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Reuse of Programmable Delay Monitors for Reliability Improvement in System Early Life and Wear-out Phase

Kategorie: Open Seminar - Rechnerarchitektur, WS 18/19

14:00-14:45, Constance, M. Sc. Chang Liu, Institut für Technische Informatik

Aging monitors can predict imminent failures in the wear-out phase of a microelectronic device before they fail. Programmable delay monitors provide the possibility to detect performance degradation at a very early moment and observe the gradual changes of the aging process. As a result, the aging countermeasures can be applied to eliminate aging effects or decrease the degradation speed.

In the early life phase of integrated systems, early life failures are the foremost reliability threatens for young devices. Small delay faults can indicate performance marginality and early life defects of devices. A subset of them called hidden delay faults (HDFs) has the fault size smaller than the slack of any path. Even though the faulty behavior of HDFs neither affects the functionality of the system during operation nor the prognostication of aging, they require thorough testing. Faster-than-At-Speed Test (FAST) is an option to address such delay faults.

This paper proposes a unified strategy to improve the reliability in both early and late phases of the system lifecycle: employing programmable delay monitors to detect hidden delay faults at a low cost, i.e., achieving high HDF test coverage with lower required test frequencies and a reduction in test time during FAST.


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