Publications

Publications of the Hardware Orientied Computer Science Chair

HOCOS - Publications

  1. 2020

    1. Synthesis of Fault-Tolerant Reconfigurable Scan Networks. Sebastian Brandhofer; Michael A. Kochte and Hans-Joachim Wunderlich. In to appear in Proceedings of the ACM/IEEE Conference on Design, Automation Test in Europe (DATE’20), Grenoble, France, 2020, pp. 1--6.

  2. 2019

    1. Automatic construction of fault attacks on cryptographic hardware implementations. Ilia Polian; Maël Gay; Tobias Paxian; Matthias Sauer and Bernd Becker. In Automated Methods in Cryptographic Fault Analysis, Jakub Breier; Xiaolu Hou and Shivam Bhasin (eds.). Springer International Publishing, Cham, 2019, pp. 151–170. DOI: https://doi.org/10.1007/978-3-030-11333-9_6
    2. Hardware-oriented security. Ilia Polian. it - Information Technology 61, 1 (2019), pp. 1--2. DOI: https://doi.org/10.1515/itit-2019-0008
    3. Constructive Side-Channel Analysis and Secure Design - 10th International Workshop, COSADE 2019, Darmstadt, Germany, April 3-5, 2019, Proceedings. Ilia Polian and Marc Stöttinger (Eds.). Springer.2019. DOI: https://doi.org/10.1007/978-3-030-16350-1
    4. On the maximum function in stochastic computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In Proceedings of the 16th ACM International Conference on Computing Frontiers, CF 2019, Alghero, Italy, April 30 - May 2, 2019., 2019, pp. 59--66. DOI: https://doi.org/10.1145/3310273.3323050

  3. 2018

    1. Quantum era challenges for classical computers. Francesco Regazzoni; Austin G. Fowler and Ilia Polian. In Proceedings of the 18th International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, Pythagorion, Greece, July 15-19, 2018., 2018, pp. 173--178. DOI: https://doi.org/10.1145/3229631.3264737
    2. Hardware-oriented Security in a Computer Science Curriculum. Ilia Polian and Mael Gay. In 12th European Workshop on Microelectronics Education, EWME 2018, Braunschweig, Germany, September 24-26, 2018, 2018, pp. 59--62. DOI: https://doi.org/10.1109/EWME.2018.8629483
    3. S-box-based random number generation for stochastic computing. Florian Neugebauer; Ilia Polian and John P. Hayes. Microprocessors and Microsystems - Embedded Hardware Design 61, (2018), pp. 316--326. DOI: https://doi.org/10.1016/j.micpro.2018.06.009
    4. Security-oriented Code-based Architectures for Mitigating Fault Attacks. Batya Karp; Mael Gay; Osnat Keren and Ilia Polian. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018, 2018, pp. 1--6. DOI: https://doi.org/10.1109/DCIS.2018.8681476
    5. Detection and Correction of Malicious and Natural Faults in Cryptographic Modules. Batya Karp; Maël Gay; Osnat Keren and Ilia Polian. In PROOFS 2018, 7th International Workshop on Security Proofs for Embedded Systems, colocated with CHES 2018, Amsterdam, The Netherlands, September 13, 2018, 2018, pp. 68--82.
    6. Security: the dark side of approximate computing? Francesco Regazzoni; Cesare Alippi and Ilia Polian. In Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018, 2018, pp. 44. DOI: https://doi.org/10.1145/3240765.3243497
    7. Test and Reliability Challenges for Approximate Circuitry. Ilia Polian. Embedded Systems Letters 10, 1 (2018), pp. 26--29. DOI: https://doi.org/10.1109/LES.2017.2754446
    8. Framework for Quantifying and Managing Accuracy in Stochastic Circuit Design. Florian Neugebauer; Ilia Polian and John P. Hayes. JETC 14, 2 (2018), pp. 31:1--31:21. DOI: https://doi.org/10.1145/3183345

Former HOCOS - Publications

  1. 2017

    1. Introduction to hardware-oriented security for MPSoCs. Ilia Polian; Francesco Regazzoni and Johanna Sepúlveda. In 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017, 2017, pp. 102--107. DOI: https://doi.org/10.1109/SOCC.2017.8226017
    2. Towards mixed structural-functional models for algebraic fault attacks on ciphers. Jan Burchard; Ange Salome Messeng Ekossono; Jan Horácek; Mael Gay; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In IEEE 2nd International Verification and Security Workshop, IVSW 2017, Thessaloniki, Greece, July 3-5, 2017, 2017, pp. 7--12. DOI: https://doi.org/10.1109/IVSW.2017.8031537
    3. Sensitized path PUF: A lightweight embedded physical unclonable function. Matthias Sauer; Pascal Raiola; Linus Feiten; Bernd Becker; Ulrich Rührmair and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 680--685. DOI: https://doi.org/10.23919/DATE.2017.7927076
    4. Framework for quantifying and managing accuracy in stochastic circuit design. Florian Neugebauer; Ilia Polian and John P. Hayes. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 1--6. DOI: https://doi.org/10.23919/DATE.2017.7926949
    5. AutoFault: Towards Automatic Construction of Algebraic Fault Attacks. Jan Burchard; Mael Gay; Ange Salome Messeng Ekossono; Jan Horácek; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2017, Taipei, Taiwan, September 25, 2017, 2017, pp. 65--72. DOI: https://doi.org/10.1109/FDTC.2017.13
    6. Securing the hardware of cyber-physical systems. Francesco Regazzoni and Ilia Polian. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 2017, pp. 194--199. DOI: https://doi.org/10.1109/ASPDAC.2017.7858319
    7. Building a Better Random Number Generator for Stochastic Computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In Euromicro Conference on Digital System Design, DSD 2017, Vienna, Austria, August 30 - Sept. 1, 2017, 2017, pp. 1--8. DOI: https://doi.org/10.1109/DSD.2017.29
    8. Counteracting malicious faults in cryptographic circuits. Ilia Polian and Francesco Regazzoni. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, 2017, pp. 1--10. DOI: https://doi.org/10.1109/ETS.2017.7968230
    9. Analyzing the effects of peripheral circuit aging of embedded SRAM architectures. Josef Kinseher; Leonhard Heis and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 852--857. DOI: https://doi.org/10.23919/DATE.2017.7927106
    10. Analyzing the effects of peripheral circuit aging of embedded SRAM architectures. Josef Kinseher; Leonhard Heis and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 852--857. DOI: https://doi.org/10.23919/DATE.2017.7927106
    11. AutoFault: Towards Automatic Construction of Algebraic Fault Attacks. Jan Burchard; Mael Gay; Ange Salome Messeng Ekossono; Jan Horácek; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2017, Taipei, Taiwan, September 25, 2017, 2017, pp. 65--72. DOI: https://doi.org/10.1109/FDTC.2017.13
    12. Framework for quantifying and managing accuracy in stochastic circuit design. Florian Neugebauer; Ilia Polian and John P. Hayes. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 1--6. DOI: https://doi.org/10.23919/DATE.2017.7926949
    13. Counteracting malicious faults in cryptographic circuits. Ilia Polian and Francesco Regazzoni. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, 2017, pp. 1--10. DOI: https://doi.org/10.1109/ETS.2017.7968230
    14. Building a Better Random Number Generator for Stochastic Computing. Florian Neugebauer; Ilia Polian and John P. Hayes. In Euromicro Conference on Digital System Design, DSD 2017, Vienna, Austria, August 30 - Sept. 1, 2017, 2017, pp. 1--8. DOI: https://doi.org/10.1109/DSD.2017.29
    15. Introduction to hardware-oriented security for MPSoCs. Ilia Polian; Francesco Regazzoni and Johanna Sepúlveda. In 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017, 2017, pp. 102--107. DOI: https://doi.org/10.1109/SOCC.2017.8226017
    16. Securing the hardware of cyber-physical systems. Francesco Regazzoni and Ilia Polian. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017, 2017, pp. 194--199. DOI: https://doi.org/10.1109/ASPDAC.2017.7858319
    17. Sensitized path PUF: A lightweight embedded physical unclonable function. Matthias Sauer; Pascal Raiola; Linus Feiten; Bernd Becker; Ulrich Rührmair and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, 2017, pp. 680--685. DOI: https://doi.org/10.23919/DATE.2017.7927076
    18. Towards mixed structural-functional models for algebraic fault attacks on ciphers. Jan Burchard; Ange Salome Messeng Ekossono; Jan Horácek; Mael Gay; Bernd Becker; Tobias Schubert; Martin Kreuzer and Ilia Polian. In IEEE 2nd International Verification and Security Workshop, IVSW 2017, Thessaloniki, Greece, July 3-5, 2017, 2017, pp. 7--12. DOI: https://doi.org/10.1109/IVSW.2017.8031537

  2. 2016

    1. Memory error resilient detection for massive MIMO systems. Victor Tomashevich and Ilia Polian. In 24th European Signal Processing Conference, EUSIPCO 2016, Budapest, Hungary, August 29 - September 2, 2016, 2016, pp. 1623--1627. DOI: https://doi.org/10.1109/EUSIPCO.2016.7760523
    2. Hardware Security (Dagstuhl Seminar 16202). Osnat Keren; Ilia Polian and Mark M. Tehranipoor. Dagstuhl Reports 6, 5 (2016), pp. 72--93. DOI: https://doi.org/10.4230/DagRep.6.5.72
    3. Improving SRAM test quality by leveraging self-timed circuits. Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian and Andreas Leininger. In 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016, 2016, pp. 984--989.
    4. On Optimal Power-Aware Path Sensitization. Matthias Sauer; Jie Jiang; Sven Reimer; Kohei Miyase; Xiaoqing Wen; Bernd Becker and Ilia Polian. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016, 2016, pp. 179--184. DOI: https://doi.org/10.1109/ATS.2016.63
    5. PHAETON: A SAT-Based Framework for Timing-Aware Path Sensitization. Matthias Sauer; Bernd Becker and Ilia Polian. IEEE Trans. Computers 65, 6 (2016), pp. 1869--1881. DOI: https://doi.org/10.1109/TC.2015.2458869
    6. Failure mechanisms and test methods for the SRAM TVC write-assist technique. Josef Kinseher; Moritz Völker; Leonardo Bonet Zordan and Ilia Polian. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016, 2016, pp. 1--2. DOI: https://doi.org/10.1109/ETS.2016.7519324
    7. Detection Performance of MIMO Unique Word OFDM. Victor Tomashevich and Ilia Polian. In WSA 2016, 20th International ITG Workshop on Smart Antennas, Munich, Germany, 9-11 March 2016., 2016, pp. 1--8.
    8. PHAETON: A SAT-Based Framework for Timing-Aware Path Sensitization. Matthias Sauer; Bernd Becker and Ilia Polian. IEEE Trans. Computers 65, 6 (2016), pp. 1869--1881. DOI: https://doi.org/10.1109/TC.2015.2458869
    9. Detection Performance of MIMO Unique Word OFDM. Victor Tomashevich and Ilia Polian. In WSA 2016, 20th International ITG Workshop on Smart Antennas, Munich, Germany, 9-11 March 2016., 2016, pp. 1--8.
    10. Improving SRAM test quality by leveraging self-timed circuits. Josef Kinseher; Leonardo Bonet Zordan; Ilia Polian and Andreas Leininger. In 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016, 2016, pp. 984--989.
    11. On Optimal Power-Aware Path Sensitization. Matthias Sauer; Jie Jiang; Sven Reimer; Kohei Miyase; Xiaoqing Wen; Bernd Becker and Ilia Polian. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016, 2016, pp. 179--184. DOI: https://doi.org/10.1109/ATS.2016.63
    12. Hardware Security (Dagstuhl Seminar 16202). Osnat Keren; Ilia Polian and Mark M. Tehranipoor. Dagstuhl Reports 6, 5 (2016), pp. 72--93. DOI: https://doi.org/10.4230/DagRep.6.5.72
    13. Memory error resilient detection for massive MIMO systems. Victor Tomashevich and Ilia Polian. In 24th European Signal Processing Conference, EUSIPCO 2016, Budapest, Hungary, August 29 - September 2, 2016, 2016, pp. 1623--1627. DOI: https://doi.org/10.1109/EUSIPCO.2016.7760523
    14. Failure mechanisms and test methods for the SRAM TVC write-assist technique. Josef Kinseher; Moritz Völker; Leonardo Bonet Zordan and Ilia Polian. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016, 2016, pp. 1--2. DOI: https://doi.org/10.1109/ETS.2016.7519324

  3. 2015

    1. On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. Josef Kinseher; Leonardo Bonet Zordan and Ilia Polian. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015, 2015, pp. 61--66. DOI: https://doi.org/10.1109/ATS.2015.18
    2. Design automation challenges for scalable quantum architectures. Ilia Polian and Austin G. Fowler. In Proceedings of the 52nd Annual Design Automation Conference, San Francisco, CA, USA, June 7-11, 2015, 2015, pp. 61:1--61:6. DOI: https://doi.org/10.1145/2744769.2747921
    3. Fault-based attacks on the Bel-T block cipher family. Philipp Jovanovic and Ilia Polian. In Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, 2015, pp. 601--604.
    4. Formal Vulnerability Analysis of Security Components. Linus Feiten; Matthias Sauer; Tobias Schubert; Victor Tomashevich; Ilia Polian and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 34, 8 (2015), pp. 1358--1369. DOI: https://doi.org/10.1109/TCAD.2015.2448687
    5. A Fully Fault-Tolerant Representation of Quantum Circuits. Alexandru Paler; Ilia Polian; Kae Nemoto and Simon J. Devitt. In Reversible Computation - 7th International Conference, RC 2015,Grenoble, France, July 16-17, 2015, Proceedings, 2015, pp. 139--154. DOI: https://doi.org/10.1007/978-3-319-20860-2_9
    6. A Fully Fault-Tolerant Representation of Quantum Circuits. Alexandru Paler; Ilia Polian; Kae Nemoto and Simon J. Devitt. In Reversible Computation - 7th International Conference, RC 2015,Grenoble, France, July 16-17, 2015, Proceedings, 2015, pp. 139--154. DOI: https://doi.org/10.1007/978-3-319-20860-2_9
    7. On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. Josef Kinseher; Leonardo Bonet Zordan and Ilia Polian. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015, 2015, pp. 61--66. DOI: https://doi.org/10.1109/ATS.2015.18
    8. Design automation challenges for scalable quantum architectures. Ilia Polian and Austin G. Fowler. In Proceedings of the 52nd Annual Design Automation Conference, San Francisco, CA, USA, June 7-11, 2015, 2015, pp. 61:1--61:6. DOI: https://doi.org/10.1145/2744769.2747921
    9. Formal Vulnerability Analysis of Security Components. Linus Feiten; Matthias Sauer; Tobias Schubert; Victor Tomashevich; Ilia Polian and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 34, 8 (2015), pp. 1358--1369. DOI: https://doi.org/10.1109/TCAD.2015.2448687
    10. Fault-based attacks on the Bel-T block cipher family. Philipp Jovanovic and Ilia Polian. In Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, 2015, pp. 601--604.

