Evaluate of Multiple Polynomials for Deterministic Self Test

The increasing number of gates in nanometer ICs has resulted in an explosive increase in test set volume. As the test cost is directly propotional to the size of the test set, the test sets are compacted and then compressed to fulfil test economics contraints.

Many compression schemes for these fully compacted test sets have been proposed. These schemes mostly use linear decompressor like LFSR. This LFSR can be programmable(using multiple feedback polynomials) or with a fixed polynomial LFSR.However, most of the current work has been done by using fixed polynomial LFSRs.

In this thesis, the flexibility of multiple polynomial can be exploited with state of the art compression approaches. This flexibility can be achieved but introduces the challenge of coaping with more complexity. A new scheme should be implemented, modifying some previously published schemes by using multi polynomial LFSR.

The thesis can be written in English.

Contact:

Abdullah Mumtaz (Email: Abdullah.Mumtaz@informatik.uni-stuttgart.de)

Hans-Joachim Wunderlich (Email: wu@informatik.uni-stuttgart.de)