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		<title>News - Institut für Technische Informatik</title>
		<link>http://www.iti.uni-stuttgart.de/</link>
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			<title>News - Institut für Technische Informatik</title>
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			<description>News - Institut für Technische Informatik</description>
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		<lastBuildDate>Thu, 17 Oct 2013 16:30:00 +0200</lastBuildDate>
		
		
		<item>
			<title>Efficient Observation Point Selection for Hardware Aging Monitoring</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/efficient-observation-point-selection-for-hardware-aging-monitoring.html</link>
			<description>16:30 - 17:15, V47.06, M.Sc. Chang Liu, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[Technology scaling threatens circuit reliability. One of the concerns is the susceptibility to transistors aging. Using stability checkers (SC) to detect the accumulating delay increase along the paths is one well-known and commonly utilized aging monitoring approach. Because of the hardware overhead, aging sensors are often located at the end of critical or long paths. However, certain functional application can hardly sensitize the whole circuit network. Then it is possible that some long paths with aging checkers are very seldom sensitized, and lead to unmonitored aging progress.  To avoid this situation, we propose the stability checker placement/relocation method. Instead of integrating the aging sensors only in flip-flops (FF) at the end of the critical or long paths, the stability checkers are inserted at the meticulously selected intermediate circuit nets, named as observation points (OPs). The experimental results prove the effectiveness and efficiency of the proposed methodology. ]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 17 Oct 2013 16:30:00 +0200</pubDate>
			
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		<item>
			<title>Incremental Variation-Aware Statistical Dynamic Timing Analysis for Delay Test Applications</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/incremental-variation-aware-statistical-dynamic-timing-analysis-for-delay-test-applications.html</link>
			<description>15:45 - 16:30, V47.06, Dipl.-Inf. Marcus Wagner, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 17 Oct 2013 15:45:00 +0200</pubDate>
			
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		<item>
			<title>Timing analysis under variations</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/timing-analysis-under-variations.html</link>
			<description>15:30 - 16:15, ITI-3.175, M.Sc. Anusha Kakarala, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Fri, 26 Jul 2013 15:30:00 +0200</pubDate>
			
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		<item>
			<title>Control-Flow Protection for GPU Many-Core Architectures</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/control-flow-protection-for-gpu-many-core-architectures.html</link>
			<description>14:45 - 15:30, ITI-3.175, Dipl.-Inform. Claus Braun, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Fri, 26 Jul 2013 14:45:00 +0200</pubDate>
			
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		<item>
			<title>Boolean Reasoning in Presence of Unknown Values</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/boolean-reasoning-in-presence-of-unknown-values.html</link>
			<description>14:00 - 14:45, ITI-3.175, Dipl.-Inf. Michael Kochte, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[Unknown values emerge during the design process as well as during system operation and test application. Sources of X-values are for example black boxes, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements. X-values compromise test quality. This talk discusses algorithms to accurately analyze the propgation of X-values and the coverage of structural tests.]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Fri, 26 Jul 2013 14:00:00 +0200</pubDate>
			
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		<item>
			<title>Pieceweise evaluation of Non-functional parameters</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/pieceweise-evaluation-of-non-functional-parameters.html</link>
			<description>17:15 - 18:00, V47.06, M.Sc. Nadereh Hatami, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[Non-Functional Properties (NFPs) are usually defined formally as mathematical equations. As environmental changes have significant effect on NFPs during the lifetime of the circuit, accurate NFP prediction demands frequent evaluation of relevant NFP models. In this talk, we present Piecewise evaluation technique for NFP prediction that finds a trade-off between the frequency of evaluations and the accuracy of NFP prediction.]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 18 Jul 2013 17:15:00 +0200</pubDate>
			
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		<item>
			<title>Micro Architecture for Fault Tolerant NoCs</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/micro-architecture-for-fault-tolerant-nocs.html</link>
			<description>16:30 - 17:15, V47.06, Dipl.-Ing. cand. Stefan Zimmermann, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[T.B.A.]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 18 Jul 2013 16:30:00 +0200</pubDate>
			
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		<item>
			<title>Test Code Generation for SBST</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/test-code-generation-for-sbst.html</link>
			<description>15:45 - 16:30, V47.06, Dipl.-Inf. Dominik Ull, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 18 Jul 2013 15:45:00 +0200</pubDate>
			
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		<item>
			<title>Kolloquium: Das große Einmaleins effizienter XML-Datenbanksysteme</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/kolloquium-das-grosse-einmaleins-effizienter-xml-datenbanksysteme.html</link>
			<description>Prof. Dr. Theo Härder, Universität Kaiserslautern: Dienstag, der  16.07.2013 um 16:00 im Hörsaal...</description>
			<content:encoded><![CDATA[Den offiziellen Einladungstext finden Sie <link http://www.infos.informatik.uni-stuttgart.de/fileadmin/user_upload/infos/Veranstaltungen/130716Haerder.pdf _blank - "Initiates file download">hier</link>.]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Tue, 16 Jul 2013 16:00:00 +0200</pubDate>
			
