The Graduate School’s scope includes topics such as design for test and diagnosis; post-silicon validation; test generation and optimization; robust device tuning; system-level test; lifetime test and reliability management; and test automation.
For further information please visit our GS-IMTR-Website.
![This image shows Hans-Joachim Wunderlich](https://www.iti.uni-stuttgart.de/img/wunderlichb.jpg?__scale=w:150,h:150,cx:0,cy:10,cw:279,ch:279)
Hans-Joachim Wunderlich
Prof. Dr. rer. nat. habil.Research Group Computer Architecture,
retired