Dieses Bild zeigt Steffen Kieß

Steffen Kieß

Herr Dipl.-Inf.

Wissenschaftlicher Mitarbeiter
ITI
Computational Imaging Systems

Kontakt

+49 711 685 88396
 +49 711 685 88250

Universitätsstraße 38
70569 Stuttgart
Deutschland
Raum: 2.256

Sprechstunde

Nach Vereinbarung

  1. 2025

    1. A Fast Deep Incremental Angle Refinement Model for Limited-Angle CT Reconstruction. Xingyu Liu; G.Q. Yang; Guangpu Yang; Ammar Alsaffar; Faizan Ahmad; Steffen Kieß and Sven Simon. e-Journal of Nondestructive Testing 30, (August 2025), pp. . DOI: https://doi.org/10.58286/31451
    2. A Neural Network for Denoising Multispectral Tomography Data at BM18 of the European Synchrotron Radiation Facility. Peter Gänz; Steffen Kieß; Jajnabalkya Guhathakurta; Paul Tafforeau; Andreas Balles; A. Hölzing; Simon Zabler and Sven Simon. e-Journal of Nondestructive Testing 30, (August 2025), pp. . DOI: https://doi.org/10.58286/31424
    3. Surface Quality Monitoring and Improvement for Dimensional Metrology in Inline CT by Denoising with Neural Networks and Fast Surface Quality Metric. Faizan Ahmad; Ahmed Baraka; César Cardona-Marin; Steffen Kieß; Dominik Wolfschlaeger; Robert Schmitt and Sven Simon. e-Journal of Nondestructive Testing 30, (February 2025), pp. . DOI: https://doi.org/10.58286/30723
    4. Impact of JPEG compression on the metrological characteristics of industrial CT data. Steffen Kieß; Robin Trostorf; Hiếu Trần; Jajnabalkya Guhathakurta; Sven Simon and Ulrich Neuschaefer-Rube. e-Journal of Nondestructive Testing 30, (February 2025), pp. . DOI: https://doi.org/10.58286/30716
    5. Deep Incremental Angle Refinement Model for Limited-Angle CT Reconstruction - A Case Study on Concrete Specimens. Xingyu Liu; Guangpu Yang; Ammar Alsaffar; Faizan Ahmad; Steffen Kieß and Sven Simon. e-Journal of Nondestructive Testing 30, (February 2025), pp. . DOI: https://doi.org/10.58286/30719
    6. A Framework for the AI-based visualization and analysis of massive amounts of 4D tomography data for end users of beamlines. Steffen Kieß; Thomas Lang; Tomas Sauer; A. Michael Stock; Andrey Chernov; Yipeng Sun; Andreas Maier; Tomáš Faragó; Alexey Ershov; Gabriel Lefloch; Guilherme Silva; Tilo Baumbach; Simon Zabler; A. Hölzing; Kilian Dremel; Ali Durmaz; Akhil Thomas; Ingo Manke; Nikolay Kardjilov and Sven Simon. e-Journal of Nondestructive Testing 30, (February 2025), pp. . DOI: https://doi.org/10.58286/30717

  2. 2024

    1. Artifact-robust Object Segmentation Using Thresholding Based on Binarized Image Object Analysis (TB2IOA) in X-ray Computed Tomography. Xingyu Liu; Charles Clark; Steffen Kieß; Ammar Alsaffar; Hiếu Trần; Jajnabalkya Guhathakurta and Sven Simon. e-Journal of Nondestructive Testing 29, (March 2024), pp. . DOI: https://doi.org/10.58286/29243
    2. Denoising of CT Projections Exploiting Spectral and Angular Information for Multispectral Computed Tomography. Peter Gänz; Guangpu Yang; Charles Clark; Steffen Kieß; Tanja Pienkny; Andreas Balles; A. Hölzing; Paul Tafforeau and Sven Simon. e-Journal of Nondestructive Testing 29, (March 2024), pp. . DOI: https://doi.org/10.58286/29262
    3. Visualization of 4D Tomography TB Datasets on Standard Computers with 128GB RAM. Steffen Kieß; Peter Gänz; Guangpu Yang; Xingyu Liu; César Cardona-Marin and Sven Simon. Cape Town, 2024.
    4. Multispectral CT with Classical Algorithms and Neural Network Denoising. Peter Gänz; Steffen Kieß; Jajnabalkya Guhathakurta; Paul Tafforeau; Andreas Balles; A Hölzing; Simon Zabler and Sven Simon. Cape Town, 2024.

