OASIS: Online Failure Prediction for Microelectronic Circuits Using Aging Signatures

Microelectronic circuits suffer from life-time limiting aging. In this project, online in-field methods to assess circuit performance and remaining life-time will be developed to predict failures due to aging processes. Sensors and monitoring infrastructure are used to analyze both operating conditions as well as aging indicators so that a system failure can be early indicated and prevented by technical measures. Novel maintenance concepts based on failure prediction allow for a substantial simplification of established structural fault tolerance measures (e.g. redundancy concepts) even in safety-critical applications since specific counter measures can be applied before an actual aging induced failure. With the aid of such an on-line monitoring the effective life-time of a microelectronic product can be significantly increased at low cost.

03.2011 - 12.2014, DFG-Project: WU 245/11-1


    This image shows Hans-Joachim Wunderlich (i.R.)

    Hans-Joachim Wunderlich (i.R.)

    Prof. Dr. rer. nat. habil.

    Heading the Research Group Computer Architecture

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