  4. 2014

    1. Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware. Raghavan Kumar; Philipp Jovanovic; Wayne P. Burleson and Ilia Polian. IACR Cryptology ePrint Archive 2014, (2014), pp. 783.
    2. Better-than-Worst-Case Timing Design with Latch Buffers on Short Paths. Ravi Kanth Uppu; Ravi Tej Uppu; Adit D. Singh and Ilia Polian. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 133--138. DOI: https://doi.org/10.1109/VLSID.2014.30
    3. Variation-aware deterministic ATPG. Matthias Sauer; Ilia Polian; Michael E. Imhof; Abdullah Mumtaz; Eric Schneider; Alexander Czutro; Hans-Joachim Wunderlich and Bernd Becker. In 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2014.6847806
    4. Hardware security and test: Friends or enemies? Ilia Polian. it - Information Technology 56, 4 (2014), pp. 192--202. DOI: https://doi.org/10.1515/itit-2013-1038
    5. Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware. Raghavan Kumar; Philipp Jovanovic; Wayne P. Burleson and Ilia Polian. In 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2014, Busan, South Korea, September 23, 2014, 2014, pp. 18--28. DOI: https://doi.org/10.1109/FDTC.2014.12
    6. Guest Editorial. Ilia Polian and Mark Mohammad Tehranipoor. IET Computers & Digital Techniques 8, 6 (2014), pp. 237--238. DOI: https://doi.org/10.1049/iet-cdt.2014.0194
    7. Cross-Level Validation of Topological Quantum Circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Reversible Computation - 6th International Conference, RC 2014,Kyoto, Japan, July 10-11, 2014. Proceedings, 2014, pp. 189--200. DOI: https://doi.org/10.1007/978-3-319-08494-7_15
    8. Reliability analysis of MIMO channel preprocessing by fault injection. Victor Tomashevich; Christina Gimmler-Dumont; Norbert Wehn and Ilia Polian. In 2014 IEEE International Conference on Wireless for Space and Extreme Environments, WiSEE 2014, Noordwijk, Netherlands, October 30-31, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/WiSEE.2014.6973066
    9. Precise fault-injections using voltage and temperature manipulation for differential cryptanalysis. Raghavan Kumar; Philipp Jovanovic and Ilia Polian. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d’Aro, Girona, Spain, July 7-9, 2014, 2014, pp. 43--48. DOI: https://doi.org/10.1109/IOLTS.2014.6873670
    10. SAT-Based Test Pattern Generation with Improved Dynamic Compaction. Alexander Czutro; Sudhakar M. Reddy; Ilia Polian and Bernd Becker. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 56--61. DOI: https://doi.org/10.1109/VLSID.2014.17
    11. Protecting cryptographic hardware against malicious attacks by nonlinear robust codes. Victor Tomashevich; Yaara Neumeier; Raghavan Kumar; Osnat Keren and Ilia Polian. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, 2014, pp. 40--45. DOI: https://doi.org/10.1109/DFT.2014.6962084
    12. Test digitaler Schaltkreise. Stephan Eggersglüß; Görschwin Fey and Ilia Polian. De Gruyter Oldenbourg, Berlin, Boston.2014.
    13. A new architecture for minimum mean square error sorted QR decomposition for MIMO wireless communication systems. Victor Tomashevich; Christina Gimmler-Dumont; Christian Fesl; Norbert Wehn and Ilia Polian. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014, 2014, pp. 246--249. DOI: https://doi.org/10.1109/DDECS.2014.6868800
    14. Software-based Pauli tracking in fault-tolerant quantum circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014, 2014, pp. 1--4. DOI: https://doi.org/10.7873/DATE.2014.137
    15. Precise Fault-Injections using Voltage and Temperature Manipulation for Differential Cryptanalysis. Raghavan Kumar; Philipp Jovanovic and Ilia Polian. IACR Cryptology ePrint Archive 2014, (2014), pp. 782.
    16. Detection conditions for errors in self-adaptive better-than-worst-case designs. Ilia Polian; Jie Jiang and Adit D. Singh. In 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2014.6847794
    17. Test digitaler Schaltkreise. Stephan Eggersglüß; Görschwin Fey and Ilia Polian. De Gruyter Oldenbourg, Berlin, Boston.2014.
    18. Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware. Raghavan Kumar; Philipp Jovanovic; Wayne P. Burleson and Ilia Polian. IACR Cryptology ePrint Archive 2014, (2014), pp. 783.
    19. Detection conditions for errors in self-adaptive better-than-worst-case designs. Ilia Polian; Jie Jiang and Adit D. Singh. In 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2014.6847794
    20. Software-based Pauli tracking in fault-tolerant quantum circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014, 2014, pp. 1--4. DOI: https://doi.org/10.7873/DATE.2014.137
    21. Cross-Level Validation of Topological Quantum Circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Reversible Computation - 6th International Conference, RC 2014,Kyoto, Japan, July 10-11, 2014. Proceedings, 2014, pp. 189--200. DOI: https://doi.org/10.1007/978-3-319-08494-7_15
    22. Reliability analysis of MIMO channel preprocessing by fault injection. Victor Tomashevich; Christina Gimmler-Dumont; Norbert Wehn and Ilia Polian. In 2014 IEEE International Conference on Wireless for Space and Extreme Environments, WiSEE 2014, Noordwijk, Netherlands, October 30-31, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/WiSEE.2014.6973066
    23. Precise Fault-Injections using Voltage and Temperature Manipulation for Differential Cryptanalysis. Raghavan Kumar; Philipp Jovanovic and Ilia Polian. IACR Cryptology ePrint Archive 2014, (2014), pp. 782.
    24. SAT-Based Test Pattern Generation with Improved Dynamic Compaction. Alexander Czutro; Sudhakar M. Reddy; Ilia Polian and Bernd Becker. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 56--61. DOI: https://doi.org/10.1109/VLSID.2014.17
    25. Protecting cryptographic hardware against malicious attacks by nonlinear robust codes. Victor Tomashevich; Yaara Neumeier; Raghavan Kumar; Osnat Keren and Ilia Polian. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014, 2014, pp. 40--45. DOI: https://doi.org/10.1109/DFT.2014.6962084
    26. A new architecture for minimum mean square error sorted QR decomposition for MIMO wireless communication systems. Victor Tomashevich; Christina Gimmler-Dumont; Christian Fesl; Norbert Wehn and Ilia Polian. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014, 2014, pp. 246--249. DOI: https://doi.org/10.1109/DDECS.2014.6868800
    27. Guest Editorial. Ilia Polian and Mark Mohammad Tehranipoor. IET Computers & Digital Techniques 8, 6 (2014), pp. 237--238. DOI: https://doi.org/10.1049/iet-cdt.2014.0194
    28. Better-than-Worst-Case Timing Design with Latch Buffers on Short Paths. Ravi Kanth Uppu; Ravi Tej Uppu; Adit D. Singh and Ilia Polian. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014, 2014, pp. 133--138. DOI: https://doi.org/10.1109/VLSID.2014.30
    29. Hardware security and test: Friends or enemies? Ilia Polian. it - Information Technology 56, 4 (2014), pp. 192--202. DOI: https://doi.org/10.1515/itit-2013-1038
    30. Variation-aware deterministic ATPG. Matthias Sauer; Ilia Polian; Michael E. Imhof; Abdullah Mumtaz; Eric Schneider; Alexander Czutro; Hans-Joachim Wunderlich and Bernd Becker. In 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014, 2014, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2014.6847806
    31. Precise fault-injections using voltage and temperature manipulation for differential cryptanalysis. Raghavan Kumar; Philipp Jovanovic and Ilia Polian. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d’Aro, Girona, Spain, July 7-9, 2014, 2014, pp. 43--48. DOI: https://doi.org/10.1109/IOLTS.2014.6873670
    32. Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware. Raghavan Kumar; Philipp Jovanovic; Wayne P. Burleson and Ilia Polian. In 2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2014, Busan, South Korea, September 23, 2014, 2014, pp. 18--28. DOI: https://doi.org/10.1109/FDTC.2014.12

  5. 2013

    1. MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. J. Jiang; M. Aparicio; Mariane Comte; Florence Aza\"ıs; Michel Renovell and Ilia Polian. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013, 2013, pp. 177--182. DOI: https://doi.org/10.1109/ATS.2013.41
    2. Fault-based attacks on cryptographic hardware. Ilia Polian and Martin Kreuzer. In 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013, 2013, pp. 12--17. DOI: https://doi.org/10.1109/DDECS.2013.6549781
    3. SAT-Based Analysis of Sensitizable Paths. Matthias Sauer; Alexander Czutro; Tobias Schubert; Stefan Hillebrecht; Ilia Polian and Bernd Becker. IEEE Design & Test 30, 4 (2013), pp. 81--88. DOI: https://doi.org/10.1109/MDT.2012.2230297
    4. Special session 12A: Hot topic counterfeit IC identification: How can test help? Ilia Polian and Mohammad Tehranipoor. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013, 2013, pp. 1. DOI: https://doi.org/10.1109/VTS.2013.6548944
    5. Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. M. Aparicio; Mariane Comte; Florence Aza\"ıs; Michel Renovell; J. Jiang; Ilia Polian and Bernd Becker. In 14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013, 2013, pp. 1--6. DOI: https://doi.org/10.1109/LATW.2013.6562657
    6. Approximate simulation of circuits with probabilistic behavior. Alexandru Paler; Josef Kinseher; Ilia Polian and John P. Hayes. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, 2013, pp. 95--100. DOI: https://doi.org/10.1109/DFT.2013.6653589
    7. Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths. Matthias Sauer; Sven Reimer; Tobias Schubert; Ilia Polian and Bernd Becker. In Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013, 2013, pp. 448--453. DOI: https://doi.org/10.7873/DATE.2013.100
    8. Provably optimal test cube generation using quantified boolean formula solving. Matthias Sauer; Sven Reimer; Ilia Polian; Tobias Schubert and Bernd Becker. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013, 2013, pp. 533--539. DOI: https://doi.org/10.1109/ASPDAC.2013.6509651
    9. Multi-Stage Fault Attacks on Block Ciphers. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. IACR Cryptology ePrint Archive 2013, (2013), pp. 778.
    10. Approximate simulation of circuits with probabilistic behavior. Alexandru Paler; Josef Kinseher; Ilia Polian and John P. Hayes. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013, 2013, pp. 95--100. DOI: https://doi.org/10.1109/DFT.2013.6653589
    11. MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. J. Jiang; M. Aparicio; Mariane Comte; Florence Aza\"ıs; Michel Renovell and Ilia Polian. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013, 2013, pp. 177--182. DOI: https://doi.org/10.1109/ATS.2013.41
    12. Provably optimal test cube generation using quantified boolean formula solving. Matthias Sauer; Sven Reimer; Ilia Polian; Tobias Schubert and Bernd Becker. In 18th Asia and South Pacific Design Automation Conference, ASP-DAC 2013, Yokohama, Japan, January 22-25, 2013, 2013, pp. 533--539. DOI: https://doi.org/10.1109/ASPDAC.2013.6509651
    13. SAT-Based Analysis of Sensitizable Paths. Matthias Sauer; Alexander Czutro; Tobias Schubert; Stefan Hillebrecht; Ilia Polian and Bernd Becker. IEEE Design & Test 30, 4 (2013), pp. 81--88. DOI: https://doi.org/10.1109/MDT.2012.2230297
    14. Fault-based attacks on cryptographic hardware. Ilia Polian and Martin Kreuzer. In 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013, 2013, pp. 12--17. DOI: https://doi.org/10.1109/DDECS.2013.6549781
    15. Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. M. Aparicio; Mariane Comte; Florence Aza\"ıs; Michel Renovell; J. Jiang; Ilia Polian and Bernd Becker. In 14th Latin American Test Workshop, LATW 2013, Cordoba, Argentina, 3-5 April, 2013, 2013, pp. 1--6. DOI: https://doi.org/10.1109/LATW.2013.6562657
    16. Multi-Stage Fault Attacks on Block Ciphers. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. IACR Cryptology ePrint Archive 2013, (2013), pp. 778.
    17. Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths. Matthias Sauer; Sven Reimer; Tobias Schubert; Ilia Polian and Bernd Becker. In Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013, 2013, pp. 448--453. DOI: https://doi.org/10.7873/DATE.2013.100
    18. Special session 12A: Hot topic counterfeit IC identification: How can test help? Ilia Polian and Mohammad Tehranipoor. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013, 2013, pp. 1. DOI: https://doi.org/10.1109/VTS.2013.6548944