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		<item>
			<title>Kolloquium: The Next Wave of Mixed-Signal Interface Electronics</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/kolloquium-the-next-wave-of-mixed-signal-interface-electronics.html</link>
			<description>Prof. Boris Murmann, Stanford University, USA: Dienstag, der 09.07.2013 um 16.00 Uhr im...</description>
			<content:encoded><![CDATA[In most modern electronic systems, information is processed and stored in digital format. However, analog interfaces are still necessary to interface with &quot;real world&quot; signals and often present a bottleneck in the overall system. This presentation will provide an overview of recent advances and trends in the design of analog-digital interface circuits from an application standpoint. It will include examples from the areas of data communication, microelectromechanical systems (MEMS), bio-medical instrumentation, structural health monitoring, and large-area electronics. ]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Tue, 09 Jul 2013 16:00:00 +0200</pubDate>
			
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		<item>
			<title>Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/non-intrusive-integration-of-advanced-diagnosis-features-in-automotive-ee-architectures.html</link>
			<description>16:30 - 17:15, V47.06, M.Sc. Alejandro Cook, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[The constantly growing amount of semiconductors in automotive systems increases the number of possible defect mechanisms, and therefore raises the effort to maintain a suficient level of quality and reliability. An advantageous solution for this problem is the on-line application of structural tests in key components, typically ECUs. In this work, an approach for the optimized integration of Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E-architectures is presented. The method performs a non-intrusive integration, i. e., the execution of the tests (a) does not affect functional applications and (b) does not require costly changes in the communication schedules or additional communication overhead. Via a design space exploration, the paper derives optimized implementations with respect to multiple conflicting objectives reflecting costs, safety, and test quality. ]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 04 Jul 2013 16:30:00 +0200</pubDate>
			
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			<title>Hardware/Software System Validation </title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/hardwaresoftware-system-validation.html</link>
			<description>15:45 - 16:30, V47.06, Dipl.-Inf. Laura Rodríguez Gómez, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 04 Jul 2013 15:45:00 +0200</pubDate>
			
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		<item>
			<title>Kolloquium: Rechtliche Rahmenbedingungen der Elektromobilität</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/kolloquium-rechtliche-rahmenbedingungen-der-elektromobilitaet.html</link>
			<description>Christian Alexander Mayer, Rechtsanwalt, Noerr LLP, München: Dienstag, der 02.07.2013 um 16.00 Uhr...</description>
			<content:encoded><![CDATA[Der Vortrag gibt einen Überblick über die einschlägigen rechtlichen Vorgaben im Bereich Elektromobilität. Dabei soll das gesamte Spektrum der Elektromobilität behandelt werden, vom Fahrzeug über die Energieverteilung und Kommunikation bis zur Ladeinfrastruktur. Der Vortrag umfasst energiewirtschafts- und eichrechtliche Vorgaben ebenso wie Konformitätsanforderungen des produktbezogenen Umweltrechts und Genehmigungserfordernisse des öffentlichen Straßen- und Baurechts. Ziel des Vortrags ist es, die heute bestehenden rechtlichen Hemmnisse für die Entwicklung der Elektromobilität aufzuzeigen und darzustellen, welche Anreize wünschenswert wären.&nbsp;]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Tue, 02 Jul 2013 16:00:00 +0200</pubDate>
			
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		<item>
			<title>Test Sequence Generation for Offline Testing</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/test-sequence-generation-for-offline-testing.html</link>
			<description>17:15 - 18:00, V47.06, Dipl.-Inf. Michael Imhof, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 27 Jun 2013 17:15:00 +0200</pubDate>
			
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		<item>
			<title>Online Diagnosis in NoCs</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/online-diagnosis-in-nocs.html</link>
			<description>16:30 - 17:15, V47.06, M.Sc. Atefe Dalirsani, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[In recent years, Network-on-Chip (NoC) is becoming the feasible solution to alleviate the communication complexity within the SoCs, which integrates numerous semiconductor Intellectual Property (IP) blocks in a single chip.  Although offline manufacturing test typically identifies a large number of circuit defects, the reliable operation of the system is still degraded by undetected manufacturing defects, wear-and-tear faults, and transient faults. As the transistor size shrinks, the circuit becomes increasingly sensitive to the transient faults. In addition, it becomes more vulnerable to aging effects. These failure mechanisms can alter the behavior of the NoC fabric in operational mode and hence degrade its Quality of Service characteristics. Providing resilience from such faults is important for reliable operation of the NoC-based chips.  Fault identification in the switches during the normal operation of the system, which is called online error detection, is the first step in online diagnosis. The effect of a transient fault can be mitigated by discarding the erroneous transmitted data and repeating the incorrect operations during the next operation cycles. However, for faults with a permanent or intermittent nature, apart from error detection, further diagnosis is required to identify which of the switch ports is not functional. For these classes of faults, after detecting the fault, we find the location of the fault inside a defective switch, which is called online diagnosis. It makes the use of semi-faulty switches possible and improves performance of the NoC in presence of fault.&nbsp;]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 27 Jun 2013 16:30:00 +0200</pubDate>
			
