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The project's goal is the development and examination of innovative embedded
diagnosis solutions for integrated systems in nanometer scale. The
manufacturing process for these systems is subject to high variations and
therefore leads to a rather low yield at the beginning and a high sensitivity
during operation. Efficient diagnosis solutions are necessary to reduce
time-to-market with reasonable costs. To achieve this, more diagnosis
techniques need to be integrated into the systems (built-in diagnosis).
News
Publications
- Adaptive Debug and Diagnosis Without Fault Dictionaries
Stefan Holst, Hans-Joachim Wunderlich
Journal of Electronic Testing, Springer, 2009
- Test Encoding for Extreme Response Compaction
Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
IEEE European Test Symposium (ETS'09), Sevilla, Spain, May 25-29, 2009
- A Diagnosis Algorithm for Extreme Space Compaction
Stefan Holst, Hans-Joachim Wunderlich
Design, Automation and Test in Europe (DATE'09), Nice, France, April 20-24, 2009
- Diagnose mit extrem kompaktierten Fehlerdaten
Stefan Holst, Hans-Joachim Wunderlich
21th ITG/GI/GMM Workshop "Testmethoden und Zuverlaessigkeit von Schaltungen und Systemen", Bremen, Germany, February 15-17, 2009
- Scan Chain Clustering for Test Power Reduction
M. Elm, M. E. Imhof, H.-J. Wunderlich, C. G. Zoellin, J. Leenstra, N. Maeding
45th ACM/IEEE Design Automation Conference (DAC), Anaheim, CA, USA, June 8-13, 2008, pp. 828-833
- Scan Chain Organization for Embedded Diagnosis
Melanie Elm, Hans-Joachim Wunderlich
Design, Automation and Test in Europe (DATE'08), Munich, Germany, March 10-14, 2008
- Prüfpfad Konfigurationen zur Optimierung der diagnostischen Auflösung
Melanie Elm, Hans-Joachim Wunderlich
20th ITG/GI/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen", Wien, Austria, February 24-26, 2008
- Debug and Diagnosis: Mastering the Life Cycle of Nano-Scale Systems on Chip
H.-J. Wunderlich, M. Elm, and S. Holst
Informacije MIDEM, Vol. 37, No. 4(124), Ljubljana, December 2007, pp. 235-243
- Debug and Diagnosis: Mastering the Life Cycle of Nano-Scale Systems on Chip (Invited Paper)
H.-J. Wunderlich, M. Elm, S. Holst
43rd International Conference on Microelectronics, Devices and
Material with the Workshop on Electronic Testing (MIDEM'07), Bled, Slovenia, September 12-14, 2007
- An Integrated Built-In Test and Repair Approach
for Memories with 2D Redundancy
P. Öhler, S. Hellebrand, H.-J. Wunderlich
12th IEEE European Test Symposium (ETS), Freiburg, Germany, May 21-24, 2007
- Adaptive Debug and Diagnosis without Fault Dictionaries
S. Holst, H.-J. Wunderlich
12th IEEE European Test Symposium (ETS), Freiburg, Germany, May 21-24, 2007
- Analyzing Test and Repair Times for 2D Integrated Memory Built-In
Test and Repair
P. Öhler, S. Hellebrand, H.-J. Wunderlich
10th IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems (DDECS), Krakow, Poland,
April 11-13, 2007
- An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy
P. Öhler, S. Hellebrand, H.-J. Wunderlich
TG/GI/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen", Erlangen, Germany, March 11-13, 2007
- Adaptive Debug and Diagnosis Without Fault Dictionaries
S. Holst, H.-J. Wunderlich
TG/GI/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen", Erlangen, Germany, March 11-13, 2007
- Some Common Aspects of Design Validation, Debug and Diagnosis
T. Arnaout, G. Bartsch, H.-J. Wunderlich
Proc. of the 3rd IEEE International Workshop on Electronic Design, Test
and Applications (DELTA), Kuala Lumpur, Malaysia, pp. 3 - 8, January
17-19, 2006.
- From Embedded Test to Embedded Diagnosis
Hans-Joachim Wunderlich
Proc. of the 10th IEEE European Test Symposium (ETS), Tallinn, Estonia, pp. 216 - 221, May 22 - 25, 2005.
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