  6. 2012

    1. A Fault Attack on the LED Block Cipher. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. In Constructive Side-Channel Analysis and Secure Design - Third InternationalWorkshop, COSADE 2012, Darmstadt, Germany, May 3-4, 2012. Proceedings, 2012, pp. 120--134. DOI: https://doi.org/10.1007/978-3-642-29912-4_10
    2. Session Summary I: Quantum informatics: Classical circuit synthesis, resource optimisation and benchmarking. Ilia Polian. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, 2012, pp. 49. DOI: https://doi.org/10.1109/ATS.2012.88
    3. Digital Tarnkappe: Stealth Technology for the Internet of Things: Symposium des Centre for Security and Society. Bernd Becker; Günter Müller and Ilia Polian. . 2012, pp. 139–149. DOI: https://doi.org/10.5771/9783845238098-139
    4. On the quality of test vectors for post-silicon characterization. Matthias Sauer; Alexander Czutro; Bernd Becker and Ilia Polian. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, 2012, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2012.6233027
    5. Small-delay-fault ATPG with waveform accuracy. Matthias Sauer; Alexander Czutro; Ilia Polian and Bernd Becker. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012, 2012, pp. 30--36. DOI: https://doi.org/10.1145/2429384.2429391
    6. SAT-ATPG using preferences for improved detection of complex defect mechanisms. Alexander Czutro; Matthias Sauer; Tobias Schubert; Ilia Polian and Bernd Becker. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012, 2012, pp. 170--175. DOI: https://doi.org/10.1109/VTS.2012.6231098
    7. Synthesis of topological quantum circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2012, Amsterdam, The Netherlands, July 4-6, 2012, 2012, pp. 181--187. DOI: https://doi.org/10.1145/2765491.2765524
    8. On the optimality of K longest path generation algorithm under memory constraints. Jie Jiang; Matthias Sauer; Alexander Czutro; Bernd Becker and Ilia Polian. In 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012, 2012, pp. 418--423. DOI: https://doi.org/10.1109/DATE.2012.6176507
    9. An Algebraic Fault Attack on the LED Block Cipher. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. IACR Cryptology ePrint Archive 2012, (2012), pp. 400.
    10. Detection and diagnosis of faulty quantum circuits. Alexandru Paler; Ilia Polian and John P. Hayes. In Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012, 2012, pp. 181--186. DOI: https://doi.org/10.1109/ASPDAC.2012.6164942
    11. \#SAT-based vulnerability analysis of security components - A case study. Linus Feiten; Matthias Sauer; Tobias Schubert; Alexander Czutro; Eberhard Böhl; Ilia Polian and Bernd Becker. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, 2012, pp. 49--54. DOI: https://doi.org/10.1109/DFT.2012.6378198
    12. Cross-level protection of circuits against faults and malicious attacks. Victor Tomashevich; Sudarshan Srinivasan; Fabian Foerg and Ilia Polian. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, 2012, pp. 150--155. DOI: https://doi.org/10.1109/IOLTS.2012.6313862
    13. Functional test of small-delay faults using SAT and Craig interpolation. Matthias Sauer; Stefan Kupferschmid; Alexander Czutro; Ilia Polian; Sudhakar M. Reddy and Bernd Becker. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, 2012, pp. 1--8. DOI: https://doi.org/10.1109/TEST.2012.6401550
    14. Variation-Aware Fault Grading. Alexander Czutro; Michael E. Imhof; J. Jiang; Abdullah Mumtaz; Matthias Sauer; Bernd Becker; Ilia Polian and Hans-Joachim Wunderlich. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, 2012, pp. 344--349. DOI: https://doi.org/10.1109/ATS.2012.14
    15. Multi-conditional SAT-ATPG for power-droop testing. Alexander Czutro; Matthias Sauer; Ilia Polian and Bernd Becker. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, 2012, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2012.6233026
    16. Digital Tarnkappe: Stealth Technology for the Internet of Things: Symposium des Centre for Security and Society. Bernd Becker; Günter Müller and Ilia Polian. . 2012, pp. 139–149. DOI: https://doi.org/10.5771/9783845238098-139
    17. Multi-conditional SAT-ATPG for power-droop testing. Alexander Czutro; Matthias Sauer; Ilia Polian and Bernd Becker. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, 2012, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2012.6233026
    18. \#SAT-based vulnerability analysis of security components - A case study. Linus Feiten; Matthias Sauer; Tobias Schubert; Alexander Czutro; Eberhard Böhl; Ilia Polian and Bernd Becker. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012, 2012, pp. 49--54. DOI: https://doi.org/10.1109/DFT.2012.6378198
    19. Functional test of small-delay faults using SAT and Craig interpolation. Matthias Sauer; Stefan Kupferschmid; Alexander Czutro; Ilia Polian; Sudhakar M. Reddy and Bernd Becker. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012, 2012, pp. 1--8. DOI: https://doi.org/10.1109/TEST.2012.6401550
    20. An Algebraic Fault Attack on the LED Block Cipher. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. IACR Cryptology ePrint Archive 2012, (2012), pp. 400.
    21. Synthesis of topological quantum circuits. Alexandru Paler; Simon J. Devitt; Kae Nemoto and Ilia Polian. In Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2012, Amsterdam, The Netherlands, July 4-6, 2012, 2012, pp. 181--187. DOI: https://doi.org/10.1145/2765491.2765524
    22. A Fault Attack on the LED Block Cipher. Philipp Jovanovic; Martin Kreuzer and Ilia Polian. In Constructive Side-Channel Analysis and Secure Design - Third InternationalWorkshop, COSADE 2012, Darmstadt, Germany, May 3-4, 2012. Proceedings, 2012, pp. 120--134. DOI: https://doi.org/10.1007/978-3-642-29912-4_10
    23. Detection and diagnosis of faulty quantum circuits. Alexandru Paler; Ilia Polian and John P. Hayes. In Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012, 2012, pp. 181--186. DOI: https://doi.org/10.1109/ASPDAC.2012.6164942
    24. Variation-Aware Fault Grading. Alexander Czutro; Michael E. Imhof; J. Jiang; Abdullah Mumtaz; Matthias Sauer; Bernd Becker; Ilia Polian and Hans-Joachim Wunderlich. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, 2012, pp. 344--349. DOI: https://doi.org/10.1109/ATS.2012.14
    25. On the optimality of K longest path generation algorithm under memory constraints. Jie Jiang; Matthias Sauer; Alexander Czutro; Bernd Becker and Ilia Polian. In 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012, 2012, pp. 418--423. DOI: https://doi.org/10.1109/DATE.2012.6176507
    26. Small-delay-fault ATPG with waveform accuracy. Matthias Sauer; Alexander Czutro; Ilia Polian and Bernd Becker. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012, 2012, pp. 30--36. DOI: https://doi.org/10.1145/2429384.2429391
    27. SAT-ATPG using preferences for improved detection of complex defect mechanisms. Alexander Czutro; Matthias Sauer; Tobias Schubert; Ilia Polian and Bernd Becker. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012, 2012, pp. 170--175. DOI: https://doi.org/10.1109/VTS.2012.6231098
    28. On the quality of test vectors for post-silicon characterization. Matthias Sauer; Alexander Czutro; Bernd Becker and Ilia Polian. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, 2012, pp. 1--6. DOI: https://doi.org/10.1109/ETS.2012.6233027
    29. Cross-level protection of circuits against faults and malicious attacks. Victor Tomashevich; Sudarshan Srinivasan; Fabian Foerg and Ilia Polian. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012, 2012, pp. 150--155. DOI: https://doi.org/10.1109/IOLTS.2012.6313862
    30. Session Summary I: Quantum informatics: Classical circuit synthesis, resource optimisation and benchmarking. Ilia Polian. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012, 2012, pp. 49. DOI: https://doi.org/10.1109/ATS.2012.88

