Graduate School Intelligent Methods for Test and Reliability

The Graduate School’s scope includes topics such as design for test and diagnosis; post-silicon validation; test generation and optimization; robust device tuning; system-level test; lifetime test and reliability management; and test automation.

For further information please visit our GS-IMTR-Website.

This image shows Hans-Joachim Wunderlich (i.R.)

Hans-Joachim Wunderlich (i.R.)

Prof. Dr. rer. nat. habil.

Heading the Research Group Computer Architecture

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