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Laura Rodríguez Gómez

Name:

Dipl.-Inf. Laura Rodríguez Gómez

Adresse:

Universität Stuttgart

Institut für Technische Informatik

Pfaffenwaldring 47

70569 Stuttgart

Raum:

3.174

Sprechstunde:

Mittwoch, 10:00 - 11:00

Telefon:

+49 - 711 - 685 - 88276

Fax:

+49 - 711 - 685 - 88288

Mail:

laura.rodriguez@iti.uni-stuttgart.de

Laufende Projekte

INTESYS: Modellbasierte Testdatenerzeugung zur effizienten Prüfung integrierter Hardware-/Softwaresysteme

Projektseite: Modellbasierte Testdatenerzeugung zur effizienten Prüfung integrierter Hardware-/Softwaresysteme

Funktionen in eingebetteten Systemen werden heutzutage immer häufiger durch integrierte Hard- ware-/Softwaresysteme realisiert, insbesondere ist dies auch bei Prozessautomatisierungssystemen zu beobachten. Merkmal dieser Hardware-/Softwaresysteme ist die enge Kopplung mit technischen Prozessen, wie etwa in den Steuerungen und Regelungen eines Kraftfahrzeugs, die eine zeitabhängige und diskret-kontinuierliche Dynamik aufweisen. Die Prüfung der korrekten Funktionalität des Entwurfs als auch des gefertigten Systems macht aufgrund der hohen Komplexität einen hohen Anteil der Gesamtkosten aus. Es wird daher ein effizientes Vorgehen zur gemeinsamen Prüfung von Hardware und Software dieser eingebetteten Systeme benötigt, das die einzelnen Aspekte Validierung, Debug, Diagnose und Test in sich vereint. Dies beinhaltet die automatisierte Ermittlung von Testdaten, welche Fehler zügig aufdecken und gleichzeitig eine hohe Produktqualität sicherstellen.
Modellbasierte und modellgetriebene Entwicklungs- und Testverfahren gewinnen sowohl in der Forschung als auch in der industriellen Praxis an Bedeutung, da sie die schrittweise Entwicklung von den Anforderungen bis hin zur Implementierung systematisieren. Durch Nutzung von Modellen, welche die Funktionen integrierter Hardware-/Softwaresysteme beschreiben, wird eine höhere Effizienz der Prüfung angestrebt. Wesentliche Ziele des Forschungsvorhabens sind die Testdaten- generierung für Funktion und Struktur aus einem Systemmodell eingebetteter Hardware-/Software- systeme sowie die automatische Auswertung und Fehlerdiagnose. Dies stellt eine Herausforderung dar, welche bis heute nicht zufrieden stellend gelöst werden konnte.

