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ISBN: 978-3-540-85089-2

Von mechatronischen Systemen wird heutzutage trotz der Funktionalitäts- und
Leistungsfähigkeitszunahme insbesondere auch eine erhöhte Zuverlässigkeit erwartet.
Die Zuverlässigkeit sollte dabei so früh wie möglich in den Entwicklungsprozess
miteinbezogen werden, da in dieser Phase die grundlegenden Entscheidungen über
das System getroffen werden. Aus diesem Grund thematisiert dieses Buch die
Zuverlässigkeitsbewertung mechatronischer Systeme - speziell in frühen
Entwicklungsphasen. Herausforderungen hierbei sind vor allem die ganzheitliche
Betrachtung über die Domänen Mechanik, Elektronik und Software sowie unsichere
bzw. unvollständige Daten. Neben der domänenübergreifenden Betrachtungsweise
werden zudem Themenaspekte in den einzelnen Domänen vertieft, die zur
Zuverlässigkeitsbewertung in frühen Entwicklungsphasen dienen.

ISBN: 978-1-4020-9713-3

Embedded systems take over complex control and data processing tasks in diverse
application fields such as automotive, avionics, consumer products, and telecommunications.
They are the primary driver for improving overall system safety, efficiency, and comfort.
The demand for further improvement in these aspects can only be satisfied by designing
systems of increasing complexity, which in turn necessitates the development of new
system design methodologies based on specification, design, and verification languages.
The objective of Languages for Embedded Systems and their Applications is to provide
researchers and designers with an overview of current research trends, results, and
application experiences in computer languages for embedded systems.

ISBN: 978-90-481-3281-2

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading.

ISBN: 978-1-4419-0927-5

Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices.