Zahra Paria Najafi Haghi

2020

1. Z. Najafi Haghi, M. Hashemipour Nazari, and H.-J. Wunderlich, “Variation-Aware Defect Characterization at Cell Level,” in Proceedings of the 25th IEEE European Test Symposium (ETS’20), Tallinn, Estonia, 2020, pp. 1--6, doi: 10.1109/ETS48528.2020.9131600.
   • Abstract
   • BibTeX
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   Abstract

   Small Delay Faults (SDFs) are an indicator of reliability threats even if they do not affect the behavior of a system at nominal speed. Various defects may evolve over time into a complete system failure, and defects have to be distinguished from delays due to process variations which also change the circuit timing but are benign. Based on Monte-Carlo ectrical simulation at cell level, in this work it is shown that a few measurements at different operating points of voltage and frequency are sufficient to identify a defect cell even if its behavior is completely within the specification range. The developed classifier is based on statistical learning and can be annotated to each element of a cell library to support manufacturing test, diagnosis and optimizing the burn-in process or yield.

   BibTeX

   @inproceedings{NajafiHW2020, abstract = {Small Delay Faults (SDFs) are an indicator of reliability threats even if they do not affect the behavior of a system at nominal speed. Various defects may evolve over time into a complete system failure, and defects have to be distinguished from delays due to process variations which also change the circuit timing but are benign. Based on Monte-Carlo ectrical simulation at cell level, in this work it is shown that a few measurements at different operating points of voltage and frequency are sufficient to identify a defect cell even if its behavior is completely within the specification range. The developed classifier is based on statistical learning and can be annotated to each element of a cell library to support manufacturing test, diagnosis and optimizing the burn-in process or yield.}, abteilung = {ra}, address = {Tallinn, Estonia}, author = {Najafi Haghi, Zahra and Hashemipour Nazari, Marzieh and Wunderlich, Hans-Joachim}, booktitle = {Proceedings of the 25th IEEE European Test Symposium (ETS'20)}, day = {25--29}, doi = {10.1109/ETS48528.2020.9131600}, location = {Tallinn, Estonia}, month = may, owner = {najafiza}, pages = {1--6}, project = {FAST}, title = {Variation-Aware Defect Characterization at Cell Level}, url = {https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2020/ETS_NajafHW2020.pdf}, year = 2020 }

   Link

   https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2020/ETS_NajafHW2020.pdf