Project Partner

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Online Failure Prediction for Microelectronic Circuits Using Aging Signatures (OASIS)

Microelectronic circuits suffer from life-time limiting aging. In this project, online in-field methods to assess circuit performance and remaining life-time will be developed to predict failures due to aging processes.

Sensors and monitoring infrastructure are used to analyze both operating conditions as well as aging indicators so that a system failure can be early indicated and prevented by technical measures. Novel maintenance concepts based on failure prediction allow for a substantial simplification of established structural fault tolerance measures (e.g. redundancy concepts) even in safety-critical applications since specific counter measures can be applied before an actual aging induced failure.

With the aid of such an on-line monitoring the effective life-time of a microelectronic product can be significantly increased at low cost.

This work is supported by the German Research Foundation (DFG) under grant WU 245/11-1.

Project Partner

  • Institut für Mikroelektronik Stuttgart
    IMS

Publications

  • Efficient System-Level Aging Prediction
    N. Hatami, R. Baranowski, P. Prinetto, H.-J. Wunderlich
    Proc. 17th IEEE European Test Symposium (ETS12), Annecy, France, May 28-June 01, 2012, pp. 164-169, doi: 10.1109/ETS.2012.6233028
  • Modeling, Verification and Pattern Generation for Reconfigurable Scan Networks
    R. Baranowski, M. A. Kochte and H.-J. Wunderlich
    Proc. IEEE International Test Conference (ITC12), Anaheim, CA, USA, 2012, November 6-8, 2012
  • Accurate X-Propagation for Test Applications by SAT-Based Reasoning
    M. A. Kochte, M. Elm, H.-J. Wunderlich
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and System, Vol. 31(12), Dec. 2012, pp. 1908 - 1919
  • Accurate QBF-based Test Pattern Generation in Presence of Unknown Values
    S. Hillebrecht, M. A. Kochte, D. Erb, H.-J. Wunderlich and B. Becker
    Proc. Design, Automation and Test in Europe (DATE), Grenoble, France, 2013, pp. 436-441
  • Scan Pattern Retargeting and Merging with Reduced Access Time
    R. Baranowski, M. Kochte, and H.-J. Wunderlich
    Proc. IEEE European Test Symposium (ETS13), Avignon, France, 2013, pp. 39-45

Student Theses

  • Simulation-based aging analysis, Z. Georgiev, Dez. 2012 - 21. Juni 2013
  • Test von Rekonfigurierbaren Scan-Netzwerken, M. Schaal, Aug. 2012- Jan. 2012

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