Melanie Elm
Projects
INTESYS: Model-Based Test Generation for the Efficient Test of Hardware/Software Systems
Projectpage: Model-Based Test Generation for the Efficient Test of Hardware/Software Systems Functionality in embedded systems is more and more realized by integrated hardware / software systems. Typically, these systems are strongly coupled with technical processes, as for instance the control of a vehicle, which show time-dependent, discrete-continuous dynamics. Testing for the correct functionality of their according design as well as of the final product contributes large sums to the production costs due to its complexity. An efficient method is required for the integrated test of hardware and software in these systems, which respects all the aspects of validation, debug, test and diadnosis. | |
Diana: BMBF Project: End-to-End Diagnostic Capabilities for Automotive Electronics Systems
Project page: BMBF Project: End-to-End Diagnostic Capabilities for Automotive Electronics Systems Together, AUDI AG, Continental AG, Infineon Technologies AG and ZMD AG are researching ways to improve the analytic and diagnostic capabilities of electronic control units (ECU) in motor vehicles. Through to 2013, the four partners, headed by Infineon, will work on ways to make error detection more precise and faults easier to rectify for automakers and repair shops. The project partners will be assisted by several research organizations and universities: the Fraunhofer Institute for Integrated Circuits in Dresden, the University of the Federal Armed Forces in Munich, and the Universities of Cottbus, Erlangen-Nuremberg, and Stuttgart. | |
DIADEM: Eingebettete Diagnose- und Debugmethoden für VLSI Systeme in Nanometer-Technologie
| Projectpage: Eingebettete Diagnose- und Debugmethoden für VLSI Systeme in Nanometer-Technologie Modern manufacturing processes are subject to high variations and a high sensitivity during operation. This project addresses the need for innovative embedded diagnosis solutions for such systems to reduce time-to-market with reasonable costs. |
Researcher Group: Concepts and Methods for Reliability Evaluation of Mechatronic Systems in Early Development Phases
| Projectpage: Concepts and Methods for Reliability Evaluation of Mechatronic Systems in Early Development Phases Assuring a certain reliability level for mechatronic systems becomes more and more important as human life is affected by it. For a careful estimation of the system reliability not only the reliability of each individual component has to be taken into account but also the interaction among the components. In this project, tools and methodologies to improve reliability on the electronic layer of such systems are developed. |
09.2002 - 12.2009, DFG-Researcher Group: WU 245/3-1, 3-2, 3-3 | |
Publications
Books / Book Chapters
- Bewertung und Verbesserung der Zuverlässigkeit von mikroelektronischen Komponenten in mechatronischen Systemen H.-J. Wunderlich, M. Elm, M. A. Kochte
In: Bernd Bertsche, Peter Göhner, Uwe Jensen, Wolfgang Schinköthe, Hans-Joachim Wunderlich:
Zuverlässigkeit mechatronischer Systeme - Grundlagen und Bewertung in frühen Entwicklungsphasen
Springer-Verlag Berlin Heidelberg, 2009
ISBN: 9783540850915
Journals / Conferences
- Structural In-Field Diagnosis for Random Logic Circuits A. Cook, M. Elm, H.-J. Wunderlich, U. Abelein
- Structural Test for Graceful Degradation of NoC Switches A. Dalirsani, S. Holst, M. Elm, H.-J. Wunderlich
- On Determining the Real Output Xs by SAT-Based Reasoning M. Elm, M. A. Kochte, H.-J. Wunderlich
16th IEEE European Test Symposium (ETS), Trondheim, Norway, May 23-27, 2011
16th IEEE European Test Symposium (ETS), Trondheim, Norway, May 23-27, 2011
