Anand Venkatachalam

2025

1. Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility. Anand Venkatachalam; Ernst Aderholz; Matthias Sauer; Simon Schweizer; Matthias Werner and Ilia Polian. In Proceedings of the 37th ITG / GMM / GI -Workshop Test Methods and Reliability of Circuits and Systems TUZ′25, 2025.
   • BibTeX

   BibTeX

   @inproceedings{venkatachalam2025intelligent, abteilung = {hocos}, author = {Venkatachalam, Anand and Aderholz, Ernst and Sauer, Matthias and Schweizer, Simon and Werner, Matthias and Polian, Ilia}, booktitle = {Proceedings of the 37th ITG / GMM / GI -Workshop Test Methods and Reliability of Circuits and Systems TUZ'25}, project = {aidetec}, title = {Intelligent Device Tester Calibration Based on Gauge Repeatability and Reproducibility}, year = 2025 }
2. Automated test equipment drift characterization based on gauge repeatability and reproducibility. A Venkatachalam; E Aderholz; M Sauer; S Schweizer; M Werner and I Polian. In IEEE European Test Symp. (ETS), Tallinn, EE, 2025.
   • BibTeX

   BibTeX

   @inproceedings{venkatachalam2025automated, abteilung = {hocos}, author = {Venkatachalam, A and Aderholz, E and Sauer, M and Schweizer, S and Werner, M and Polian, I}, booktitle = {IEEE European Test Symp. (ETS)}, project = {aidetec}, title = {Automated test equipment drift characterization based on gauge repeatability and reproducibility}, venue = {Tallinn, EE}, year = 2025 }