioinformatics and Biomedicine(BIBM’14), Belfast, United Kingdom, 2014, pp. 424--431. DOI: https://doi.org/10.1109/BIBM.2014.6999195
    6. Towards interdependencies of aging mechanisms. H. Amrouch; V. M. van Santen; T. Ebi; V. Wenzel and J. Henkel. In 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD’14), 2014, pp. 478–485.
    7. Test Pattern Generation in Presence of Unknown Values Based on Restricted Symbolic Logic. Dominik Erb; Karsten Scheibler; Michael A. Kochte; Matthias Sauer; Hans-Joachim Wunderlich and Bernd Becker. In Proceedings of the  IEEE International Test Conference (ITC’14), Seattle, Washington, USA, 2014, pp. 1--10. DOI: https://doi.org/10.1109/TEST.2014.7035350
    8. FAST-BIST: Faster-than-At-Speed BIST Targeting Hidden Delay Defects. Sybille Hellebrand; Thomas Indlekofer; Matthias Kampmann; Michael A. Kochte; Chang Liu and Hans-Joachim Wunderlich. In Proceedings of the  IEEE International Test Conference (ITC’14), Seattle, Washington, USA, 2014, pp. 1--8. DOI: https://doi.org/10.1109/TEST.2014.7035360
    9. Adaptive Bayesian Diagnosis of Intermittent Faults. Laura Rodríguez Gómez; Alejandro Cook; Thomas Indlekofer; Sybille Hellebrand and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) 30, 5 (September 2014), pp. 527--540. DOI: https://doi.org/10.1007/s10836-014-5477-1
    10. Multi-Level Simulation of Non-Functional Properties by Piecewise Evaluation. Nadereh Hatami; Rafal Baranowski; Paolo Prinetto and Hans-Joachim Wunderlich. ACM Transactions on Design Automation of Electronic Systems (TODAES) 19, 4 (August 2014), pp. 37:1--37:21. DOI: https://doi.org/10.1145/2647955
    11. SAT-Based ATPG beyond Stuck-at Fault Testing. Sybille Hellebrand and Hans-Joachim Wunderlich. it - Information Technology 56, 4 (July 2014), pp. 165--172. DOI: https://doi.org/10.1515/itit-2013-1043
    12. Area-Efficient Synthesis of Fault-Secure NoC Switches. Atefe Dalirsani; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 20th  IEEE International On-Line Testing Symposium (IOLTS’14), Platja d’Aro, Catalunya, Spain, 2014, pp. 13--18. DOI: https://doi.org/10.1109/IOLTS.2014.6873662
    13. A-ABFT: Autonomous Algorithm-Based Fault Tolerance for Matrix Multiplications on Graphics Processing Units. Claus Braun; Sebastian Halder and Hans-Joachim Wunderlich. In Proceedings of the 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN’14), Atlanta, Georgia, USA, 2014, pp. 443--454. DOI: https://doi.org/10.1109/DSN.2014.48
    14. A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems. Duc A. Tran; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovich and Hans-Joachim Wunderlich. Journal of Electronic Testing: Theory and Applications (JETTA) 30, 4 (June 2014), pp. 401--413. DOI: https://doi.org/10.1007/s10836-014-5459-3
    15. GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems. Hongyan Zhang; Michael A. Kochte; Michael E. Imhof; Lars Bauer; Hans-Joachim Wunderlich and Jörg Henkel. In Proceedings of the 51st ACM/EDAC/IEEE Design Automation Conference (DAC’14), San Francisco, California, USA, 2014, pp. 1--6. DOI: https://doi.org/10.1145/2593069.2593146
    16. Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. Felix Reimann; Michael Glaß; Jürgen Teich; Alejandro Cook; Laura Rodríguez Gómez; Dominik Ull; Hans-Joachim Wunderlich; Ulrich Abelein and Piet Engelke. In Proceedings of the 51st ACM/IEEE Design Automation Conference (DAC’14), San Francisco, California, USA, 2014, pp. 1--9. DOI: https://doi.org/10.1145/2593069.2602971
    17. Exact Logic and Fault Simulation in Presence of Unknowns. Dominik Erb; Michael A. Kochte; Matthias Sauer; Stefan Hillebrecht; Tobias Schubert; Hans-Joachim Wunderlich and Bernd Becker. ACM Transactions on Design Automation of Electronic Systems (TODAES) 19, 3 (June 2014), pp. 28:1--28:17. DOI: https://doi.org/10.1145/2611760
