Dieses Bild zeigt Li-Wei Chen

Li-Wei Chen

Herr M.Sc.

Wissenschaftlicher Mitarbeiter
Institut für Technische Informatik
Hardwareorientierte Informatik

Kontakt

+49 711 685 88281
+49 711 685 88288

Pfaffenwaldring 47
D-70569 Stuttgart
Deutschland
Raum: 2.160

  1. 2025

    1. Optimal synthesis of memristive mixed-mode circuits. Ilia Polian; Xianyue Zhao; Li-Wei Chen; Felix Bayhurst; Ziang Chen; Heidemarie Schmdt and Nan Du. In To appear in Proc. of Design Automation and Test in Europe Conf. (DATE), Lyon, FR, 2025.
    2. Protected memristive implementations of cryptographic functions. Ziang Chen; Li-Wei Chen; Xianyue Zhao; Kefeng Li; Heidemarie Schmidt; Ilia Polian and Nan Du. To appear in Philosophical Transactions of the Royal Society A (2025).
  2. 2024

    1. Memristive True Random Number Generator for Security Applications. Xianyue Zhao; Li-Wei Chen; Kefeng Li; Heidemarie Schmidt; Ilia Polian and Nan Du. Sensors 24, (August 2024), pp. 5001. DOI: https://doi.org/10.3390/s24155001
  3. 2023

    1. Exploring gate-diversity enabled by reconfigurable memristive technology. Sebastian Brandhofer; Ziang Chen; Li-Wei Chen; Nan Du and Ilia Polian. In To appear in Proceedings of IEEE Int’l Conf. on Electronics, Circuits and Systems (ICECS), Istanbul, Turkey, 2023.
    2. Side-channel Attacks on Memristive Circuits Under External Disturbances. Li-Wei Chen; Xianyue Zhao; Ziang Chen; Nan Du and Ilia Polian. In 2023 IEEE 32nd Asian Test Symposium (ATS), Beijing, China, 2023, pp. 1–6. DOI: https://doi.org/10.1109/ATS59501.2023.10317969
    3. On Side-Channel Analysis of Memristive Cryptographic Circuits. Li-Wei Chen; Ziang Chen; Werner Schindler; Xianyue Zhao; Heidemarie Schmidt; Nan Du and Ilia Polian. IEEE Transactions on Information Forensics and Security 18, (2023), pp. 463–476. DOI: https://doi.org/10.1109/TIFS.2022.3223232
    4. Exploring Gate-Diversity Enabled by Reconfigurable Memristive Technology. Sebastian Brandhofer; Ziang Chen; Li-Wei Chen; Xianyue Zhao; Nan Du and Ilia Polian. In 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2023, pp. 1–5. DOI: https://doi.org/10.1109/ICECS58634.2023.10382911
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