Dr. Hussam Amrouch is a Junior Professor at the University of Stuttgart heading the Chair of Semiconductor Test and Reliability (STAR). He earned in 06.2015 his Ph.D. degree in Computer Science (Dr.-Ing.) from the Karlsruhe Institute of Technology (KIT), Germany with distinction (summa cum laude). After which, he has founded and led the “Dependable Hardware” research group at KIT. Dr. Amrouch has published around 200 multidisciplinary publications, including 78 journals (one in Nature Scientific Reports), covering all major research areas across the computing stack (semiconductor physics, circuit design, computer architecture, and computer-aided design). His key research interests are focused on design for reliability from device physics to systems, emerging nanotechnologies, machine learning for CAD, approximate computing, and deep neural networks.
Dr. Amrouch currently serves as Associate Editor in Integration, the VLSI Journal and. He is a reviewer in many top journals and he is/was a Technical Program Committee (TPC) member for several leading international conferences in the computer science area like Design Automation Conference (DAC), International Conference on Design Automation Computer-Aided Design (ICCAD) and others. In January 2018, an article in the Frankfurt General Newspaper (Frankfurter Allgemeine Zeitung - FAZ) was published recognizing his research and later in the same year, he was interviewed by the German public broadcasting radio (Deutschlandfunk) regarding his findings in thermal side channel attacks in cyber-physical systems.
Dr. Amrouch has delivered 10 tutorial talks in several major EDA conferences like DAC and DATE as well as 24 invited talks including 2 Keynotes in several international conferences, workshops, universities, and companies. His research currently is funded by the German Research Foundation (DFG), Advantest which a leading manufacturer of test equipment for the semiconductor industry, and the Office of Naval Research (ONR).
Dr. Amrouch has been recently invited to join the Editorial Board of Nature Scientific Reports for the Electrical Engineering division.
Key Research Interests and Fields
1. Machine Learning for Computer-Aided Design (MLCAD): Funded by Advantest
- ML for Design for Reliability and Design for Testing.
- ML for Circuit Thermal and Reliability Modeling.
- ML for Transistor Compact Modeling.
2. Approximate Computing for Deep Neural Network Acceleration: Funded by DFG
- Approximate Computing for Efficient Implementation of Neural Processing Units.
- Approximate Computing for Reliability Management.
3. Design for Security for Cyber-Physical Systems: Funded by ONR U.S.
- Reliability Degradation-induced Security Threats.
- Short-Term Circuit Aging for Hardware Trojan Detection.
4. Design for Reliability in Advanced Nanotechnologies
- Advanced CMOS Technology: Nanosheet and Nanowire Transistors.
- Device-Circuit Interaction: Transistor Aging, Self-Heating, Process Variation, Soft Errors
- Reliability-Aware and Thermal-Aware System-on-Chip Design.
5. Emerging Technologies for Future Computer Architectures
- Post-CMOS Technology: Negative Capacitance Transistor (NCFET).
- Novel Non-Volatile Memories: Ferroelectric FET (FeFET).
- In-Memory Computing and Neuromorphic Computing.
6. Thermal Management for Many-Core Processors
- Advanced Cooling Solutions using Thermoelectric Devices.
- Resource Management for System-Level Optimizations.
Ongoing International Collaborations
1. Semiconductor Physics:
- Indian Institute of Technology, Bombay, India: Prof. Souvik Mahapatra.
- Peking University, Beijing, China: Prof. Runsheng Wang.
- University of Berkeley, California, USA: Dr. Girish Pahwa.
- Rochester Institute of Technology, USA: Prof. Kai Ni.
- Indian Institute of Technology Kanpur, India: Prof. Yogesh S. Chauhan.
- University of Notre Dame, USA: Prof. Xiaobo Sharon Hu.
- National Chiao Tung University, Taiwan: Prof. Hung-Ming Chen.
- New York University Abu Dhabi, UAE: Dr. Johann Knechtel, Prof. Ozgur Sinanoglu.
- Federal University of Rio Grande do Sul, Brazil: Prof. Sergio Bampi.
- New York University (NYU), USA: Prof. Ramish Karri and Prof. Farshad Khorrami.
- University of Texas at Austin (UT), USA: Prof. Andreas Gerstlauer.
- University of California, Riverside (UCR), USA: Prof. Sheldon Tan.
- National University of Singapore (NUS), Singapore: Prof. Tulika Mitra.
- University of Nebraska–Lincoln (UNL), USA: Prof. Marilyn Wolf.
- University of New South Wales (UNSW), Australia: Prof. Sri Parameswaran.
- Korea University, Seoul, South Korea: Prof. Sung Woo Chung.
- 14th International Workshop on Boolean Problems (IWSBP), Keynote, virtual event in Sep 2020
- Peking University, Beijing, China in Jan 2020.
- University of Nebraska–Lincoln, Nebraska, USA in Feb 2020.
- The 11th Latin American Electron Devices Conference (LAEDC), Costa Rica in Feb, 2020.
- International Conference on Modelling, Simulation & Intelligent Computing (MoSICom), Keynote, Dubai in Jan 2020.
- EE Distinguished Speakers Seminar at EPFL, Lausanne, Switzerland in Dec 2019.
- The 32nd Symposium on Integrated Circuits and Systems Design (SBCCI) in August 2019.
- Federal University of Rio Grande do Sul (UFRGS), Brazil in April 2019.
- National Chiao Tung University, Hsinchu, Taiwan in March 2019.
- Macronix Company (semiconductor foundry), Taipei, Taiwan in March 2019.
- Tsinghua University, Beijing, China in March 2019.
- New York University (NYU), Abu Dhabi in UAE, February 2019.
- University of New South Wales, Sydney (UNSW), Australia in February 2019.
- Silvaco, Inc., Grenoble, France in April 2018.
- Korea University, Seoul in August 2018.
- Seoul National University in August 2017.
- “Steep-Slope Transistors: Opportunities and Challenges - Connecting Device Physics to System-level Management –” in Design Automation Conference (DAC. Together with Prof. Sayeef Salahuddin, University of California Berkeley, USA. Year: July 2020.
- “A Journey from Devices to Systems with FeFETs and NCFETs” in 25th Asia and South Pacific Design Automation Conference (ASP-DAC). Together with Prof. Sharon Hu from the University of Notre Dame, USA. Year: January 2020.
- “Design for Reliability on in the Nano-CMOS Era” in the 32nd Symposium on Integrated Circuits and Systems Design (SBCCI), Sao Paulo, Brazil. Full tutorial alone. Year: August 2019.
- “Negative Capacitance Transistor (NCFET) to Rescue Technology Scaling: From Physics to System Level” in the 34th South Symposium of Microelectronics and 21st South School of Microelectronics, Pelotas, Brazil. Full tutorial alone. Year: April 2019.
- “Design for Reliability in the Nano-CMOS Era: New Holistic Methodologies for Reliability Modeling and Optimization” in the International Asia and South Pacific Design Automation Conference (ASP-DAC), Tokyo, Japan. Together with Prof. Sheldon Tan from University of California, Riverside. Year: January 2019.
- “Design for Reliability: From Devices to Systems” in the 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Prague, Czech Republic. Together with Prof. Montserrat Nafria from Universitat Autonoma de Barcelona. Year: July 2018.
- “Reliability: From Physics to CAD” in Design, Automation and Test in Europe (DATE), Dresden, Germany. Together with Prof. Montserrat Nafria from Universitat Autonoma de Barcelona and Prof. Norbert Wehn from TU Kaiserslautern. Year: March 2018.