  7. 2011

    1. Adaptive voltage over-scaling for resilient applications. Philipp Klaus Krause and Ilia Polian. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011, 2011, pp. 944--949. DOI: https://doi.org/10.1109/DATE.2011.5763153
    2. Towards Variation-Aware Test Methods. Ilia Polian; Bernd Becker; Sybille Hellebrand; Hans-Joachim Wunderlich and Peter C. Maxwell. In 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, 2011, pp. 219--225. DOI: https://doi.org/10.1109/ETS.2011.51
    3. SAT-based analysis of sensitisable paths. Matthias Sauer; Alexander Czutro; Tobias Schubert; Stefan Hillebrecht; Ilia Polian and Bernd Becker. In 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011, 2011, pp. 93--98. DOI: https://doi.org/10.1109/DDECS.2011.5783055
    4. Estimation of component criticality in early design steps. Matthias Sauer; Alejandro Czutro; Ilia Polian and Bernd Becker. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, 2011, pp. 104--110. DOI: https://doi.org/10.1109/IOLTS.2011.5993819
    5. Selective Hardening: Toward Cost-Effective Error Tolerance. Ilia Polian and John P. Hayes. IEEE Design & Test of Computers 28, 3 (2011), pp. 54--63. DOI: https://doi.org/10.1109/MDT.2010.120
    6. Variation-aware fault modeling. Fabian Hopsch; Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. SCIENCE CHINA Information Sciences 54, 9 (2011), pp. 1813--1826. DOI: https://doi.org/10.1007/s11432-011-4367-8
    7. Efficient SAT-Based Search for Longest Sensitisable Paths. Matthias Sauer; Jie Jiang; Alejandro Czutro; Ilia Polian and Bernd Becker. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011, 2011, pp. 108--113. DOI: https://doi.org/10.1109/ATS.2011.43
    8. Modeling and Mitigating Transient Errors in Logic Circuits. Ilia Polian; John P. Hayes; Sudhakar M. Reddy and Bernd Becker. IEEE Trans. Dependable Sec. Comput. 8, 4 (2011), pp. 537--547. DOI: https://doi.org/10.1109/TDSC.2010.26
    9. An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors. Matthias Sauer; Victor Tomashevich; Jörg Müller; Matthew D. T. Lewis; Andreas Spilla; Ilia Polian; Bernd Becker and Wolfram Burgard. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, 2011, pp. 182--185. DOI: https://doi.org/10.1109/IOLTS.2011.5993836
    10. Tomographic Testing and Validation of Probabilistic Circuits. Alexandru Paler; Armin Alaghi; Ilia Polian and John P. Hayes. In 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, 2011, pp. 63--68. DOI: https://doi.org/10.1109/ETS.2011.43
    11. Modeling and Mitigating Transient Errors in Logic Circuits. Ilia Polian; John P. Hayes; Sudhakar M. Reddy and Bernd Becker. IEEE Trans. Dependable Sec. Comput. 8, 4 (2011), pp. 537--547. DOI: https://doi.org/10.1109/TDSC.2010.26
    12. Selective Hardening: Toward Cost-Effective Error Tolerance. Ilia Polian and John P. Hayes. IEEE Design & Test of Computers 28, 3 (2011), pp. 54--63. DOI: https://doi.org/10.1109/MDT.2010.120
    13. An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors. Matthias Sauer; Victor Tomashevich; Jörg Müller; Matthew D. T. Lewis; Andreas Spilla; Ilia Polian; Bernd Becker and Wolfram Burgard. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, 2011, pp. 182--185. DOI: https://doi.org/10.1109/IOLTS.2011.5993836
    14. SAT-based analysis of sensitisable paths. Matthias Sauer; Alexander Czutro; Tobias Schubert; Stefan Hillebrecht; Ilia Polian and Bernd Becker. In 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011, 2011, pp. 93--98. DOI: https://doi.org/10.1109/DDECS.2011.5783055
    15. Adaptive voltage over-scaling for resilient applications. Philipp Klaus Krause and Ilia Polian. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011, 2011, pp. 944--949. DOI: https://doi.org/10.1109/DATE.2011.5763153
    16. Efficient SAT-Based Search for Longest Sensitisable Paths. Matthias Sauer; Jie Jiang; Alejandro Czutro; Ilia Polian and Bernd Becker. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011, 2011, pp. 108--113. DOI: https://doi.org/10.1109/ATS.2011.43
    17. Towards Variation-Aware Test Methods. Ilia Polian; Bernd Becker; Sybille Hellebrand; Hans-Joachim Wunderlich and Peter C. Maxwell. In 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, 2011, pp. 219--225. DOI: https://doi.org/10.1109/ETS.2011.51
    18. Estimation of component criticality in early design steps. Matthias Sauer; Alejandro Czutro; Ilia Polian and Bernd Becker. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece, 2011, pp. 104--110. DOI: https://doi.org/10.1109/IOLTS.2011.5993819
    19. Variation-aware fault modeling. Fabian Hopsch; Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. SCIENCE CHINA Information Sciences 54, 9 (2011), pp. 1813--1826. DOI: https://doi.org/10.1007/s11432-011-4367-8
    20. Tomographic Testing and Validation of Probabilistic Circuits. Alexandru Paler; Armin Alaghi; Ilia Polian and John P. Hayes. In 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, 2011, pp. 63--68. DOI: https://doi.org/10.1109/ETS.2011.43

  8. 2010

    1. Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28 - July 1, 2010., 2010, pp. 95--100. DOI: https://doi.org/10.1109/DSNW.2010.5542612
    2. Power Supply Noise: Causes, Effects, and Testing. Ilia Polian. J. Low Power Electronics 6, 2 (2010), pp. 326--338. DOI: https://doi.org/10.1166/jolpe.2010.1075
    3. Special session 4B: Panel low-power test and noise-aware test: Foes or friends? Ilia Polian. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA, 2010, pp. 130. DOI: https://doi.org/10.1109/VTS.2010.5469594
    4. Advanced modeling of faults in Reversible circuits. Ilia Polian and John P. Hayes. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010, 2010, pp. 376--381. DOI: https://doi.org/10.1109/EWDTS.2010.5742135
    5. Fault Models and Test Algorithms for Nanoscale Technologies (Fehlermodelle und Testalgorithmen für Nanoscale-Technologien). Ilia Polian and Bernd Becker. it - Information Technology 52, 4 (2010), pp. 189--194. DOI: https://doi.org/10.1524/itit.2010.0590
    6. Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Alejandro Czutro; Ilia Polian; Matthew D. T. Lewis; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. International Journal of Parallel Programming 38, 3–4 (2010), pp. 185--202. DOI: https://doi.org/10.1007/s10766-009-0124-7
    7. Variation-Aware Fault Modeling. Fabian Hopsch; Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China, 2010, pp. 87--93. DOI: https://doi.org/10.1109/ATS.2010.24
    8. Fault Modeling for Simulation and ATPG. Bernd Becker and Ilia Polian. In Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault. Springer Netherlands, Dordrecht, 2010, pp. 105--131. DOI: https://doi.org/10.1007/978-90-481-3282-9_4
    9. Fault Modeling for Simulation and ATPG. Bernd Becker and Ilia Polian. In Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault. Springer Netherlands, Dordrecht, 2010, pp. 105--131. DOI: https://doi.org/10.1007/978-90-481-3282-9_4
    10. Special session 4B: Panel low-power test and noise-aware test: Foes or friends? Ilia Polian. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA, 2010, pp. 130. DOI: https://doi.org/10.1109/VTS.2010.5469594
    11. Power Supply Noise: Causes, Effects, and Testing. Ilia Polian. J. Low Power Electronics 6, 2 (2010), pp. 326--338. DOI: https://doi.org/10.1166/jolpe.2010.1075
    12. Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28 - July 1, 2010., 2010, pp. 95--100. DOI: https://doi.org/10.1109/DSNW.2010.5542612
    13. Advanced modeling of faults in Reversible circuits. Ilia Polian and John P. Hayes. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010, 2010, pp. 376--381. DOI: https://doi.org/10.1109/EWDTS.2010.5742135
    14. Variation-Aware Fault Modeling. Fabian Hopsch; Bernd Becker; Sybille Hellebrand; Ilia Polian; Bernd Straube; Wolfgang Vermeiren and Hans-Joachim Wunderlich. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China, 2010, pp. 87--93. DOI: https://doi.org/10.1109/ATS.2010.24
    15. Fault Models and Test Algorithms for Nanoscale Technologies (Fehlermodelle und Testalgorithmen für Nanoscale-Technologien). Ilia Polian and Bernd Becker. it - Information Technology 52, 4 (2010), pp. 189--194. DOI: https://doi.org/10.1524/itit.2010.0590
    16. Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Alejandro Czutro; Ilia Polian; Matthew D. T. Lewis; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. International Journal of Parallel Programming 38, 3–4 (2010), pp. 185--202. DOI: https://doi.org/10.1007/s10766-009-0124-7

  9. 2009

    1. ATPG-based grading of strong fault-secureness. Marc Hunger; Sybille Hellebrand; Alejandro Czutro; Ilia Polian and Bernd Becker. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, 2009, pp. 269--274. DOI: https://doi.org/10.1109/IOLTS.2009.5196027
    2. Reducing temperature variability by routing heat pipes. Kunal P. Ganeshpure; Ilia Polian; Sandip Kundu and Bernd Becker. In Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, 2009, pp. 63--68. DOI: https://doi.org/10.1145/1531542.1531560
    3. TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. Alejandro Czutro; Ilia Polian; Matthew D. T. Lewis; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, 2009, pp. 227--232. DOI: https://doi.org/10.1109/VLSI.Design.2009.20
    4. Dynamic Compaction in SAT-Based ATPG. Alejandro Czutro; Ilia Polian; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan, 2009, pp. 187--190. DOI: https://doi.org/10.1109/ATS.2009.31
    5. Analysis and optimization of fault-tolerant embedded systems with hardened processors. Viacheslav Izosimov; Ilia Polian; Paul Pop; Petru Eles and Zebo Peng. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009, 2009, pp. 682--687. DOI: https://doi.org/10.1109/DATE.2009.5090752
    6. An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. Nicolas Houarche; Mariane Comte; Michel Renovell; Alejandro Czutro; Piet Engelke; Ilia Polian and Bernd Becker. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, 2009, pp. 21--26. DOI: https://doi.org/10.1109/VTS.2009.57
    7. SUPERB: Simulator utilizing parallel evaluation of resistive bridges. Piet Engelke; Bernd Becker; Michel Renovell; Jürgen Schlöffel; Bettina Braitling and Ilia Polian. ACM Trans. Design Autom. Electr. Syst. 14, 4 (2009), pp. 56:1--56:21. DOI: https://doi.org/10.1145/1562514.1596831
    8. SUPERB: Simulator utilizing parallel evaluation of resistive bridges. Piet Engelke; Bernd Becker; Michel Renovell; Jürgen Schlöffel; Bettina Braitling and Ilia Polian. ACM Trans. Design Autom. Electr. Syst. 14, 4 (2009), pp. 56:1--56:21. DOI: https://doi.org/10.1145/1562514.1596831
    9. ATPG-based grading of strong fault-secureness. Marc Hunger; Sybille Hellebrand; Alejandro Czutro; Ilia Polian and Bernd Becker. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, 2009, pp. 269--274. DOI: https://doi.org/10.1109/IOLTS.2009.5196027
    10. Analysis and optimization of fault-tolerant embedded systems with hardened processors. Viacheslav Izosimov; Ilia Polian; Paul Pop; Petru Eles and Zebo Peng. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009, 2009, pp. 682--687. DOI: https://doi.org/10.1109/DATE.2009.5090752
    11. Dynamic Compaction in SAT-Based ATPG. Alejandro Czutro; Ilia Polian; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan, 2009, pp. 187--190. DOI: https://doi.org/10.1109/ATS.2009.31
    12. An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. Nicolas Houarche; Mariane Comte; Michel Renovell; Alejandro Czutro; Piet Engelke; Ilia Polian and Bernd Becker. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA, 2009, pp. 21--26. DOI: https://doi.org/10.1109/VTS.2009.57
    13. Reducing temperature variability by routing heat pipes. Kunal P. Ganeshpure; Ilia Polian; Sandip Kundu and Bernd Becker. In Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, 2009, pp. 63--68. DOI: https://doi.org/10.1145/1531542.1531560
    14. TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. Alejandro Czutro; Ilia Polian; Matthew D. T. Lewis; Piet Engelke; Sudhakar M. Reddy and Bernd Becker. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, 2009, pp. 227--232. DOI: https://doi.org/10.1109/VLSI.Design.2009.20

