The HOCOS (Hardware-Oriented Computer Science) group of ITI is proud to present four papers at the IEEE European Test Symposium, the leading European conference on test methods, reliability and security of circuits and systems. In the first paper, reporting findings from a joint project with Advantest and Infineon, we use a metric known as Gauge Repeatability and Reproducibility (GRR) to characterize the drift of automated test equipment used for volume manufacturing. The second paper presents an improved side-channel attack on an implementation CRYSTALS-Kyber, a cryptographic approach that resists even attack by a quantum computer, in a “black-box” setting where the adversary does not know the internal structure of the implementation. The third paper reports an explanation for failures that are detected only during system-level test (SLT) but not during more conventional testing using scan chains: the recently introduced “multi-time frame triggered faults” produce consistent behavior to SLT-only fails on an open-source RISC-V microprocessor. Finally, the findings of a collaboration with IBM on resilience of their latest mainframe microprocessor Telum II against radiation-induced soft errors are presented in ETS’s Industrial Track.
We are also organizing the 3rd Workshop on Intelligent Methods for Test and Reliability with an attractive program that includes talks by Jeff Rearick (AMD), Leticia Bolzani Poehls (IHP Frankfurt), Daniel Müller-Gritschneder (TU Vienna), Jürgen Alt (Infineon), Paolo Bernardi (Politecnico di Torino), and Tsun-Ming Tseng (TU Munich), as well as numerous talks from the Graduate School IMTR, among them four talks from ITI-HOCOS.
Prof. Polian is part of ETS since more than a decade, having been member and chair of several topics, this year being a co-chair of topic T4 (Hardware Security).