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2025
- Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility. Anand Venkatachalam; Ernst Aderholz; Matthias Sauer; Simon Schweizer; Matthias Werner and Ilia Polian. In Proceedings of the 37th ITG / GMM / GI -Workshop Test Methods and Reliability of Circuits and Systems TUZ′25, 2025.
- Automated test equipment drift characterization based on gauge repeatability and reproducibility. A Venkatachalam; E Aderholz; M Sauer; S Schweizer; M Werner and I Polian. 2025.