  10. 2008

    1. Automatic Test Pattern Generation for Interconnect Open Defects. Stefan Spinner; Ilia Polian; Piet Engelke; Bernd Becker; Martin Keim and Wu-Tung Cheng. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, 2008, pp. 181--186. DOI: https://doi.org/10.1109/VTS.2008.30
    2. Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. Stefan Hillebrecht; Ilia Polian; Piet Engelke; Bernd Becker; Martin Keim and Wu-Tung Cheng. In 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008, pp. 1--10. DOI: https://doi.org/10.1109/TEST.2008.4700642
    3. Resistive Bridging Fault Simulation of Industrial Circuits. Piet Engelke; Ilia Polian; Jürgen Schlöffel and Bernd Becker. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, 2008, pp. 628--633. DOI: https://doi.org/10.1109/DATE.2008.4484747
    4. Diagnosis of Realistic Defects Based on the X-Fault Model. Ilia Polian; Kohei Miyase; Yusuke Nakamura; Seiji Kajihara; Piet Engelke; Bernd Becker; Stefan Spinner and Xiaoqing Wen. In Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, 2008, pp. 263--266. DOI: https://doi.org/10.1109/DDECS.2008.4538798
    5. Selective Hardening in Early Design Steps. Christian G. Zoellin; Hans-Joachim Wunderlich; Ilia Polian and Bernd Becker. In 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, 2008, pp. 185--190. DOI: https://doi.org/10.1109/ETS.2008.30
    6. On Reducing Circuit Malfunctions Caused by Soft Errors. Ilia Polian; Sudhakar M. Reddy; Irith Pomeranz; Xun Tang and Bernd Becker. In 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, 2008, pp. 245--253. DOI: https://doi.org/10.1109/DFT.2008.20
    7. Selective Hardening of NanoPLA Circuits. Ilia Polian and Wenjing Rao. In 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, 2008, pp. 263--271. DOI: https://doi.org/10.1109/DFT.2008.26
    8. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. Alejandro Czutro; Nicolas Houarche; Piet Engelke; Ilia Polian; Mariane Comte; Michel Renovell and Bernd Becker. In 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, 2008, pp. 113--118. DOI: https://doi.org/10.1109/ETS.2008.19
    9. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Piet Engelke; Ilia Polian; Michel Renovell; Sandip Kundu; Bharath Seshadri and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 27, 2 (2008), pp. 327--338. DOI: https://doi.org/10.1109/TCAD.2007.913382
    10. Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors. Ilia Polian; Sudhakar M. Reddy and Bernd Becker. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2008, 7-9 April 2008, Montpellier, France, 2008, pp. 257--262. DOI: https://doi.org/10.1109/ISVLSI.2008.22
    11. A study of cognitive resilience in a JPEG compressor. Damian Nowroth; Ilia Polian and Bernd Becker. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings, 2008, pp. 32--41. DOI: https://doi.org/10.1109/DSN.2008.4630068
    12. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. Alejandro Czutro; Nicolas Houarche; Piet Engelke; Ilia Polian; Mariane Comte; Michel Renovell and Bernd Becker. In 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, 2008, pp. 113--118. DOI: https://doi.org/10.1109/ETS.2008.19
    13. Diagnosis of Realistic Defects Based on the X-Fault Model. Ilia Polian; Kohei Miyase; Yusuke Nakamura; Seiji Kajihara; Piet Engelke; Bernd Becker; Stefan Spinner and Xiaoqing Wen. In Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, 2008, pp. 263--266. DOI: https://doi.org/10.1109/DDECS.2008.4538798
    14. Automatic Test Pattern Generation for Interconnect Open Defects. Stefan Spinner; Ilia Polian; Piet Engelke; Bernd Becker; Martin Keim and Wu-Tung Cheng. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, 2008, pp. 181--186. DOI: https://doi.org/10.1109/VTS.2008.30
    15. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Piet Engelke; Ilia Polian; Michel Renovell; Sandip Kundu; Bharath Seshadri and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 27, 2 (2008), pp. 327--338. DOI: https://doi.org/10.1109/TCAD.2007.913382
    16. On Reducing Circuit Malfunctions Caused by Soft Errors. Ilia Polian; Sudhakar M. Reddy; Irith Pomeranz; Xun Tang and Bernd Becker. In 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, 2008, pp. 245--253. DOI: https://doi.org/10.1109/DFT.2008.20
    17. Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors. Ilia Polian; Sudhakar M. Reddy and Bernd Becker. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2008, 7-9 April 2008, Montpellier, France, 2008, pp. 257--262. DOI: https://doi.org/10.1109/ISVLSI.2008.22
    18. Selective Hardening of NanoPLA Circuits. Ilia Polian and Wenjing Rao. In 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, 2008, pp. 263--271. DOI: https://doi.org/10.1109/DFT.2008.26
    19. Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. Stefan Hillebrecht; Ilia Polian; Piet Engelke; Bernd Becker; Martin Keim and Wu-Tung Cheng. In 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, 2008, pp. 1--10. DOI: https://doi.org/10.1109/TEST.2008.4700642
    20. A study of cognitive resilience in a JPEG compressor. Damian Nowroth; Ilia Polian and Bernd Becker. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings, 2008, pp. 32--41. DOI: https://doi.org/10.1109/DSN.2008.4630068
    21. Selective Hardening in Early Design Steps. Christian G. Zoellin; Hans-Joachim Wunderlich; Ilia Polian and Bernd Becker. In 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, 2008, pp. 185--190. DOI: https://doi.org/10.1109/ETS.2008.30
    22. Resistive Bridging Fault Simulation of Industrial Circuits. Piet Engelke; Ilia Polian; Jürgen Schlöffel and Bernd Becker. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, 2008, pp. 628--633. DOI: https://doi.org/10.1109/DATE.2008.4484747

  11. 2007

    1. Evolutionary Optimization in Code-Based Test Compression. Ilia Polian; Alejandro Czutro and Bernd Becker. CoRR abs/0710.4670, (2007).
    2. Power Droop Testing. Ilia Polian; Alejandro Czutro; Sandip Kundu and Bernd Becker. IEEE Design & Test of Computers 24, 3 (2007), pp. 276--284. DOI: https://doi.org/10.1109/MDT.2007.77
    3. Identification of Critical Errors in Imaging Applications. Ilia Polian; Damian Nowroth and Bernd Becker. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, 2007, pp. 201--202. DOI: https://doi.org/10.1109/IOLTS.2007.38
    4. An Analysis Framework for Transient-Error Tolerance. John P. Hayes; Ilia Polian and Bernd Becker. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, 2007, pp. 249--255. DOI: https://doi.org/10.1109/VTS.2007.13
    5. Functional Constraints vs. Test Compression in Scan-Based Delay Testing. Ilia Polian and Hideo Fujiwara. J. Electronic Testing 23, 5 (2007), pp. 445--455. DOI: https://doi.org/10.1007/s10836-007-5013-7
    6. Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors. Stefan Spinner; J. Bartholomeyczik; Bernd Becker; M. Doelle; Oliver Paul; Ilia Polian; R. Roth; K. Seitz and Patrick Ruther. CoRR abs/0711.3289, (2007).
    7. Power Droop Testing. Ilia Polian; Alejandro Czutro; Sandip Kundu and Bernd Becker. IEEE Design & Test of Computers 24, 3 (2007), pp. 276--284. DOI: https://doi.org/10.1109/MDT.2007.77
    8. Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors. Stefan Spinner; J. Bartholomeyczik; Bernd Becker; M. Doelle; Oliver Paul; Ilia Polian; R. Roth; K. Seitz and Patrick Ruther. CoRR abs/0711.3289, (2007).
    9. An Analysis Framework for Transient-Error Tolerance. John P. Hayes; Ilia Polian and Bernd Becker. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, 2007, pp. 249--255. DOI: https://doi.org/10.1109/VTS.2007.13
    10. Functional Constraints vs. Test Compression in Scan-Based Delay Testing. Ilia Polian and Hideo Fujiwara. J. Electronic Testing 23, 5 (2007), pp. 445--455. DOI: https://doi.org/10.1007/s10836-007-5013-7
    11. Identification of Critical Errors in Imaging Applications. Ilia Polian; Damian Nowroth and Bernd Becker. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, 2007, pp. 201--202. DOI: https://doi.org/10.1109/IOLTS.2007.38
    12. Evolutionary Optimization in Code-Based Test Compression. Ilia Polian; Alejandro Czutro and Bernd Becker. CoRR abs/0710.4670, (2007).

