Project Partner

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Online Failure Prediction for Microelectronic Circuits Using Aging Signatures (OASIS)

Microelectronic circuits suffer from life-time limiting aging. In this project, online in-field methods to assess circuit performance and remaining life-time will be developed to predict failures due to aging processes.

Sensors and monitoring infrastructure are used to analyze both operating conditions as well as aging indicators so that a system failure can be early indicated and prevented by technical measures. Novel maintenance concepts based on failure prediction allow for a substantial simplification of established structural fault tolerance measures (e.g. redundancy concepts) even in safety-critical applications since specific counter measures can be applied before an actual aging induced failure.

With the aid of such an on-line monitoring the effective life-time of a microelectronic product can be significantly increased at low cost.

Project Partner

  • Institut für Mikroelektronik Stuttgart
    IMS

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