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Eingebettete Diagnose- und Debugmethoden für VLSI Systeme in Nanometer-Technologie (DIADEM)

06.2006 - 05.2009, DFG-Project: WU 245/4-1    

The project's goal is the development and examination of innovative embedded diagnosis solutions for integrated systems in nanometer scale. The manufacturing process for these systems is subject to high variations and therefore leads to a rather low yield at the beginning and a high sensitivity during operation. Efficient diagnosis solutions are necessary to reduce time-to-market with reasonable costs. To achieve this, more diagnosis techniques need to be integrated into the systems (built-in diagnosis).

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