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2020
- Z. Najafi Haghi, M. Hashemipour Nazari, and H.-J. Wunderlich, “Variation-Aware Defect Characterization at Cell Level,” in Proceedings of the 25th IEEE European Test Symposium (ETS’20), Tallinn, Estonia, 2020, pp. 1--6, doi: 10.1109/ETS48528.2020.9131600.