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			<title>Simulation-based aging analysis</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/simulation-based-aging-analysis.html</link>
			<description>15:45 - 16:30, V47.06, M.Sc. cand. Zdravko GEORGIEV, Institut für Technische Informatik</description>
			<content:encoded><![CDATA[T.B.A.]]></content:encoded>
			<category>Open Seminar - Rechnerarchitektur</category>
			<category>SS 13</category>
			
			
			<pubDate>Thu, 27 Jun 2013 15:45:00 +0200</pubDate>
			
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		<item>
			<title>Tag der Wissenschaft 2013</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/tag-der-wissenschaft-2013.html</link>
			<description>Die Universität Stuttgart lädt am 22. Juni zum Tag der Wissenschaft von 13.00 bis 19.00 Uhr auf den...</description>
			<content:encoded><![CDATA[Zum Leitthema &quot;Gesellschaft im Wandel&quot; präsentieren sich mehr als 120 Institute und Einrichtungen der Universität Stuttgart zu den wichtigen Zukunftsthemen. Die Wissenschaftlerinnen und Wissenschaftler der Universität Stuttgart fragen sich zum Beispiel: „Wie wird sich unsere Mobilität verändern?“ „Wie werden einmal unsere Städte aussehen?“ und „Welche technischen Erfindungen werden in naher Zukunft unser Leben leichter machen?“ 
Spannende Antworten darauf – und auf noch viele weitere Zukunftsfragen – erwarten Sie beim Tag der Wissenschaft.
 Informieren Sie sich zudem über Studium, Forschung, Aus- und Weiterbildung an der Universität Stuttgart und lernen Sie unsere zukunftsorientierten Angebote kennen. 
Am Tag der Wissenschaft erleben Groß und Klein Wissenschaft und Forschung von ihrer verständlichen Seite, zum Anfassen und Mitmachen – Spannung, Spaß und Aha-Erlebnisse inklusive! 
Die Universität Stuttgart freut sich auf Ihren Besuch!

Alle weiteren Informationen erhalten Sie unter diesem <link http://www.uni-stuttgart.de/tag/2013/ _blank>Link</link>.]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Sat, 22 Jun 2013 13:00:00 +0200</pubDate>
			
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			<title>1. infos-Regionalkonferenz</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/1-infos-regionalkonferenz.html</link>
			<description>Cloud Computing: Mittwoch, der 19.06.2013 um 17.00 Uhr
im Erdgeschoss Forschungszentrum...</description>
			<content:encoded><![CDATA[Den offiziellen Einladungstext finden Sie <link http://www.infos.informatik.uni-stuttgart.de/veranstaltungen/2013/rkcc.html _blank - "Initiates file download">hier</link>.]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Wed, 19 Jun 2013 17:00:00 +0200</pubDate>
			
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			<title>Kolloquium: Networks for Service and Content Delivery</title>
			<link>http://www.iti.uni-stuttgart.de/aktuell/details/kolloquium-networks-for-service-and-content-delivery.html</link>
			<description>Dr. Volker Hilt, Bell Labs/Alcatel-Lucent: Mittwoch, 19. Juni 2013 um 16:45 Uhr im Hörsaal V38.02,...</description>
			<content:encoded><![CDATA[Delivering cloud-based services and high-quality content to end users are two key challenges our networks are facing today. A challenge for today's cloud computing infrastructures has been to jointly manage network and data center resource to deliver a wide range of services from a single elastic set of resources. This is particularly important for telecommunication services that are time-sensitive, media-based, mission-critical, or persistent (long-lived).These limitations can be overcome through new approaches to network virtualization, network-awareness and cloud resource orchestration, which I will discuss in this talk. 
 The second part of the talk will focus on research in information centric networks, which willen able networks to deliver content more effectively. A challenge in this area has been to create designs that scales to large namespaces and fully supports the invocation of services. 

 <b>Bio: </b>
 Dr. Volker Hilt is a director at Bell Labs/Alcatel-Lucent in Stuttgart, Germany. He received his master's degree in information systems in 1996 and his Ph.D. in computer science in 2001 both from the University of Mannheim in Germany. 
 His field of research is computer networking where has made contributions in the areas of cloud computing technologies, content distribution networks, peer-to-peer applications and distributed multimedia systems. Dr. Hilt is a contributor in the Internet Engineering Task Force(IETF) and chairs the SIP Overload Control Working Group. He has published over 50 papers and co-authored more than 15 Internet drafts and RFCs. ]]></content:encoded>
			<category>Events</category>
			
			
			<pubDate>Wed, 19 Jun 2013 16:45:00 +0200</pubDate>
			
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