OASIS: Online Failure Prediction for Microelectronic Circuits Using Aging Signatures
Microelectronic circuits suffer from life-time limiting aging. In this project, online in-field methods to assess circuit performance and remaining life-time will be developed to predict failures due to aging processes. Sensors and monitoring infrastructure are used to analyze both operating conditions as well as aging indicators so that a system failure can be early indicated and prevented by technical measures. Novel maintenance concepts based on failure prediction allow for a substantial simplification of established structural fault tolerance measures (e.g. redundancy concepts) even in safety-critical applications since specific counter measures can be applied before an actual aging induced failure. With the aid of such an on-line monitoring the effective life-time of a microelectronic product can be significantly increased at low cost.
03.2011 - 12.2014, DFG-Project: WU 245/11-1