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Reuse of Programmable Delay Monitors for Reliability Improvement in System Early Life and Wear-out Phase

Kategorie: Open Seminar - Rechnerarchitektur, WS 18/19

10:00-10:45, external place, M. Sc. Chang Liu, Institut für Technische Informatik

Aging monitors can predict imminent failures in the wear-out phase of a
microelectronic device before they fail. Programmable delay monitors
provide the possibility to detect performance degradation at a very early
moment and observe the gradual changes of the aging process. As a result,
the aging countermeasures can be applied to eliminate aging effects or
decrease the degradation speed.
In the early life phase of integrated systems, early life failures are the
foremost reliability threatens for young devices. Small delay faults can
indicate performance marginality and early life defects of devices. A
subset of them called hidden delay faults (HDFs) has the fault size smaller
than the slack of any path. Even though the faulty behavior of HDFs neither
affects the functionality of the system during operation nor the
prognostication of aging, they require thorough testing.
Faster-than-At-Speed Test (FAST) is an option to address such delay faults.
This paper proposes a unified strategy to improve the reliability in both
early and late phases of the system lifecycle: employing programmable delay
monitors to detect hidden delay faults at a low cost, i.e., achieving high
HDF test coverage with lower required test frequencies and a reduction in
test time during FAST.


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