  12. 2006

    1. Power Droop Testing. Ilia Polian; Alejandro Czutro; Sandip Kundu and Bernd Becker. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA, 2006, pp. 243--250. DOI: https://doi.org/10.1109/ICCD.2006.4380824
    2. Functional constraints vs. test compression in scan-based delay testing. Ilia Polian and Hideo Fujiwara. In Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, 2006, pp. 1039--1044. DOI: https://doi.org/10.1109/DATE.2006.243927
    3. Low-Cost Hardening of Image Processing Applications Against Soft Errors. Ilia Polian; Bernd Becker; Masato Nakasato; Satoshi Ohtake and Hideo Fujiwara. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, 2006, pp. 274--279. DOI: https://doi.org/10.1109/DFT.2006.40
    4. A Definition and Classification of Timing Anomalies. Jan Reineke; Björn Wachter; Stephan Thesing; Reinhard Wilhelm; Ilia Polian; Jochen Eisinger and Bernd Becker. In 6th Intl. Workshop on Worst-Case Execution Time (WCET) Analysis, July 4, 2006, Dresden, Germany, 2006.
    5. An Improved Technique for Reducing False Alarms Due to Soft Errors. Sandip Kundu and Ilia Polian. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, 2006, pp. 105--110. DOI: https://doi.org/10.1109/IOLTS.2006.10
    6. X-masking during logic BIST and its impact on defect coverage. Yuyi Tang; Hans-Joachim Wunderlich; Piet Engelke; Ilia Polian; Bernd Becker; Jürgen Schlöffel; Friedrich Hapke and Michael Wittke. IEEE Trans. VLSI Syst. 14, 2 (2006), pp. 193--202. DOI: https://doi.org/10.1109/TVLSI.2005.863742
    7. Automatic Test Pattern Generation for Resistive Bridging Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. J. Electronic Testing 22, 1 (2006), pp. 61--69. DOI: https://doi.org/10.1007/s10836-006-6392-x
    8. Simulating Resistive-Bridging and Stuck-At Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 25, 10 (2006), pp. 2181--2192. DOI: https://doi.org/10.1109/TCAD.2006.871626
    9. Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. Jochen Eisinger; Ilia Polian; Bernd Becker; Alexander Metzner; Stephan Thesing and Reinhard Wilhelm. In Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006, 2006, pp. 15--20. DOI: https://doi.org/10.1109/DDECS.2006.1649563
    10. Power Droop Testing. Ilia Polian; Alejandro Czutro; Sandip Kundu and Bernd Becker. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA, 2006, pp. 243--250. DOI: https://doi.org/10.1109/ICCD.2006.4380824
    11. Simulating Resistive-Bridging and Stuck-At Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. IEEE Trans. on CAD of Integrated Circuits and Systems 25, 10 (2006), pp. 2181--2192. DOI: https://doi.org/10.1109/TCAD.2006.871626
    12. X-masking during logic BIST and its impact on defect coverage. Yuyi Tang; Hans-Joachim Wunderlich; Piet Engelke; Ilia Polian; Bernd Becker; Jürgen Schlöffel; Friedrich Hapke and Michael Wittke. IEEE Trans. VLSI Syst. 14, 2 (2006), pp. 193--202. DOI: https://doi.org/10.1109/TVLSI.2005.863742
    13. Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. Jochen Eisinger; Ilia Polian; Bernd Becker; Alexander Metzner; Stephan Thesing and Reinhard Wilhelm. In Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006, 2006, pp. 15--20. DOI: https://doi.org/10.1109/DDECS.2006.1649563
    14. Functional constraints vs. test compression in scan-based delay testing. Ilia Polian and Hideo Fujiwara. In Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, 2006, pp. 1039--1044. DOI: https://doi.org/10.1109/DATE.2006.243927
    15. A Definition and Classification of Timing Anomalies. Jan Reineke; Björn Wachter; Stephan Thesing; Reinhard Wilhelm; Ilia Polian; Jochen Eisinger and Bernd Becker. In 6th Intl. Workshop on Worst-Case Execution Time (WCET) Analysis, July 4, 2006, Dresden, Germany, 2006.
    16. Low-Cost Hardening of Image Processing Applications Against Soft Errors. Ilia Polian; Bernd Becker; Masato Nakasato; Satoshi Ohtake and Hideo Fujiwara. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, 2006, pp. 274--279. DOI: https://doi.org/10.1109/DFT.2006.40
    17. An Improved Technique for Reducing False Alarms Due to Soft Errors. Sandip Kundu and Ilia Polian. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, 2006, pp. 105--110. DOI: https://doi.org/10.1109/IOLTS.2006.10
    18. Automatic Test Pattern Generation for Resistive Bridging Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. J. Electronic Testing 22, 1 (2006), pp. 61--69. DOI: https://doi.org/10.1007/s10836-006-6392-x

  13. 2005

    1. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Sandip Kundu; Piet Engelke; Ilia Polian and Bernd Becker. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, pp. 266--271. DOI: https://doi.org/10.1109/ATS.2005.83
    2. Transient fault characterization in dynamic noisy environments. Ilia Polian; John P. Hayes; Sandip Kundu and Bernd Becker. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, 2005, pp. 10. DOI: https://doi.org/10.1109/TEST.2005.1584070
    3. Evolutionary Optimization in Code-Based Test Compression. Ilia Polian; Alejandro Czutro and Bernd Becker. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, 2005, pp. 1124--1129. DOI: https://doi.org/10.1109/DATE.2005.144
    4. Nichtstandardfehlermodelle für digitale Logikschaltkreise: Simulation, prüfgerechter Entwurf, industrielle Anwendungen (On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications). Ilia Polian. it - Information Technology 47, 3 (2005), pp. 172--174. DOI: https://doi.org/10.1524/itit.47.3.172.65613
    5. A Family of Logical Fault Models for Reversible Circuits. Ilia Polian; Thomas Fiehn; Bernd Becker and John P. Hayes. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, pp. 422--427. DOI: https://doi.org/10.1109/ATS.2005.9
    6. Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. Ilia Polian; Sandip Kundu; Jean Marc Gallière; Piet Engelke; Michel Renovell and Bernd Becker. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, 2005, pp. 343--348. DOI: https://doi.org/10.1109/VTS.2005.72
    7. Modeling Feedback Bridging Faults with Non-Zero Resistance. Ilia Polian; Piet Engelke; Michel Renovell and Bernd Becker. J. Electronic Testing 21, 1 (2005), pp. 57--69. DOI: https://doi.org/10.1007/s10836-005-5287-6
    8. Modeling Feedback Bridging Faults with Non-Zero Resistance. Ilia Polian; Piet Engelke; Michel Renovell and Bernd Becker. J. Electronic Testing 21, 1 (2005), pp. 57--69. DOI: https://doi.org/10.1007/s10836-005-5287-6
    9. A Family of Logical Fault Models for Reversible Circuits. Ilia Polian; Thomas Fiehn; Bernd Becker and John P. Hayes. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, pp. 422--427. DOI: https://doi.org/10.1109/ATS.2005.9
    10. Evolutionary Optimization in Code-Based Test Compression. Ilia Polian; Alejandro Czutro and Bernd Becker. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, 2005, pp. 1124--1129. DOI: https://doi.org/10.1109/DATE.2005.144
    11. Nichtstandardfehlermodelle für digitale Logikschaltkreise: Simulation, prüfgerechter Entwurf, industrielle Anwendungen (On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications). Ilia Polian. it - Information Technology 47, 3 (2005), pp. 172--174. DOI: https://doi.org/10.1524/itit.47.3.172.65613
    12. Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. Ilia Polian; Sandip Kundu; Jean Marc Gallière; Piet Engelke; Michel Renovell and Bernd Becker. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, 2005, pp. 343--348. DOI: https://doi.org/10.1109/VTS.2005.72
    13. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Sandip Kundu; Piet Engelke; Ilia Polian and Bernd Becker. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, pp. 266--271. DOI: https://doi.org/10.1109/ATS.2005.83
    14. Transient fault characterization in dynamic noisy environments. Ilia Polian; John P. Hayes; Sandip Kundu and Bernd Becker. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, 2005, pp. 10. DOI: https://doi.org/10.1109/TEST.2005.1584070

