Dieses Bild zeigt Florian Klemme

Florian Klemme

Herr M.Sc.

Wissenschaftlicher Mitarbeiter
Institut für Technische Informatik
Test und Diagnose von Halbleitersystemen

Kontakt

+49 711 685 88279
+49 711 685 88288

Pfaffenwaldring 47
D-70569 Stuttgart
Deutschland
Raum: 3.164

  1. 2023

    1. Cryogenic Embedded System to Support Quantum Computing: From 5nm FinFET to Full Processor. Paul R. Genssler; Florian Klemme; Shivendra Singh Parihar; Sebastian Brandhofer; Girish Pahwa; Ilia Polian; Yogesh Singh Chauhan and Hussam Amrouch. IEEE Transactions on Quantum Engineering (2023). DOI: https://doi.org/10.1109/TQE.2023.3300833
    2. Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. Behnaz Ranjbar; Florian Klemme; Paul R. Genssler; Hussam Amrouch; Jinhyo Jung; Shail Dave; Hwisoo So; Kyongwoo Lee; Aviral Shrivastava; Ji-Yung Lin; Pieter Weckx; Subrat Mishra; Francky Catthoor; Dwaipayan Biswas and Akash Kumar. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    3. ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors all the Way up Processors. Hussam Amrouch and Florian Klemme. In 28th Asia and South Pacific Design Automation Conference (ASP-DAC), 2023.
    4. Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch and Hans-Joachim Wunderlich. In To appear in Proceedings of the IEEE Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
    5. Design Automation for Cryogenic CMOS Circuits. Victor van Santen; Marcel Walter; Florian Klemme; Shivendra Parihar; Girish Pahwa; Yogesh Chauhan; Robert Wille and Hussam Amrouch. In Proceedings of the 60th Annual Design Automation Conference (DAC’23), San Francisco, USA, 2023.
    6. Robust Pattern Generation for Small Delay Faults under  Process Variations. Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand and Hans-Joachim Wunderlich. In To appear in the Proceedings of the IEEE International Test Conference (ITC’23), Disneyland, Anaheim, USA, 2023.
    7. Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. Victor van Santen; Florian Klemme; Paul R. Genssler and Hussam Amrouch. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023.
    8. Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows. Florian Klemme; Sami Salamin and Hussam Amrouch. In Proceedings of the Conference on Design, Automation & Test in Europe (DATE’23), Antwerp, Belgium, 2023.
  2. 2022

    1. Intelligent Methods for Test and Reliability. Hussam Amrouch; Jens Anders; Steffen Becker; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; André van Hoorn; Hanieh Jafarzadeh; Ingmar Kallfass; Florian Klemme; Steffen Koch; Ralf Küsters; Andrés Lalama; Raphael Latty; Yiwen Liao; Natalia Lylina; Zahra Paria Najafi-Haghi; Dirk Pflüger; Ilia Polian; Jochen Rivoir; Matthias Sauer; Denis Schwachhofer; Steffen Templin; Christian Volmer; Stefan Wagner; Daniel Weiskopf; Hans-Joachim Wunderlich; Bin Yang and Martin Zimmermann. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, 2022, pp. 1–6.
    2. On Extracting Reliability Information from Speed Binning. Zahra Paria Najafi-Haghi; Florian Klemme; Hussam Amrouch and Hans-Joachim Wunderlich. In Proceedings of the 27th IEEE European Test Symposium (ETS’22), Barcelona, Spain, 2022. DOI: https://doi.org/10.1109/ETS54262.2022.9810443
    3. Mitigating the Complexity of Chip Designs with ML-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. In Workshop on Intelligent Methods for Test and Reliability (IMTR’22), 2022.
    4. Efficient Learning Strategies for Machine Learning-based Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    5. Scalable Machine Learning to Estimate the Impact of Aging on Circuits under Workload Dependency. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
    6. GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation. Lilas Alrahis; Johann Knechtel; Florian Klemme; Hussam Amrouch and Ozgur Sinanoglu. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD’22), ESWEEK Special Issue (2022).
    7. Machine Learning for Reliability-Aware, yet Confidential Standard Cell Characterization. Florian Klemme and Hussam Amrouch. In The 34th Workshop on Test Methods and Reliability of Circuits and Systems (TuZ’22), 2022.
    8. Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022). DOI: https://doi.org/10.1109/TCSI.2022.3201431
    9. Design Close to the Edge in Advanced Technology using Machine  Learning and Brain-Inspired Algorithms. Hussam Amrouch; Florian Klemme and Paul R. Genssler. In 27th Asia and South Pacific Design Automation Conference  (ASP-DAC’22), 2022.
    10. Variability-Aware Approximate Circuit Synthesis via Genetic Optimization. Konstantinos Balaskas; Florian Klemme; Georgios Zervakis; Kostas Siozios; Hussam Amrouch and Jörg Henkel. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2022).
  3. 2021

    1. Machine Learning for Circuit Aging Estimation under Workload Dependency. Florian Klemme and Hussam Amrouch. In IEEE International Test Conference (ITC’21), 2021.
    2. Machine Learning for On-the-fly Reliability-Aware Cell Library Characterization. Florian Klemme and Hussam Amrouch. IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (2021).
    3. Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU. Sami Salamin; Georgios Zervakis; Florian Klemme; Hammam Kattan; Yogesh Chauhan; Jörg Henkel and Hussam Amrouch. IEEE Transactions on Computers (TC’21) (2021).
  4. 2020

    1. Cell Library Characterization using Machine Learning for Design Technology Co-Optimization. Florian Klemme; Yogesh Chauhan; Joerg Henkel and Hussam Amrouch. In IEEE/ACM 38th International Conference on Computer-Aided Design (ICCAD’20), 2020.
    2. Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. H. Amrouch; G. Pahwa; A. Gaidhane; F. Klemme; O. Prakash; C. Dabhi and Y. Chauhan. IEEE Transactions on Circuits and Systems I: Regular Paper  (TCAS-I’20), 2020 (2020).
    3. Modeling Emerging Technologies using Machine Learning:  Challenges and Opportunities. Florian Klemme; Jannik Prinz; Victor M. van Santen; Joerg Henkel and Hussam Amrouch. In IEEE/ACM 38th International Conference on Computer-Aided Design (ICCAD’20), 2020.

Florian Klemme received the B.Sc. in System Integration from the University of Applied Sciences Bremerhaven, Germany, in 2014 and the M.Sc. in Computer Science from the Karlsruhe Institute of Technology, Germany, in 2018. He is currently working towards the Ph.D. degree at the Chair of Semiconductor Test and Reliability, University of Stuttgart.

His research interests include cell library characterization and machine learning techniques in the EDA design flow.

Zum Seitenanfang