IEEE Asian Test Symposium (ATS), Shanghai, China, December 01-04, 2010
- XP-SISR: Eingebaute Selbstdiagnose für Schaltungen mit Prüfpfad
M. Elm, H.-J. Wunderlich
GMM-aktuell in MECHATRONIK, Dezember 2010
- BISD: Scan-Based Built-In Self-Diagnosis M. Elm, H.-J. Wunderlich
- XP-SISR: Eingebaute Selbstdiagnose für Schaltungen mit Prüfpfad (Best Paper Award) M. Elm, H.-J. Wunderlich
- Test Encoding for Extreme Response Compaction M. A. Kochte, S. Holst, M. Elm, H.-J. Wunderlich
- Scan Chain Clustering for Test Power Reduction M. Elm, M. E. Imhof, H.-J. Wunderlich, C. G. Zoellin, J. Leenstra, N. Maeding
- Scan Chain Organization for Embedded Diagnosis M. Elm, H.-J. Wunderlich
- Debug and Diagnosis: Mastering the Life Cycle of Nano-Scale Systems on Chip H.-J. Wunderlich, M. Elm, and S. Holst
- Debug and Diagnosis: Mastering the Life Cycle of Nano-Scale Systems on Chip (Invited Paper) H.-J. Wunderlich, M. Elm, S. Holst
ACM/IEEE Design Automation and Test in Europe (DATE), Dresden, Germany, March 8-12, 2010
VDE Tagung "Zuverlässigkeit und Entwurf" (ZuE), Stuttgart, Germany, September 21-23, 2009
14th IEEE European Test Symposium (ETS), Sevilla, Spain, May 25-29, 2009
45th ACM/IEEE Design Automation Conference (DAC), Anaheim, CA, USA, June 8-13, 2008
ACM/IEEE Design, Automation and Test in Europe (DATE), Munich, Germany, March 10-14, 2008
Informacije MIDEM, Vol. 37, No. 4(124), Ljubljana, December, 2007
43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM), Bled, Slovenia, September, 2007
Workshops etc.
- Built-In Self-Diagnosis for Ultra-Large Scale Integrated Circuits M. Elm
- Structural Test for Graceful Degradation of NoC Switches A. Dalirsani, S. Holst, M. Elm, H.-J. Wunderlich
- Structural In-Field Diagnosis for Random Logic Circuits A. Cook, M. Elm, H.-J. Wunderlich, U. Abelein
- On Determining the Real Output Xs by SAT-Based Reasoning M. Elm, M. A. Kochte, H.-J. Wunderlich
- Prüfpfad Konfigurationen zur Optimierung der diagnostischen Auflösung M. Elm, H.-J. Wunderlich
EDAA/ACM PhD Forum (PDF), Grenoble, France, March 14, 2011
23. GI/GMM/ITG Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TUZ), Passau, Germany, February 27 - March 1, 2011
23. GI/GMM/ITG Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TUZ), Passau, Germany, February 27 - March 1, 2011
Fault Tolerant Computing Workshop (FTC Kenkyuukai), Chichibu, Japan, July 15-17, 2010
20th ITG/GI/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TUZ), Wien, Austria, February 24-26, 2008
Teaching
Labs
- Elements of High-Performance RISC Processors - Design and Synthesis
in (SS 08), (WS 08/09), (SS 09), (WS 09/10), (WS 10/11)
Lectures and Exercises
- Algorithmen und Methoden zur Entwurfsautomatisierung in der Nano- und Mikroelektronik
in (SS 07), (SS 08) - Design and Test of Systems on Chip
in (WS 06/07), (WS 07/08), (SS 09), (SS 10) - Hardware Based Fault Tolerance
in (SS 11)
Supervised Master / Diploma / Study Theses and Project Work
- Strukturelle Feldtests bei komplexen ASICs
Diplomarbeit: Dominik Ull - Integration von Java-basierten DfT Tools in SystemC TLM Simulationen
Software Project: Fabian Andres, Sebastian Halder, Tobias Weißer - Simulation Framework for Built-In Diagnosis of Self-Checking Circuits
Diploma Thesis: Laura Rodríguez Gómez - Wrapper-Optimierung im 3D-Entwurf
Diplomarbeit: Dennis Neuendorf - Practical Approach to In-Field Hardware Testing
Study Thesis: Dominik Ull - Retargeting a C compiler to the HAPRA/FAPRA architecture
Diploma Thesis: Tilmann Scheller - On-Chip Infrastructure for ATE Emulation
Study Thesis: Laura Rodríguez Gómez - FPGA Emulation of a GALS Network-on-Chip Interconnection
Master Thesis: Alejandro Cook - Efficient On-Chip Compaction of Testresponses
Master Thesis: Bartlomiej Chechelski




