Anand Venkatachalam

2025

1. Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility. Anand Venkatachalam; Ernst Aderholz; Matthias Sauer; Simon Schweizer; Matthias Werner and Ilia Polian. In Proceedings of the 37th ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, Berlin, DE, 2025.
   • BibTeX

   BibTeX

   @inproceedings{venkatachalam2025intelligent, abteilung = {hocos}, author = {Venkatachalam, Anand and Aderholz, Ernst and Sauer, Matthias and Schweizer, Simon and Werner, Matthias and Polian, Ilia}, booktitle = {Proceedings of the 37th ITG / GMM / GI -Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen}, day = {23-25}, month = {02}, project = {aidetec}, title = {Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility}, venue = {Berlin, DE}, year = 2025 }
2. Automated test equipment drift characterization based on gauge repeatability and reproducibility. A Venkatachalam; E Aderholz; M Sauer; S Schweizer; M Werner and I Polian. In IEEE European Test Symp. (ETS), Tallinn, EE, 2025.
   • BibTeX

   BibTeX

   @inproceedings{venkatachalam2025automated, abteilung = {hocos}, author = {Venkatachalam, A and Aderholz, E and Sauer, M and Schweizer, S and Werner, M and Polian, I}, booktitle = {IEEE European Test Symp. (ETS)}, project = {aidetec}, title = {Automated test equipment drift characterization based on gauge repeatability and reproducibility}, venue = {Tallinn, EE}, year = 2025 }
3. Influence of Automated Test Equipment Drift on Process Capability Studies. Anand Venkatachalam; Ernst Aderholz; Matthias Sauer; Simon Schweizer; Matthias Werner and Ilia Polian. In 2025 IEEE International Test Conference (ITC), 2025, pp. 422–425. DOI: https://doi.org/10.1109/ITC58126.2025.00055
   • BibTeX
   • DOI

   BibTeX

   @inproceedings{11219654, abteilung = {hocos}, author = {Venkatachalam, Anand and Aderholz, Ernst and Sauer, Matthias and Schweizer, Simon and Werner, Matthias and Polian, Ilia}, booktitle = {2025 IEEE International Test Conference (ITC)}, doi = {10.1109/ITC58126.2025.00055}, pages = {422-425}, title = {Influence of Automated Test Equipment Drift on Process Capability Studies}, year = 2025 }

   DOI

   10.1109/ITC58126.2025.00055