    18. Incremental Computation of Delay Fault Detection Probability for Variation-Aware Test Generation. Marcus Wagner and Hans-Joachim Wunderlich. In Proceedings of the 19th IEEE European Test Symposium (ETS’14), Paderborn, Germany, 2014, pp. 81--86. DOI: https://doi.org/10.1109/ETS.2014.6847805
    19. Diagnosis of Multiple Faults with Highly Compacted Test Responses. Alejandro Cook and Hans-Joachim Wunderlich. In Proceedings of the 19th IEEE European Test Symposium (ETS’14), Paderborn, Germany, 2014, pp. 27--30. DOI: https://doi.org/10.1109/ETS.2014.6847796
    20. Variation-Aware Deterministic ATPG. Matthias Sauer; Ilia Polian; Michael E. Imhof; Abdullah Mumtaz; Eric Schneider; Alexander Czutro; Hans-Joachim Wunderlich and Bernd Becker. In Proceedings of the 19th IEEE European Test Symposium (ETS’14), Paderborn, Germany, 2014, pp. 87--92. DOI: https://doi.org/10.1109/ETS.2014.6847806
    21. Structural Software-Based Self-Test of Network-on-Chip. Atefe Dalirsani; Michael E. Imhof and Hans-Joachim Wunderlich. In Proceedings of the 32nd IEEE VLSI Test Symposium (VTS’14), Napa, California, USA, 2014. DOI: https://doi.org/10.1109/VTS.2014.6818754
    22. A-ABFT: Autonomous Algorithm-Based Fault Tolerance on GPUs. Claus Braun; Sebastian Halder and Hans-Joachim Wunderlich. In International Workshop on Dependable GPU Computing, in conjunction with the ACM/IEEE DATE’14 Conference, Dresden, Germany, 2014.
    23. Bit-Flipping Scan - A Unified Architecture for Fault Tolerance and Offline Test. Michael E. Imhof and Hans-Joachim Wunderlich. In Proceedings of the Design, Automation and Test in Europe (DATE’14), Dresden, Germany, 2014. DOI: https://doi.org/10.7873/DATE.2014.206
    24. Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures. Ulrich Abelein; Alejandro Cook; Piet Engelke; Michael Glaß; Felix Reimann; Laura Rodríguez Gómez; Thomas Russ; Jürgen Teich; Dominik Ull and Hans-Joachim Wunderlich. In Proceedings of the Design, Automation and Test in Europe (DATE’14), Dresden, Germany, 2014. DOI: https://doi.org/10.7873/DATE.2014.373
    25. Verifikation Rekonfigurierbarer Scan-Netze. Rafal Baranowski; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the 17. Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV’14), Böblingen, Germany, 2014, pp. 137--146.
    26. hevcDTM: Application-driven Dynamic Thermal Management for High Efficiency Video Coding. D. Palomino; M. Shafique; H. Amrouch; A. Susin and J. Henkel. In Design, Automation Test in Europe Conference Exhibition (DATE’14), 2014, pp. 1–4.
    27. mDTM: Multi-objective dynamic thermal management for on-chip systems. H. Khdr; T. Ebi; M. Shafique; H. Amrouch and J. H. Karlsruhe. In Design, Automation Test in Europe Conference Exhibition (DATE’14), 2014, pp. 1–6.
    28. Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience. Andreas Herkersdorf; Hananeh Aliee; Michael Engel; Michael Glaß; Christina Gimmler-Dumont; Jörg Henkel; Veit B. Kleeberger; Michael A. Kochte; Johannes M. Kühn; Daniel Mueller-Gritschneder; Sani R. Nassif; Holm Rauchfuss; Wolfgang Rosenstiel; Ulf Schlichtmann; Muhammad Shafique; Mehdi B. Tahoori; Jürgen Teich; Norbert Wehn; Christian Weis and Hans-Joachim Wunderlich. Elsevier Microelectronics Reliability Journal 54, 6--7 (2014), pp. 1066--1074. DOI: https://doi.org/10.1016/j.microrel.2013.12.012
    29. Asynchronous parallel simulation with transaction events. Bastian Haetzer and Martin Radetzki. In XIVth International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, SAMOS 2014, Agios Konstantinos, Samos, Greece, July 14-17, 2014, 2014, pp. 242--249. DOI: https://doi.org/10.1109/SAMOS.2014.6893217
    30. Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware. Raghavan Kumar; Philipp Jovanovic; Wayne P. Burleson and Ilia Polian. IACR Cryptology ePrint Archive 2014, (2014), pp. 783.