  14. 2004

    1. X-Masking During Logic BIST and Its Impact on Defect Coverage. Yuyi Tang; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Piet Engelke; Ilia Polian and Bernd Becker. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, 2004, pp. 442--451. DOI: https://doi.org/10.1109/TEST.2004.1386980
    2. Testing for Missing-Gate Faults in Reversible Circuits. John P. Hayes; Ilia Polian and Bernd Becker. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, 2004, pp. 100--105. DOI: https://doi.org/10.1109/ATS.2004.84
    3. Automatic test pattern generation for resistive bridging faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. In 9th European Test Symposium, ETS 2004, Ajaccio, France, May 23-26, 2004, 2004, pp. 160--165. DOI: https://doi.org/10.1109/ETSYM.2004.1347652
    4. Scalable Delay Fault BIST for Use with Low-Cost ATE. Ilia Polian and Bernd Becker. J. Electronic Testing 20, 2 (2004), pp. 181--197. DOI: https://doi.org/10.1023/B:JETT.0000023681.25483.59
    5. On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications. Polian Ilia. In VDI Fortschritt-Berichte. VDI-Verlag, Düsseldorf, 2004, pp. 218.
    6. The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. Piet Engelke; Ilia Polian; Michel Renovell; Bharath Seshadri and Bernd Becker. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, 2004, pp. 171--178. DOI: https://doi.org/10.1109/VTEST.2004.1299240
    7. Bounded Model Checking and Inductive Verification of Hybrid Discrete-continuous Systems. Bernd Becker; Markus Behle; Friedrich Eisenbrand; Martin Fränzle; Marc Herbstritt; Christian Herde; Jörg Hoffmann; Daniel Kröning; Bernhard Nebel; Ilia Polian and Ralf Wimmer. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Kaiserslautern, Germany, February 24-25, 2004, 2004, pp. 65--75.
    8. On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications. Polian Ilia. In VDI Fortschritt-Berichte. VDI-Verlag, Düsseldorf, 2004, pp. 218.
    9. Bounded Model Checking and Inductive Verification of Hybrid Discrete-continuous Systems. Bernd Becker; Markus Behle; Friedrich Eisenbrand; Martin Fränzle; Marc Herbstritt; Christian Herde; Jörg Hoffmann; Daniel Kröning; Bernhard Nebel; Ilia Polian and Ralf Wimmer. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Kaiserslautern, Germany, February 24-25, 2004, 2004, pp. 65--75.
    10. Scalable Delay Fault BIST for Use with Low-Cost ATE. Ilia Polian and Bernd Becker. J. Electronic Testing 20, 2 (2004), pp. 181--197. DOI: https://doi.org/10.1023/B:JETT.0000023681.25483.59
    11. Automatic test pattern generation for resistive bridging faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. In 9th European Test Symposium, ETS 2004, Ajaccio, France, May 23-26, 2004, 2004, pp. 160--165. DOI: https://doi.org/10.1109/ETSYM.2004.1347652
    12. X-Masking During Logic BIST and Its Impact on Defect Coverage. Yuyi Tang; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Piet Engelke; Ilia Polian and Bernd Becker. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, 2004, pp. 442--451. DOI: https://doi.org/10.1109/TEST.2004.1386980
    13. The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. Piet Engelke; Ilia Polian; Michel Renovell; Bharath Seshadri and Bernd Becker. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, 2004, pp. 171--178. DOI: https://doi.org/10.1109/VTEST.2004.1299240
    14. Testing for Missing-Gate Faults in Reversible Circuits. John P. Hayes; Ilia Polian and Bernd Becker. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, 2004, pp. 100--105. DOI: https://doi.org/10.1109/ATS.2004.84

  15. 2003

    1. Reducing ATE Cost in System-on-Chip Test. Ilia Polian and Bernd Becker. In IFIP VLSI-SoC 2003, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Darmstadt, Germany, 1-3 December 2003, 2003, pp. 337--342.
    2. Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. Ilia Polian; Bernd Becker and Sudhakar M. Reddy. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany, 2003, pp. 11184--11185. DOI: https://doi.org/10.1109/DATE.2003.10051
    3. Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting. Jonathan Bradford; Hartmut Delong; Ilia Polian and Bernd Becker. J. Electronic Testing 19, 4 (2003), pp. 387--395. DOI: https://doi.org/10.1023/A:1024635824944
    4. On non-standard fault models for logic digital circuits. Ilia Polian. In Ausgezeichnete Informatikdissertationen 2003, 2003, pp. 169--178.
    5. Multiple Scan Chain Design for Two-Pattern Testing. Ilia Polian and Bernd Becker. J. Electronic Testing 19, 1 (2003), pp. 37--48. DOI: https://doi.org/10.1023/A:1021991828423
    6. Pattern-based verification of connections to intellectual property cores. Ilia Polian; Wolfgang Günther and Bernd Becker. Integration 35, 1 (2003), pp. 25--44. DOI: https://doi.org/10.1016/S0167-9260(03)00003-8
    7. The Case for 2-POF. Ilia Polian; Wolfgang Günther and Bernd Becker. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Bremen, Germany, February 24-25, 2003, 2003, pp. 164--173.
    8. Simulating Resistive Bridging and Stuck-At Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, 2003, pp. 1051--1059. DOI: https://doi.org/10.1109/TEST.2003.1271093
    9. Pattern-based verification of connections to intellectual property cores. Ilia Polian; Wolfgang Günther and Bernd Becker. Integration 35, 1 (2003), pp. 25--44. DOI: https://doi.org/10.1016/S0167-9260(03)00003-8
    10. The Case for 2-POF. Ilia Polian; Wolfgang Günther and Bernd Becker. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Bremen, Germany, February 24-25, 2003, 2003, pp. 164--173.
    11. Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. Ilia Polian; Bernd Becker and Sudhakar M. Reddy. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany, 2003, pp. 11184--11185. DOI: https://doi.org/10.1109/DATE.2003.10051
    12. Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting. Jonathan Bradford; Hartmut Delong; Ilia Polian and Bernd Becker. J. Electronic Testing 19, 4 (2003), pp. 387--395. DOI: https://doi.org/10.1023/A:1024635824944
    13. Reducing ATE Cost in System-on-Chip Test. Ilia Polian and Bernd Becker. In IFIP VLSI-SoC 2003, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Darmstadt, Germany, 1-3 December 2003, 2003, pp. 337--342.
    14. Multiple Scan Chain Design for Two-Pattern Testing. Ilia Polian and Bernd Becker. J. Electronic Testing 19, 1 (2003), pp. 37--48. DOI: https://doi.org/10.1023/A:1021991828423
    15. Simulating Resistive Bridging and Stuck-At Faults. Piet Engelke; Ilia Polian; Michel Renovell and Bernd Becker. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, 2003, pp. 1051--1059. DOI: https://doi.org/10.1109/TEST.2003.1271093
    16. On non-standard fault models for logic digital circuits. Ilia Polian. In Ausgezeichnete Informatikdissertationen 2003, 2003, pp. 169--178.

  16. 2002

    1. Stop & Go BIST. Ilia Polian and Bernd Becker. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, 2002, pp. 147--151. DOI: https://doi.org/10.1109/OLT.2002.1030198
    2. Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. Ilia Polian; Piet Engelke and Bernd Becker. In 32nd IEEE International Symposium on Multiple-Valued Logic (ISMVL 2002), May 15-18, 2002, Boston, Massachusetts, USA, 2002, pp. 216--223. DOI: https://doi.org/10.1109/ISMVL.2002.1011092
    3. Sequential n -Detection Criteria: Keep It Simple. Ilia Polian; Martin Keim; Nicolai Mallig and Bernd Becker. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, 2002, pp. 189. DOI: https://doi.org/10.1109/OLT.2002.1030213
    4. Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests. Ilia Polian; Irith Pomeranz and Bernd Becker. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002, pp. 2--14. DOI: https://doi.org/10.1109/ATS.2002.1181677
    5. Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests. Ilia Polian; Irith Pomeranz and Bernd Becker. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002, pp. 2--14. DOI: https://doi.org/10.1109/ATS.2002.1181677
    6. Sequential n -Detection Criteria: Keep It Simple. Ilia Polian; Martin Keim; Nicolai Mallig and Bernd Becker. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, 2002, pp. 189. DOI: https://doi.org/10.1109/OLT.2002.1030213
    7. Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. Ilia Polian; Piet Engelke and Bernd Becker. In 32nd IEEE International Symposium on Multiple-Valued Logic (ISMVL 2002), May 15-18, 2002, Boston, Massachusetts, USA, 2002, pp. 216--223. DOI: https://doi.org/10.1109/ISMVL.2002.1011092
    8. Stop & Go BIST. Ilia Polian and Bernd Becker. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, 2002, pp. 147--151. DOI: https://doi.org/10.1109/OLT.2002.1030198

  17. 2001

    1. Multiple Scan Chain Design for Two-Pattern Testing. Ilia Polian and Bernd Becker. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, 2001, pp. 88--93. DOI: https://doi.org/10.1109/VTS.2001.923423
    2. Efficient Pattern-Based Verification of Connections to Intellectual Property Cores. Ilia Polian; Wolfgang Günther and Bernd Becker. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Meißen, Germany, February 19-21, 2001, 2001, pp. 111--120.
    3. Efficient Pattern-Based Verification of Connections to IP Cores. Ilia Polian; Wolfgang Günther and Bernd Becker. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001, pp. 443--448. DOI: https://doi.org/10.1109/ATS.2001.990324
    4. Efficient Pattern-Based Verification of Connections to Intellectual Property Cores. Ilia Polian; Wolfgang Günther and Bernd Becker. In Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV), Meißen, Germany, February 19-21, 2001, 2001, pp. 111--120.
    5. Efficient Pattern-Based Verification of Connections to IP Cores. Ilia Polian; Wolfgang Günther and Bernd Becker. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001, pp. 443--448. DOI: https://doi.org/10.1109/ATS.2001.990324
    6. Multiple Scan Chain Design for Two-Pattern Testing. Ilia Polian and Bernd Becker. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, 2001, pp. 88--93. DOI: https://doi.org/10.1109/VTS.2001.923423

Contact

Ilia Polian
Prof. Dr. rer. nat. habil.

Ilia Polian

Head of Institute and Chair of Hardware Oriented Computer Science

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