  3. 2023

    1. Single Shot X-ray Speckle Tracking Phase Contrast Imaging with a Low Brilliance Lab Source. Peter Gänz; Steffen Kieß and Sven Simon. e-Journal of Nondestructive Testing 28, (March 2023), pp. . DOI: https://doi.org/10.58286/27709

  4. 2022

    1. Computational Scatter Correction for High-Resolution Flat-Panel CT Based on a Fast Monte Carlo Photon Transport Model. Ammar Alsaffar; Steffen Kieß; Kaicong Sun and Sven Simon. 2022. DOI: https://doi.org/10.48550/ARXIV.2201.13191

  5. 2019

    1. Spatial Resolution Enhancement Based on Detector Displacement for Computed Tomography. Kaicong Sun; Steffen Kieß and Sven Simon. In Proceedings of the 9th Conference on Industrial Computed Tomography (iCT 2019), Padova, Italy, 2019, pp. 1–8.

  6. 2018

    1. Efficient Data Structures for the Fast 3D Reconstruction of Voxel Volumes with Inhomogeneous Spatial Resolution. Benjamin Betz; Steffen Kieß; Michael Krumm; Gunnar Knuppe; Tsegaye Eshete and Sven Simon. In 8th Conference on Industrial Computed Tomography (iCT), Wels, Austria, 2018.

  7. 2017

    1. Contactless characterization of electric structures with simulation models based on CT data. C. Jauch; J. Denecke; J. Kuehnle; I. Effenberger; S. Kiess and S. Simon. In 7th Conference on Industrial Computed Tomography, 2017, pp. 1–7.

  8. 2015

    1. Signal Integrity Model Extraction Based on Computed Tomography Scans—Analysis of the Required Voxel Resolution. Jürgen Hillebrand; Steffen Kieß; Jajnabalkya Guhathakurta and Sven Simon. IEEE Transactions on Electromagnetic Compatibility 57, (2015), pp. 847–857. DOI: https://doi.org/10.1109/TEMC.2015.2435995

  9. 2012

    1. S-parameter extraction of bond wires based on EM field simulations of computed tomography-generated 3D CAD models. Jürgen Hillebrand; Steffen Kieß; Marek Wróblewski and Sven Simon. In 2012 IEEE 16th Workshop on Signal and Power Integrity (SPI), 2012, pp. 39–42. DOI: https://doi.org/10.1109/SaPIW.2012.6222907
    2. On the Estimation of Numerical Error Bounds in Linear Algebra Based on Discrete Stochastic Arithmetic. W. Li; S. Simon and S. Kiess. Journal: Applied Numerical Mathematics 62, (2012), pp. 536–555.

  10. 2011

    1. CAD model reconstruction of solder balls for the computationally efficient electromagnetic field simulation. Jürgen Hillebrand; Steffen Kieß; Yu Wang; Marek Wróblewski and Sven Simon. In 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems, 2011, pp. 279–282. DOI: https://doi.org/10.1109/EPEPS.2011.6100246
    2. S-parameter extraction of passive sub-circuits using computed tomography scans and measured substrate material parameters. Jürgen Hillebrand; Steffen Kieß; Marek Wróblewski and Sven Simon. In 78th ARFTG Microwave Measurement Conference, 2011, pp. 1–6. DOI: https://doi.org/10.1109/ARFTG78.2011.6183869
    3. In-process optical characterization method for sub-100-nm nanostructures. S. Kieß; M. Z. Shaikh; M. Grégoire; T. Bringewat; S. Simon; A. Tausendfreund; M. Zimmermann and G. Goch. In 2011 IEEE International Instrumentation and Measurement Technology Conference, 2011, pp. 1–4. DOI: https://doi.org/10.1109/IMTC.2011.5944117
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