    31. Better-than-Worst-Case Timing Design with Latch Buffers on Short Paths. Ravi Kanth Uppu; Ravi Tej Uppu; Adit D. Singh and Ilia Polian. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 133--138. DOI: https://doi.org/10.1109/VLSID.2014.30
    32. A new architecture for minimum mean square error sorted QR decomposition for MIMO wireless communication systems. Victor Tomashevich; Christina Gimmler-Dumont; Christian Fesl; Norbert Wehn and Ilia Polian. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014, 2014, pp. 246--249. DOI: https://doi.org/10.1109/DDECS.2014.6868800
    33. Software-based Pauli tracking in fault-tolerant quantum circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014, 2014, pp. 1--4. DOI: https://doi.org/10.7873/DATE.2014.137
    34. RESI: Register-Embedded Self-Immunity for Reliability Enhancement. H. Amrouch; T. Ebi and J. Henkel. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’14) 33, 5 (2014), pp. 677–690.
    35. Detection conditions for errors in self-adaptive better-than-worst-case designs. Ilia Polian; Jie Jiang and Adit D. Singh. In 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2014.6847794
    36. Editorial introduction - Special issue on languages, models and model based design for embedded systems. Martin Radetzki and Axel Jantsch. Design Autom. for Emb. Sys. 18, 1–2 (2014), pp. 61--62. DOI: https://doi.org/10.1007/s10617-012-9094-x
    37. SystemC AMS power electronic modeling with ideal instantaneous switches. Leandro Gil and Martin Radetzki. In Proceedings of the 2014 Forum on Specification and Design Languages, FDL 2014, Munich, Germany, October 14-16, 2014, 2014, pp. 1--8. DOI: https://doi.org/10.1109/FDL.2014.7119365
    38. Guest Editorial. Ilia Polian and Mark Mohammad Tehranipoor. IET Computers & Digital Techniques 8, 6 (2014), pp. 237--238. DOI: https://doi.org/10.1049/iet-cdt.2014.0194
    39. Precise fault-injections using voltage and temperature manipulation for differential cryptanalysis. Raghavan Kumar; Philipp Jovanovic and Ilia Polian. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d’Aro, Girona, Spain, July 7-9, 2014, 2014, pp. 43--48. DOI: https://doi.org/10.1109/IOLTS.2014.6873670
    40. Protecting cryptographic hardware against malicious attacks by nonlinear robust codes. Victor Tomashevich; Yaara Neumeier; Raghavan Kumar; Osnat Keren and Ilia Polian. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, 2014, pp. 40--45. DOI: https://doi.org/10.1109/DFT.2014.6962084
    41. Test digitaler Schaltkreise. Stephan Eggersglüß; Görschwin Fey and Ilia Polian. De Gruyter Oldenbourg, Berlin, Boston.2014.
    42. Real-time Process Analysis System for the Pulsation Detection and Measurement in Spray Processes. M. Klaiber; A. Kleinhans; P. Stähle; V. Gaukel and S. Simon. In 26th Annual Conference on Liquid Atomization and Spray Systems, 2014, pp. 1–5.
    43. Hardware security and test: Friends or enemies? Ilia Polian. it - Information Technology 56, 4 (2014), pp. 192--202. DOI: https://doi.org/10.1515/itit-2013-1038
    44. Cross-Level Validation of Topological Quantum Circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Reversible Computation - 6th International Conference, RC 2014,Kyoto, Japan, July 10-11, 2014. Proceedings, 2014, pp. 189--200. DOI: https://doi.org/10.1007/978-3-319-08494-7_15
    45. Reliability analysis of MIMO channel preprocessing by fault injection. Victor Tomashevich; Christina Gimmler-Dumont; Norbert Wehn and Ilia Polian. In 2014 IEEE International Conference on Wireless for Space and Extreme Environments, WiSEE 2014, Noordwijk, Netherlands, October 30-31, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/WiSEE.2014.6973066
    46. Test und Diagnose. Hans-Joachim Wunderlich. In Taschenbuch Digitaltechnik (3. neu bearbeitete Auflage), Christian Siemers and Axel Sikora (eds.). Carl Hanser Verlag GmbH & Co. KG, 2014, pp. 262--285.
    47. A comparison of parallel systemc simulation approaches at RTL. Bastian Haetzer and Martin Radetzki. In Proceedings of the 2014 Forum on Specification and Design Languages, FDL 2014, Munich, Germany, October 14-16, 2014, 2014, pp. 1--8. DOI: https://doi.org/10.1109/FDL.2014.7119355
    48. SAT-Based Test Pattern Generation with Improved Dynamic Compaction. Alexander Czutro; Sudhakar M. Reddy; Ilia Polian and Bernd Becker. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 56--61. DOI: https://doi.org/10.1109/VLSID.2014.17
    49. Adaptive Dynamic On-chip Memory Management for FPGA-based reconfigurable architectures. Ghada Dessouky; Michael J. Klaiber; Donald G. Bailey and Sven Simon. In 2014 24th International Conference on Field Programmable Logic and Applications (FPL), 2014, pp. 1–8. DOI: https://doi.org/10.1109/FPL.2014.6927471