AZTEKE

2005

1. Sequence Length, Area Cost and Non-Target Defect Coverage Tradeoffs in Deterministic Logic BIST. Piet Engelke; Valentin Gherman; Ilia Polian; Yuyi Tang; Hans-Joachim Wunderlich and Bernd Becker. In Proceedings of the 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS′05), Sopron, Hungary, 2005, pp. 11–18.
   • Abstract
   • BibTeX
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   Abstract

   For the first time, we study the coverage of non-target defects for Deterministic Logic BIST (DLBIST) architecture. We consider several DLBIST implementation options that result in test sequences of different lengths. Resistive bridging faults are used as a surrogate of non-target defects. Experimental data obtained for largest ISCAS benchmarks suggests that, although DLBIST always guarantees complete stuck-at coverage, test sequence length does influence the non-target defect detection capabilities. For circuits with a large fraction of random-pattern resistant faults, the embedded deterministic patterns as well as a sufficient amount of random patterns are both demonstrated to be essential for non-target defect detection. It turns out, moreover, that area cost is lower for DLBIST solutions with longer test sequences, due to additional degrees of freedom for the embedding procedure and a lower number of faults undetected by pseudorandom patterns. This implies that DLBIST is particularly effective in covering non-target defects.

   BibTeX

   @inproceedings{EngelGPTWB2005, abstract = {For the first time, we study the coverage of non-target defects for Deterministic Logic BIST (DLBIST) architecture. We consider several DLBIST implementation options that result in test sequences of different lengths. Resistive bridging faults are used as a surrogate of non-target defects. Experimental data obtained for largest ISCAS benchmarks suggests that, although DLBIST always guarantees complete stuck-at coverage, test sequence length does influence the non-target defect detection capabilities. For circuits with a large fraction of random-pattern resistant faults, the embedded deterministic patterns as well as a sufficient amount of random patterns are both demonstrated to be essential for non-target defect detection. It turns out, moreover, that area cost is lower for DLBIST solutions with longer test sequences, due to additional degrees of freedom for the embedding procedure and a lower number of faults undetected by pseudorandom patterns. This implies that DLBIST is particularly effective in covering non-target defects.}, abteilung = {ra}, address = {Sopron, Hungary}, author = {Engelke, Piet and Gherman, Valentin and Polian, Ilia and Tang, Yuyi and Wunderlich, Hans-Joachim and Becker, Bernd}, booktitle = {Proceedings of the 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'05)}, cr-category = {B.8.1 Reliability, Testing, and Fault-Tolerance}, day = {13--16}, department = {Universit{\"a}t Stuttgart, Institut f{\"u}r Technische Informatik, Rechnerarchitektur}, institution = {Universit{\"a}t Stuttgart, Fakult{\"a}t Informatik, Elektrotechnik und Informationstechnik, Germany}, language = {English}, location = {Sopron, Hungary}, month = {04}, owner = {Thomas}, pages = {11--18}, project = {AZTEKE}, publisher = {IEEE Computer Society}, title = {{Sequence Length, Area Cost and Non-Target Defect Coverage Tradeoffs in Deterministic Logic BIST}}, type = {Konferenz-Beitrag}, url = {https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2005/DDECS_EngelGPTWB2005.pdf}, year = 2005 }

   Link

   https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2005/DDECS_EngelGPTWB2005.pdf