10.2010 - 09.2013, DFG-Projekt: WU 245/9-1    

Publications

Journal and Conference Proceedings
Matching entries: 0
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3. Adaptive Bayesian Diagnosis of Intermittent Faults
Rodríguez Gómez, L., Cook, A., Indlekofer, T., Hellebrand, S. and Wunderlich, H.-J.
Journal of Electronic Testing: Theory and Applications (JETTA)
Vol. 30(5), September 30, pp. 527-540
2014
DOI URL PDF 
Keywords: Built-In Self-Test, Built-in diagnosis, Transient faults, Intermittent faults, Bayesian diagnosis
Abstract: With increasing transient error rates, distinguishing intermittent and transient faults is especially challenging. In addition to particle strikes relatively high transient error rates are observed in architectures for opportunistic computing and in technologies under high variations. This paper presents a method to classify faults into permanent, intermittent and transient faults based on some intermediate signatures during embedded test or built-in self-test.
Permanent faults are easily determined by repeating test sessions. Intermittent and transient faults can be identified by the amount of failing test sessions in many cases. For the remaining faults, a Bayesian classification technique has been developed which is applicable to large digital circuits. The combination of these methods is able to identify intermittent faults with a probability of more than 98 %.
BibTeX:
@article{RodriCIHW2014,
  author = {Rodríguez Gómez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
  title = {Adaptive Bayesian Diagnosis of Intermittent Faults},
  journal = {Journal of Electronic Testing: Theory and Applications (JETTA)},
  year = { 2014 },
  volume = {30},
  number = {5},
  pages = {527--540},
  keywords = { Built-In Self-Test, Built-in diagnosis, Transient faults, Intermittent faults, Bayesian diagnosis },
  abstract = { With increasing transient error rates, distinguishing intermittent and transient faults is especially challenging. In addition to particle strikes relatively high transient error rates are observed in architectures for opportunistic computing and in technologies under high variations. This paper presents a method to classify faults into permanent, intermittent and transient faults based on some intermediate signatures during embedded test or built-in self-test.
Permanent faults are easily determined by repeating test sessions. Intermittent and transient faults can be identified by the amount of failing test sessions in many cases. For the remaining faults, a Bayesian classification technique has been developed which is applicable to large digital circuits. The combination of these methods is able to identify intermittent faults with a probability of more than 98 %.}, url = { http://link.springer.com/article/10.1007/s10836-014-5477-1 }, doi = {http://dx.doi.org/10.1007/s10836-014-5477-1}, file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/JETTA_RodriCIHW2014.pdf} }
2. Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures
Reimann, F., Glaß, M., Teich, Jü., Cook, A., Rodríguez Gómez, L., Ull, D., Wunderlich, H.-J., Abelein, U. and Engelke, P.
Proc. 51st ACM/IEEE Design Automation Conference (DAC'14), San Francisco, CA, USA, Jun 1-5, pp. 1-9
HiPEAC Paper Award
2014
DOI PDF 
Abstract: The constantly growing amount of semiconductors in automotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to maintain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of structural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not affect functional applications and (b) does not require costly changes in the communication schedules or additional communication overhead. Via design space exploration, optimized implementations with respect to multiple conflicting objectives, i. e., monetary costs, safety, test quality, and required execution time are derived.
BibTeX:
@inproceedings{ReimaGTCRUWAE2014,
  author = {Reimann, Felix and Glaß, Michael and Teich, Jürgen and Cook, Alejandro and Rodríguez Gómez, Laura and Ull, Dominik and Wunderlich, Hans-Joachim and Abelein, Ulrich and Engelke, Piet},
  title = {Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures},
  booktitle = {Proc. 51st ACM/IEEE Design Automation Conference (DAC'14)},
  year = {2014},
  pages = {1--9},
  abstract = {The constantly growing amount of semiconductors in automotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to maintain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of structural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not affect functional applications and (b) does not require costly changes in the communication schedules or additional communication overhead. Via design space exploration, optimized implementations with respect to multiple conflicting objectives, i. e., monetary costs, safety, test quality, and required execution time are derived.},
  doi = {http://dx.doi.org/10.1145/2593069.2602971},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/DAC_ReimaGTCRUWAE2014.pdf}
}
1. Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures
Abelein, U., Cook, A., Engelke, P., Glaß, M., Reimann, F., Rodríguez Gómez, L., Russ, T., Teich, J., Ull, D. and Wunderlich, H.-J.
Proc. Design, Automation and Test in Europe (DATE'14), Dresden, Germany, Mar 24-28
2014
DOI URL PDF 
Keywords: Automotive Structural Diagnosis, BIST
Abstract: With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules.
BibTeX:
@inproceedings{AbeleCEGRRRTUW2014,
  author = {Abelein, Ulrich and Cook, Alejandro and Engelke, Piet and Glaß, Michael and Reimann, Felix and Rodríguez Gómez, Laura and Russ, Thomas and Teich, Jürgen and Ull, Dominik and Wunderlich, Hans-Joachim},
  title = {Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures},
  booktitle = {Proc. Design, Automation and Test in Europe (DATE'14)},
  year = {2014},
  keywords = {Automotive Structural Diagnosis, BIST},
  abstract = {With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules.},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6800574},
  doi = {http://dx.doi.org/10.7873/DATE.2014.373},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/DATE_AbeleCEGRRRTUW2014.pdf}
}
Created by JabRef on 20/11/2014.
Workshop Contributions
Matching entries: 0
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1. Adaptive Test and Diagnosis of Intermittent Faults
Cook, A., Rodriguez, L., Hellebrand, S., Indlekofer, T. and Wunderlich, H.-J.
14th Latin American Test Workshop (LATW 2013), Cordoba, Argentina, April 3rd - 5th, 2013
2013
 
BibTeX:
@inproceedings{CookRHIW2013,
  author = {Cook, Alejandro and Rodriguez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim},
  title = {Adaptive Test and Diagnosis of Intermittent Faults},
  booktitle = {14th Latin American Test Workshop (LATW 2013), Cordoba, Argentina, April 3rd - 5th, 2013},
  year = {2013}
}
Created by JabRef on 20/11/2014.