Sebastian Brandhofer

2020

1. Synthesis of Fault-Tolerant Reconfigurable Scan Networks. Sebastian Brandhofer; Michael A. Kochte and Hans-Joachim Wunderlich. In Proceedings of the ACM/IEEE Conference on Design, Automation Test in Europe (DATE’20), Grenoble, France, 2020, pp. 1--6. DOI: https://doi.org/10.23919/DATE48585.2020.9116525
   • Abstract
   • BibTeX
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   Abstract

   On-chip instrumentation is mandatory for efficient bring-up, test and diagnosis, post-silicon validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable scan networks (RSNs) provide a scalable and efficient scan-based access mechanism to such instruments. The correct operation of this access mechanism is crucial for all manufacturing, bring-up and debug tasks as well as for in-field operation, but it can be affected by faults and design errors. This work develops for the first time fault-tolerant RSNs such that the resulting scan network still provides access to as many instruments as possible in presence of a fault. The work contributes a model and an algorithm to compute scan paths in faulty RSNs, a metric to quantify its fault tolerance and a synthesis algorithm that is based on graph connectivity and selective hardening of control logic in the scan network. Experimental results demonstrate that fault-tolerant RSNs can be synthesized with only moderate hardware overhead.

   BibTeX

   @inproceedings{BrandKW2020, abstract = {On-chip instrumentation is mandatory for efficient bring-up, test and diagnosis, post-silicon validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable scan networks (RSNs) provide a scalable and efficient scan-based access mechanism to such instruments. The correct operation of this access mechanism is crucial for all manufacturing, bring-up and debug tasks as well as for in-field operation, but it can be affected by faults and design errors. This work develops for the first time fault-tolerant RSNs such that the resulting scan network still provides access to as many instruments as possible in presence of a fault. The work contributes a model and an algorithm to compute scan paths in faulty RSNs, a metric to quantify its fault tolerance and a synthesis algorithm that is based on graph connectivity and selective hardening of control logic in the scan network. Experimental results demonstrate that fault-tolerant RSNs can be synthesized with only moderate hardware overhead.}, abteilung = {hocos;ra}, address = {Grenoble, France}, author = {Brandhofer, Sebastian and Kochte, Michael A. and Wunderlich, Hans-Joachim}, booktitle = {Proceedings of the ACM/IEEE Conference on Design, Automation Test in Europe (DATE'20)}, day = {9--13}, doi = {10.23919/DATE48585.2020.9116525}, location = {Grenoble, France}, month = {March}, owner = {brandhsn}, pages = {1--6}, project = {ACCESS}, title = {{Synthesis of Fault-Tolerant Reconfigurable Scan Networks}}, url = {https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2020/DATE_BrandKW2020.pdf}, year = 2020 }

   Link

   https://www.iti.uni-stuttgart.de//fileadmin/rami/files/publications/2020/DATE_BrandKW2020.pdf