The European Test Symposium offers a 3 day test spring school (TSS@ETS 2014, May 23 - 26) for Ph.D. and M.Sc. students who will be introduced into modern test technology. Renowned experts will give lectures and will cover the main challenges of test and reliability of today's nanoelectronic systems. TSS@ETS offers the unique opportunity to learn about the leading edge of the state-of-the-art in modern test technologies in a comprehensive and compact way. The school will give the opportunity to earn credits and a certificate by passing an exam online.
This year, emphasis is put on Volume Production Test. Test is the enabling technology for semiconductor systems manufactured with leading edge process nodes. Here, complete yield cannot be reached and each chip has to be tested before delivering. TSS@ETS 2014 will explain the role of volume test in the design and manufacturing flow. The advanced algorithms for test generation and simulation will be presented, and techniques for design for testability used in modern systems discussed. Defect mechanisms and fault models used in test, dependability evaluation and fault tolerance will be explained. Special requirements of testing mixed-signal, RF and analog systems and test application by modern test equipment will conclude the school.
The school is organized in conjunction with ETS 2014, and the last two lectures are open for the general ETS attendees without additional fee. It is also associated with the German DFG priority program SPP1500: "Dependable Embedded Systems". TSS@ETS is offered to registered students at very low cost rate. The school is also open for professionals at higher rates, however priority is given to students on first-come, first-served basis, as the number of attendees is strictly limited.
The TSS venue is the CAMPUS Lounge Hotel close to the university campus.
Contact:Hotel Campus Lounge
33100 Paderborn (Germany)
Phone: +49 5251 8920 7-0
Fax: +49 5251 8920 7-800
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